<?xml version="1.0" encoding="UTF-8"?><!DOCTYPE article  PUBLIC "-//NLM//DTD Journal Publishing DTD v3.0 20080202//EN" "http://dtd.nlm.nih.gov/publishing/3.0/journalpublishing3.dtd"><article xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" dtd-version="3.0" xml:lang="en" article-type="research article"><front><journal-meta><journal-id journal-id-type="publisher-id">WJCMP</journal-id><journal-title-group><journal-title>World Journal of Condensed Matter Physics</journal-title></journal-title-group><issn pub-type="epub">2160-6919</issn><publisher><publisher-name>Scientific Research Publishing</publisher-name></publisher></journal-meta><article-meta><article-id pub-id-type="doi">10.4236/wjcmp.2017.74009</article-id><article-id pub-id-type="publisher-id">WJCMP-80457</article-id><article-categories><subj-group subj-group-type="heading"><subject>Articles</subject></subj-group><subj-group subj-group-type="Discipline-v2"><subject>Physics&amp;Mathematics</subject></subj-group></article-categories><title-group><article-title>
 
 
  Spectroscopic Ellipsometry Study of the Dielectric Function of Cu(In&lt;sub&gt;1–x&lt;/sub&gt;Ga&lt;sub&gt;x&lt;/sub&gt;)&lt;sub&gt;3&lt;/sub&gt;Se&lt;sub&gt;5&lt;/sub&gt; Bulk Compounds: Identification of Optical Transitions
 
</article-title></title-group><contrib-group><contrib contrib-type="author" xlink:type="simple"><name name-style="western"><surname>Dayane</surname><given-names>Habib</given-names></name><xref ref-type="aff" rid="aff1"><sup>1</sup></xref><xref ref-type="corresp" rid="cor1"><sup>*</sup></xref></contrib><contrib contrib-type="author" xlink:type="simple"><name name-style="western"><surname>Georges</surname><given-names>El Haj Moussa</given-names></name><xref ref-type="aff" rid="aff2"><sup>2</sup></xref></contrib></contrib-group><aff id="aff1"><addr-line>Physics Department, Faculty of Sciences II, Lebanese University, Jdeidet, Lebanon</addr-line></aff><aff id="aff2"><addr-line>Centre Electronique et Micro-optoélectronique de Montpellier (CEM2), Faculté Sciences et Techniques du Languedoc, Université de Montpellier II, Montpellier, France</addr-line></aff><author-notes><corresp id="cor1">* E-mail:<email>dayane_habib@yahoo.fr(DH)</email>;</corresp></author-notes><pub-date pub-type="epub"><day>02</day><month>11</month><year>2017</year></pub-date><volume>07</volume><issue>04</issue><fpage>99</fpage><lpage>110</lpage><history><date date-type="received"><day>22,</day>	<month>March</month>	<year>2016</year></date><date date-type="rev-recd"><day>18,</day>	<month>November</month>	<year>2017</year>	</date><date date-type="accepted"><day>21,</day>	<month>November</month>	<year>2017</year></date></history><permissions><copyright-statement>&#169; Copyright  2014 by authors and Scientific Research Publishing Inc. </copyright-statement><copyright-year>2014</copyright-year><license><license-p>This work is licensed under the Creative Commons Attribution International License (CC BY). http://creativecommons.org/licenses/by/4.0/</license-p></license></permissions><abstract><p><html>
 <head></head>
 
  Using Spectroscopic Ellipsometry (SE), the optical properties of Cu(In
  <sub>1&amp;minus;x</sub>Ga
  <sub>x</sub>)
  <sub>3</sub>Se
  <sub>5</sub> bulk compounds, grown by the Bridgman method, were analyzed by varying x composition (0 ≤ x ≤ 1). Energy levels above the gap in the band scheme were determined by measuring the complex dielectric function 
  <img src="Edit_5706cef7-fe22-4ff6-8825-97953bcdd492.bmp" alt="" /> at room-temperature for energies between 1.5 and 5.5 eV using a variable angle of incidence ellipsometer. The transitions values 
  E
  <sub>1</sub>, 
  E
  <sub>2</sub> and 
  E
  <sub>3</sub> were observed above the gap for different samples of Cu(In
  <sub>1&amp;minus;x</sub>Ga
  <sub>x</sub>)
  <sub>3</sub>Se
  <sub>5</sub> alloy. When a gallium atom replaces an indium atom, one assumes globally that the levels related to selenium and copper are unchanged. Conversely, the levels corresponding to the conduction band are shifted towards higher energies. Thus, the gap increases as the composition of gallium increases. Spectroscopic Ellipsometry (SE) gave evidence for the interpretation of the choice of gap values which were compatible with that obtained from solar spectrum. Several other characterization methods like Energy Dispersive Spectrometry (EDS), hot point probe method, X-ray diffraction, Photoluminescence (PL), Optical response (Photoconductivity) were presented in this paper. The Cu(In
  <sub>1&amp;minus;x</sub>Ga
  <sub>x</sub>)
  <sub>3</sub>Se
  <sub>5</sub> have an Ordered Vacancy Chalcopyrite-type structure with lattice constants varying as a function of the x composition. The band gap energy of Cu(In
  <sub>1&amp;minus;x</sub>Ga
  <sub>x</sub>)
  <sub>3</sub>Se
  <sub>5</sub> compounds is found to vary from 1.23 eV to 1.85 eV as a function of x.
