Numerical Analysis of Donor-Induced Band Gap Narrowing in InGaN Alloys for Photovoltaic Applications ()
1. Introduction
The InGaN alloy (indium-gallium nitride) occupies a strategic position in the field of materials for photovoltaic conversion. Its tunable bandgap spans the spectrum from 0.7 eV (pure InN) to 3.51 eV (pure GaN) through simple variation of the indium molar fraction x. This makes it an ideal material for the fabrication of multi-junction solar cells capable of covering the entire solar spectrum [1]-[4].
However, InGaN-based solar cells face significant physical constraints during fabrication. Doping, which is necessary to form p-n junctions, introduces high charge carrier concentrations that alter the intrinsic electronic properties of the material. One of the most significant effects is Band Gap Narrowing (BGN), a phenomenon in which the effective bandgap narrows due to Coulomb interactions between free carriers and between carriers and ionized impurities [5].
A quantitative understanding of BGN is essential for accurately predicting the spectral response of the solar cell and optimizing its conversion efficiency. Recent numerical studies on InGaN solar cells confirm that doping, active layer thickness, and device architecture simultaneously influence optical absorption, open-circuit voltage, and overall efficiency [6]-[9].
The present study proposes a comparative and systematic analysis of the effect of doping on BGN, the effective bandgap energy Egeff, and the cutoff wavelength λcut, for two representative InGaN compositions (x = 0.12 and x = 0.28) at a temperature of 300 K.
2. Theoretical Model
2.1. Bandgap Energy of InGaN
The bandgap energy of the InxGa1−xN alloy as a function of the indium molar fraction x is given by the modified Vegard’s law including the Varshni correction [10]:
(1)
where b = 1.43 eV is the bowing parameter [1]. The Varshni parameters from Vurgaftman & Meyer (2003) are given in Table 1.
Temperature Dependence: Varshni’s Law
For the binary compounds, the following expression is generally used:
where α and β are material-specific constants. For the alloy, the temperature dependence follows the modified Vegard’s law.
and
are the bandgap energies of InN and GaN, respectively, and b is the bowing parameter.
Table 1. Varshni parameters and material properties [10]-[12].
Parameter |
Symbol |
GaN |
InN |
Unit |
Reference |
Bandgap at 0 K |
Eg(0) |
3.510 |
0.675 |
eV |
Vurgaftman (2003) |
Varshni α |
α |
9.09 × 10−4 |
2.45 × 10−4 |
eV/K |
Vurgaftman (2003) |
Varshni β |
β |
830 |
624 |
K |
Vurgaftman (2003) |
Electron effective mass |
|
0.20 m0 |
0.11 m0 |
— |
Vurgaftman (2003) |
Hole effective mass |
|
0.80 m0 |
0.60 m0 |
— |
Vurgaftman (2003) |
Static permittivity |
εr |
8.9 |
15.3 |
— |
Levinshtein (2001) |
Bowing parameter |
b |
1.43 |
|
eV |
Wu et al. (2002) |
2.2. Band Gap Narrowing (BGN) - Jain-Roulston Model
Band Gap Narrowing results from many-body interactions in heavily doped semiconductors: carrier-carrier exchange interactions, correlation effects, and ion-carrier interactions. For an n-type semiconductor, the bandgap reduction ΔEBGN is modeled according to the Jain-Roulston formalism [5]:
(2)
where A, B, and C are material constants that depend on the composition x, and N is the doping concentration in cm−3. where N denotes the donor concentration (ND). Throughout this work, complete donor ionization at T = 300 K is assumed, so that the free electron concentration is approximated by n ≈ ND.
These coefficients are determined from the Jain-Roulston relation:
(3)
(4)
(5)
where the reduced Wigner-Seitz radius is given by:
(6)
(7)
where λD is the Debye length given by the following equation:
(8)
The material parameters (
,
,
) are linearly interpolated between the values of GaN and InN as a function of x.
,
et
These parameters are given in Table 2.
Table 2. Some values of the electrical properties of GaN and InN at 300 K.