 
</html></p></abstract><kwd-group><kwd>Chalcopyrite</kwd><kwd> Photovoltaic</kwd><kwd> Bulk materials</kwd><kwd> Photoluminescence</kwd><kwd> Optical Response</kwd><kwd> X-Ray Diffraction</kwd><kwd> Photoconductivity</kwd><kwd> Spectroscopic Ellipsometry</kwd></kwd-group></article-meta></front><body><sec id="s1"><title>1. Introduction</title><p>Chalcopyrite compound semiconductors CuIn<sub>1−x</sub>Ga<sub>x</sub>Se<sub>2</sub> are leading candidates for the absorbers in high efficiency photovoltaic devices [<xref ref-type="bibr" rid="scirp.80457-ref1">1</xref>] . A p-n junction model has been proposed by Schmidt et al. [<xref ref-type="bibr" rid="scirp.80457-ref2">2</xref>] that is based on the identification of a thin n-type surface layer atop the ternary p-type CuInSe<sub>2</sub> PV-quality absorber. This surface material is reported to show composition near CuIn<sub>3</sub>Se<sub>5</sub>. In the present work, Cu(In<sub>1−x</sub>Ga<sub>x</sub>)<sub>3</sub>Se<sub>5</sub> ingots were grown using a horizontal Bridgman method. Energy Dispersive Spectrometry (EDS) and X-ray diffraction (XRD) were used to calculate the compositions of the ingots. The hot point probe method is used to determine the conduction types. The optical properties are investigated using Photoconductivity and Photoluminescence characterization.</p><p>Spectroscopic Ellipsometry (SE) technique is an experimental tool for measuring simultaneously the real and imaginary parts of the dielectric function versus photon energy for any semiconductor. The critical point structures in the dielectric function of a semiconductor are due to the optical-point transitions between valence and conduction bands where there exists a large joint density of states, thus providing valuable information on the electronic energy-band structure of the material. In this paper, the method illustrates the accuracy of transitions, in semiconductor, obtained from the experimental results of SE. A harmonic oscillator approximation (HOA) was fitted to the data for monocrystal silicon and Cu(In<sub>1−x</sub>Ga<sub>x</sub>)<sub>3</sub>Se<sub>5</sub>. Room-temperature measurements were reported for the-pseudo dielectric function &#225;ε&#241; at energies from 1.5 to 5.5 eV.</p></sec><sec id="s2"><title>2. Experiment and Results</title><p>Crystals with different compositions were synthesized by direct combination of high purity 5N for Cu and In, 6N for Ga and Se in the desired proportions. The elements were put in a quartz tube sealed under a vacuum of 5 &#215; 10<sup>−6</sup> Torr. This tube is then introduced in a horizontal furnace at a temperature higher than the melting temperature of the compounds for 72 hours and then slowly cooled down.</p><p>The crystals were characterized by X-ray measurements, using a Seifert MZIV powder diffractometer (θ, 2θ geometry) with Cu (Kα) radiation (λ = 1.5406 &#197;). The chemical composition of the obtained samples were given by EDS (Link type AN 1000 55/S) coupled to a scanning microscope (Cambridge type S360). The Photoluminescence (PL) measurements were performed at temperature 4.2 K by directly immersing the samples into liquid helium. The optical responses or Photoconductivity were performed at room temperature. Spectroscopic Ellipsometry used to determine the energy levels above the gap in the band scheme.</p><sec id="s2_1"><title>2.1. Characterization by EDS</title><p><xref ref-type="fig" rid="fig1">Figure 1</xref> and <xref ref-type="table" rid="table1">Table 1</xref> show the results of characterization by EDS of the Cu(In<sub>1−x</sub>Ga<sub>x</sub>)<sub>3</sub>Se<sub>5</sub> films.</p><table-wrap id="table1" ><label><xref ref-type="table" rid="table1">Table 1</xref></label><caption><title> Composition and deviation from stœchiometry for the Cu(In<sub>x</sub>Ga<sub>1−x</sub>)<sub>3</sub>Se<sub>5</sub> crystals</title></caption><table><tbody><thead><tr><th align="center" valign="middle"  colspan="8"  >Cu(In<sub>1−x</sub>Ga<sub>x</sub>)<sub>3</sub>Se<sub>5</sub></th></tr></thead><tr><td align="center" valign="middle" >Starting (x)</td><td align="center" valign="middle" >Samples (x)</td><td align="center" valign="middle" >% Cu</td><td align="center" valign="middle" >% In</td><td align="center" valign="middle" >% Ga</td><td align="center" valign="middle" >% Se</td><td align="center" valign="middle" >The deviation from stœchiometry Dy = 3 ∗ Cu Ga + In − 1 [<xref ref-type="bibr" rid="scirp.80457-ref2">2</xref>]</td><td align="center" valign="middle" >Conduction type</td></tr><tr><td align="center" valign="middle" >0</td><td align="center" valign="middle" >0</td><td align="center" valign="middle" >11.2</td><td align="center" valign="middle" >32.5</td><td align="center" valign="middle" >0</td><td align="center" valign="middle" >56.3</td><td align="center" valign="middle" >+0.03</td><td align="center" valign="middle" >n</td></tr><tr><td align="center" valign="middle" >0.2</td><td align="center" valign="middle" >0.21</td><td align="center" valign="middle" >12</td><td align="center" valign="middle" >24.5</td><td align="center" valign="middle" >6.8</td><td align="center" valign="middle" >56</td><td align="center" valign="middle" >+0.15</td><td align="center" valign="middle" >p</td></tr><tr><td align="center" valign="middle" >0.4</td><td align="center" valign="middle" >0.4</td><td align="center" valign="middle" >10.7</td><td align="center" valign="middle" >21.7</td><td align="center" valign="middle" >12</td><td align="center" valign="middle" >55</td><td align="center" valign="middle" >−0.05</td><td align="center" valign="middle" >p</td></tr><tr><td align="center" valign="middle" >0.5</td><td align="center" valign="middle" >0.59</td><td align="center" valign="middle" >11.7</td><td align="center" valign="middle" >16</td><td align="center" valign="middle" >16.2</td><td align="center" valign="middle" >56</td><td align="center" valign="middle" >+0.09</td><td align="center" valign="middle" >p</td></tr><tr><td align="center" valign="middle" >0.6</td><td align="center" valign="middle" >0.64</td><td align="center" valign="middle" >11.1</td><td align="center" valign="middle" >11.8</td><td align="center" valign="middle" >21.8</td><td align="center" valign="middle" >55.3</td><td align="center" valign="middle" >−0.01</td><td align="center" valign="middle" >p</td></tr><tr><td align="center" valign="middle" >0.8</td><td align="center" valign="middle" >0.78</td><td align="center" valign="middle" >11.1</td><td align="center" valign="middle" >7.7</td><td align="center" valign="middle" >26.6</td><td align="center" valign="middle" >54</td><td align="center" valign="middle" >−0.03</td><td align="center" valign="middle" >p</td></tr><tr><td align="center" valign="middle" >1</td><td align="center" valign="middle" >1</td><td align="center" valign="middle" >10.4</td><td align="center" valign="middle" >0</td><td align="center" valign="middle" >32.6</td><td align="center" valign="middle" >56.7</td><td align="center" valign="middle" >−0.04</td><td align="center" valign="middle" >p</td></tr></tbody></table></table-wrap><p>The good stœchiometry is well observed in our samples and its magnitude deviation Δy is slight; so, our samples present a nearly perfect stœchiometry (Δy = 0) [<xref ref-type="bibr" rid="scirp.80457-ref3">3</xref>] . The composition x in gallium for the studied samples, from EDS measurements, is very close to the starting composition of the elements in the sealed tube. The CuIn<sub>3</sub>Se<sub>5</sub> samples show a conductivity of type n and the other samples (x ≠ 0) are all of type p.