Property |
InN |
GaN |
Band gap (Eg) eV |
0.675 |
3.51 |
Electron affinity (χ) eV |
5.6 |
4.1 |
Effective density of states in the conduction band (Nc) (cm−3) |
5.1∙1017 |
2.3∙1018 |
Effective density of states in the valence band (Nv) (cm−3) |
5.3∙1019 |
4.6∙1019 |
Electron effective mass (me) |
0.11m0 |
0.2m0 |
Hole effective mass (mh) |
0.65 |
0.80 m0 |
Dielectric permittivity (ε) |
15.3 |
8.9 |
2.3. Validity Range of the Jain-Roulston Model
The Jain-Roulston model is valid for doping concentrations N ≤ 3 × 1018 cm−3. Beyond this limit, two physical effects not included in the model become significant: Although the Jain–Roulston model was originally developed for conventional semiconductors such as Si, Ge and GaAs, it has been widely employed as a first-order approximation for evaluating many-body interaction effects in heavily doped III-V semiconductors. The predicted BGN magnitudes obtained in this study remain within the order of magnitude reported for heavily doped GaN and InGaN materials in the literature, supporting the applicability of the model for comparative analysis.
Burstein-Moss effect: Band filling by degenerate carriers leads to an apparent increase in the optical bandgap, which partially compensates the Band Gap Narrowing (BGN).
Carrier degeneracy: The Fermi level penetrates into the conduction band, invalidating the classical Boltzmann statistics used in the derivation of the Jain-Roulston model.
2.4. Effective Bandgap and Cutoff Wavelength
The cutoff wavelength λcut corresponds to the minimum photon energy required to excite an electron across the effective bandgap. The relations for the effective bandgap energy and the cutoff wavelength are given by the following equation:
(9)
A red shift of λcut (i.e., an increase) indicates the possibility of absorbing photons of lower energy. This can increase the short-circuit current density Jsc but may potentially degrade the open-circuit voltage Voc, as shown by several recent numerical optimization studies on single-junction InGaN structures, thin polar layers, and intermediate-band architectures [6]-[8] [13].
3. Results and Discussion
3.1. Summary of Parameters as a Function of Doping
Table 3 and Table 4 present the calculated values of bandgap narrowing (ΔEBGN), effective bandgap energy (Egeff), and cutoff wavelength (λcut) for the two compositions investigated at the different doping levels considered, ranging from the absence of BGN to the heavily doped regime (3 × 1018 cm−3).
Table 3. Physical parameters for x = 0.12 (In0.12Ga0.88N), T = 300 K.
N [cm−3] |
Doping Regime |
ΔEBGN [meV] |
Egeff [eV] |
λcut [nm] |
Δλ [nm] |
No BGN |
— |
0 |
2.9524 |
420.0 |
— |
1016 |
Low |
5.15 |
2.9473 |
420.7 |
+0.7 |
1017 |
Low-to-moderate |
35.6 |
2.9168 |
425.2 |
+5.2 |
5 × 1017 |
Moderate |
150.0 |
2.8024 |
442.5 |
+22.5 |
1018 |
High |
283.7 |
2.6687 |
464.7 |
+44.8 |
3 × 1018 |
Very High |
792.0 |
2.1604 |
574.0 |
+154 |
Table 4. Physical parameters for x = 0.28 (In0.28Ga0.72N), T = 300 K.
N [cm−3] |
Doping Regime |
ΔEBGN [meV] |
Egeff [eV] |
λcut [nm] |
Δλ [nm] |
No BGN |
— |
0 |
2.3692 |
523.4 |
— |
1016 |
Low |
6.24 |
2.3630 |
524.8 |
+1.4 |
1017 |
Low-to-moderate |
43.30 |
2.3259 |
533.2 |
+9.8 |
5 × 1017 |
Moderate |
186.5 |
2.1827 |
568.1 |
+44.7 |
1018 |
High |
240.7 |
2.1285 |
582.7 |
+59.3 |
3 × 1018 |
Very High |
993.5 |
1.3757 |
901.4 |
+378 |
3.2. Evolution of Band Gap Narrowing with Doping
Figure 1 illustrates the evolution of ΔEBGN_{BGN}BGN as a function of the doping concentration for the two Indium mole fractions. A strongly non-linear increase in the BGN is observed: negligible at low doping levels (<5.15 meV at 1016 cm−3 for x = 0.12), it becomes critical beyond 1018 cm−3, reaching 792.0 meV and 993.5 meV for x = 0.12 and x = 0.28, respectively, at 3 × 1018 cm−3.
In general, the composition x = 0.28 exhibits a larger BGN than x = 0.12, particularly at low and very high doping levels. However, an exception is observed at N = 1018 cm−3, where the calculated BGN for x = 0.12 (283.7 meV) slightly exceeds that of x = 0.28 (240.7 meV). This deviation may arise from the interplay between effective mass and dielectric screening effects in the Jain–Roulston formulation.