</p></sec><sec id="s2_2"><title>2.2. Characterization by X-Ray Diffraction</title><p>The X-Ray diffraction spectra of different samples Cu(In<sub>1−x</sub>Ga<sub>x</sub>)<sub>3</sub>Se<sub>5</sub> are illustrated in <xref ref-type="fig" rid="fig2">Figure 2</xref>(a). Our samples are of good crystalline quality and all excitation peaks in the resulting spectra are the same as those found in references [<xref ref-type="bibr" rid="scirp.80457-ref4">4</xref>] [<xref ref-type="bibr" rid="scirp.80457-ref5">5</xref>] [<xref ref-type="bibr" rid="scirp.80457-ref6">6</xref>] [<xref ref-type="bibr" rid="scirp.80457-ref7">7</xref>] . Thus, X-Ray diffraction patterns show the presence of many preferential orientations according to the planes (112), (220) and (312) of all the samples. Also, it shows a linear shifting of peaks towards the higher magnitudes of 2θ when the x composition increases.</p><p>The (112) peak position as function of the composition x (0 ≤ x ≤ 1) is shown on <xref ref-type="fig" rid="fig2">Figure 2</xref>(b) and it may be written under the following linear form:</p><p>2 θ = 26.84 + 1.2 x (1)</p><p>The compounds Cu(In<sub>1−x</sub>Ga<sub>x</sub>)<sub>3</sub>Se<sub>5</sub> do not have a chalcopyrite structure as for Cu(In<sub>1−x</sub>Ga<sub>x</sub>)Se<sub>2</sub> since the characteristic peaks concerning the chalcopyrite</p><table-wrap id="table2" ><label><xref ref-type="table" rid="table2">Table 2</xref></label><caption><title> Lattice parameters (a, c and c/a) for near-stœchiometry Cu(In<sub>1−x</sub>Ga<sub>x</sub>)<sub>3</sub>Se<sub>5</sub> crystals</title></caption><table><tbody><thead><tr><th align="center" valign="middle" >x</th><th align="center" valign="middle" >a</th><th align="center" valign="middle" >c</th><th align="center" valign="middle" >c/a</th><th align="center" valign="middle" >Δ (c/a)</th></tr></thead><tr><td align="center" valign="middle" >0</td><td align="center" valign="middle" >5.76</td><td align="center" valign="middle" >11.52</td><td align="center" valign="middle" >2.0015</td><td align="center" valign="middle" >+0.0015</td></tr><tr><td align="center" valign="middle" >0.2</td><td align="center" valign="middle" >5.72</td><td align="center" valign="middle" >11.43</td><td align="center" valign="middle" >1.9995</td><td align="center" valign="middle" >−0.0005</td></tr><tr><td align="center" valign="middle" >0.4</td><td align="center" valign="middle" >5.65</td><td align="center" valign="middle" >11.295</td><td align="center" valign="middle" >1.999</td><td align="center" valign="middle" >−0.0010</td></tr><tr><td align="center" valign="middle" >0.5</td><td align="center" valign="middle" >5.62</td><td align="center" valign="middle" >11.262</td><td align="center" valign="middle" >2.0032</td><td align="center" valign="middle" >+0.0032</td></tr><tr><td align="center" valign="middle" >0.6</td><td align="center" valign="middle" >5.59</td><td align="center" valign="middle" >11.28</td><td align="center" valign="middle" >2.016</td><td align="center" valign="middle" >+0.0160</td></tr><tr><td align="center" valign="middle" >0.8</td><td align="center" valign="middle" >5.56</td><td align="center" valign="middle" >11.17</td><td align="center" valign="middle" >2.007</td><td align="center" valign="middle" >+0.0070</td></tr><tr><td align="center" valign="middle" >1</td><td align="center" valign="middle" >5.49</td><td align="center" valign="middle" >10.93</td><td align="center" valign="middle" >1.9896</td><td align="center" valign="middle" >−0.0105</td></tr></tbody></table></table-wrap><p>structure could not be observed. These compounds can be of stannite structure [<xref ref-type="bibr" rid="scirp.80457-ref6">6</xref>] [<xref ref-type="bibr" rid="scirp.80457-ref7">7</xref>] [<xref ref-type="bibr" rid="scirp.80457-ref8">8</xref>] or an Ordered Vacancy Chalcopyrite structure (OVC) or Ordered Defect Chalcopyrite Structure (ODC).</p><p>The lattice parameters a and c for Cu(In<sub>1−x</sub>Ga<sub>x</sub>)<sub>3</sub>Se<sub>5</sub> given in <xref ref-type="table" rid="table2">Table 2</xref>, have been calculated from our spectra. These values decrease when the Gallium concentration increases [<xref ref-type="bibr" rid="scirp.80457-ref9">9</xref>] [<xref ref-type="bibr" rid="scirp.80457-ref10">10</xref>] [<xref ref-type="bibr" rid="scirp.80457-ref11">11</xref>] [<xref ref-type="bibr" rid="scirp.80457-ref12">12</xref>] . They vary between: a = 5.76, c = 11.2 for the CuIn<sub>3</sub>Se<sub>5</sub> and a = 5.49, c = 10.93 for the CuGa<sub>3</sub>Se<sub>5</sub>; i.e. the Gallium atom is smaller than the Indium one. Our values obtained for a and c are in good agreement with those reported in the literature [<xref ref-type="bibr" rid="scirp.80457-ref9">9</xref>] [<xref ref-type="bibr" rid="scirp.80457-ref10">10</xref>] [<xref ref-type="bibr" rid="scirp.80457-ref11">11</xref>] [<xref ref-type="bibr" rid="scirp.80457-ref12">12</xref>] .</p></sec><sec id="s2_3"><title>2.3. Characterization by Photoluminescence</title><p>Zott et al. [<xref ref-type="bibr" rid="scirp.80457-ref13">13</xref>] [<xref ref-type="bibr" rid="scirp.80457-ref14">14</xref>] and Orsal et al. [<xref ref-type="bibr" rid="scirp.80457-ref15">15</xref>] have studied the gap variation of CuInSe<sub>2</sub> and CuGaSe<sub>2</sub> as a function of the ratio Cu/In and Cu/Ga respectively; they have observed an increase of the gap value with the concentration of Indium or Gallium. The compounds Cu(In<sub>1−x</sub>Ga<sub>x</sub>)<sub>3</sub>Se<sub>5</sub> are equivalent to the compounds Cu(In<sub>1−x</sub>Ga<sub>x</sub>)Se<sub>2</sub> with an excess of Indium or Gallium according to the composition x. Then, the Cu(In<sub>1−x</sub>Ga<sub>x</sub>)<sub>3</sub>Se<sub>5</sub> compounds shows a gap value higher than that of Cu(In<sub>1−x</sub>Ga<sub>x</sub>)Se<sub>2</sub> for each value of the composition x.</p><p>The different Photoluminescence response spectra of the alloy Cu(In<sub>1−x</sub>Ga<sub>x</sub>)<sub>3</sub>Se<sub>5</sub> (0 ≤ x ≤ 1) at liquid helium temperature (4.2 K) are presented in <xref ref-type="fig" rid="fig3">Figure 3</xref>(a). For x = 0 we have been able to detect the exciton position which allows us to specify the exact position of the band gap. The arrows pointing upward indicate the gap values of literature [<xref ref-type="bibr" rid="scirp.80457-ref10">10</xref>] [<xref ref-type="bibr" rid="scirp.80457-ref12">12</xref>] , and the arrows pointing downward indicate our values (for x = 1 and x = 0). These spectra shift towards higher energies when gallium concentration increases. Each of the spectra is formed by one large peak, which is probably caused by the impurity band transitions. <xref ref-type="fig" rid="fig3">Figure 3</xref>(b) presents the PL dominant peak variation as function of the composition x. We notice that our samples have band gap energy values that are well conform to those of literature [<xref ref-type="bibr" rid="scirp.80457-ref10">10</xref>] [<xref ref-type="bibr" rid="scirp.80457-ref12">12</xref>] .