3.3. Reduction of the Effective Bandgap Energy
Figure 2 shows the evolution of Egeff with doping. For x = 0.12, Egeff decreases from 2.9524 eV (without BGN) to 2.1604 eV at 3 × 1018 cm−3, representing a reduction of 26.8%. For x = 0.28, the drop is even more pronounced: from 2.3692 eV to 1.3757 eV, corresponding to a reduction of 41.9%.
These significant reductions in Egeff can disrupt band alignment in multi-junction structures and alter the ideal diode quality factor, directly impacting the fill factor FF and the conversion efficiency η of the solar cell [4] [8].
Figure 1. Variation of band gap narrowing ΔEBGN as a function of doping concentration N for x = 0.12 and x = 0.28 at T = 300 K.
Figure 2. Effective bandgap energy Egeff as a function of doping concentration N for the two InGaN compositions.
3.4. Shift of the Cutoff Wavelength
Figure 3 shows the evolution of λcut with doping. The red shift is moderate at low doping levels but becomes spectacular in the high doping regime. For x = 0.28, λcut increases from 523.4 nm to 901.4 nm, crossing the visible-infrared boundary of the solar spectrum. This significantly broadens the spectral absorption window.
3.5. Summary of the Spectral Shift Δλcut
Table 5 and Figure 4 summarize the shifts in Δλcut relative to the reference case (without BGN) for each doping regime. The comparison between the two compositions shows that x = 0.28 consistently produces a larger shift, with an amplification factor of approximately 2 to 2.5 in the moderate and high doping regimes, reaching a factor greater than 2.4 in the very high doping regime.
Figure 3. Cutoff wavelength λcut as a function of doping concentration N. The redshift is more pronounced for x = 0.28.
Table 5. Shift Δλcut of the cutoff wavelength according to the doping regime.
Doping Regime |
Concentration N [cm−3] |
x = 0.12: Δλcut [nm] |
x = 0.28: Δλcut [nm] |
Low |
1016 |
+0.7 |
+1.4 |
Moderate |
5 × 1017 |
+22.5 |
+44.7 |
High |
1018 |
+44.7 |
+59.3 |
Very High |
3 × 1018 |
+154 |
+378 |
Δλcut calculated with respect to the reference case without BGN for each composition.
Figure 4. Spectral shift Δλcut by doping regime for x = 0.12 and x = 0.28. The nonlinearity is particularly pronounced in the very heavy regime.
3.6. Implications for Photovoltaic Optimization
The analysis shows that doping in the range of 1016 - 5 × 101⁷ cm−3 enables a moderate spectral extension (Δλcut < 45 nm for both compositions) while keeping the effective bandgap energy close to the nominal values. This regime therefore represents an optimal doping window for taking advantage of BGN without severely compromising the material’s electronic properties, in line with several recent studies on InGaN cell optimization [6]-[9].
Beyond 1018 cm−3, the non-linear increase in BGN induces an excessive reduction in Egeff, which is likely to lower the open-circuit voltage Voc and degrade the overall efficiency of the solar cell, despite the broadening of the absorption window. An optimal compromise must therefore be determined according to the incident solar spectrum and the specific cell architecture, whether single-junction, tandem, or intermediate-band devices [4] [8] [9] [13].
4. Conclusions
This study presents a systematic numerical analysis of the Band Gap Narrowing (BGN) effect in InGaN solar cells for two Indium molar fractions (x = 0.12 and x = 0.28) at T = 300 K. The main results can be summarized as follows:
BGN increases in a strongly non-linear manner with doping concentration, with a critical acceleration beyond 1018 cm−3.
The x = 0.28 composition exhibits a systematically more pronounced BGN, resulting in a greater reduction of Egeff and a larger shift in λcut.
A maximum shift of +378 nm is observed for x = 0.28 at 3 × 1018 cm−3, moving λcut to 901.4 nm in the near-infrared region.
The optimal doping range for photovoltaic applications lies between 1016 and 5 × 101⁷ cm−3, providing a good compromise between spectral extension and material quality.
These results constitute an essential quantitative foundation for the design of high-efficiency InGaN solar cells. Future work will incorporate the effects of temperature, the internal piezoelectric electric field inherent to nitrides, and layer morphology on the effective BGN, in connection with recent advances reported for advanced InGaN structures [3] [4] [13].