</p></sec><sec id="s2_4"><title>2.4. Characterization by Photoconductivity</title><p>We have determined the band gap energy value at room-temperature by analyzing</p><p>our compounds using spectral Photoconductivity [<xref ref-type="bibr" rid="scirp.80457-ref16">16</xref>] .</p><p><xref ref-type="fig" rid="fig4">Figure 4</xref>(a) illustrates the different spectra of Photoconductivity ((αhν)<sup>2</sup> as a function hν) of the alloy Cu(In<sub>1−x</sub>Ga<sub>x</sub>)<sub>3</sub>Se<sub>5</sub>. These spectra denote high speeds of surface recombination. We do not observe a saturation level at high energy. In these cases, the gap value is given by an approximate value by taking the abscissa of each curve at PC<sub>max</sub>/2. We have observed a variation of band gap energy as a function of the composition x at room temperature, the band gap value varies from 1.23 eV [<xref ref-type="bibr" rid="scirp.80457-ref6">6</xref>] [<xref ref-type="bibr" rid="scirp.80457-ref7">7</xref>] [<xref ref-type="bibr" rid="scirp.80457-ref12">12</xref>] for x = 0 to 1.85 eV for x = 1, these values match those found by Photoluminescence and in literature [<xref ref-type="bibr" rid="scirp.80457-ref4">4</xref>] [<xref ref-type="bibr" rid="scirp.80457-ref6">6</xref>] [<xref ref-type="bibr" rid="scirp.80457-ref7">7</xref>] [<xref ref-type="bibr" rid="scirp.80457-ref10">10</xref>] . <xref ref-type="fig" rid="fig4">Figure 4</xref>(b) shows the variations of band gap energy at 300 K as a function of the composition x. These variations can be expressed by the following equation:</p><p>E g ( x ) [ e V ] = 1.22 + 0.42 x + 0.21 x 2 (2)</p></sec><sec id="s2_5"><title>2.5. Characterization by Spectroscopic Ellipsometry (SE)</title><p>Spectroscopic Ellipsometry (SE) is a characterization technique which allows the</p><p>determination of energy levels above the gap in the band scheme. The real part of the dielectric pseudo-function 〈 ε r 〉 is related to the substrate densities of state D n . The calculation of the 3<sup>rd</sup> order derivative of the quantity E 2 ε r ( E ) [<xref ref-type="bibr" rid="scirp.80457-ref17">17</xref>] , is given by:</p><p>D n ( E ) = 1 E 2 d 3 d E 3 [ E 2 ε r ( E ) ]</p><p>where E = ℏ ω is the photon energy, allows the determination of the energy levels of optical transitions that correspond to the peaks of D n . In order to illustrate this fact, a harmonic oscillator model, centred at the frequency ω 0 is used. Its’ Lorentz nature is characterized by an elastic amplitude α e and an absorption one α a :</p><p>α e = ω 0 2 − ω 2 ( ω 0 2 − ω 2 ) 2 + r 2 ω 2</p><p>α a = r 2 ω 2 ( ω 0 2 − ω 2 ) 2 + r 2 ω 2</p><p>where r is the damping constant.</p><p>The Cu(In<sub>1−x</sub>Ga<sub>x</sub>)<sub>3</sub>Se<sub>5</sub> bulk compounds were characterized by Spectroscopic Ellipsometry, and the observed transitions were determined by the method described above. <xref ref-type="fig" rid="fig5">Figure 5</xref> illustrates the evolution of the imaginary part ( ε i ) and</p><p>the real one ( ε r ) for the dielectric function in terms of the composition of Cu(In<sub>1−x</sub>Ga<sub>x</sub>)<sub>3</sub>Se<sub>5</sub> alloy for different values of x (x = 0, 0.21, 0.36, 0.5, 0.64, 0.78 and 1). For the sake of clarity of spectra, each spectrum was shifted by the quantity given in parenthesis on the left.</p><p>The spectrum of the imaginary part of dielectric function was observed to shift towards higher energies as gallium concentration increases.</p><p>The method described above has been applied to the case of Cu(In<sub>1−x</sub>Ga<sub>x</sub>)<sub>3</sub>Se<sub>5</sub> bulks. <xref ref-type="fig" rid="fig6">Figure 6</xref> shows the results of the spectra at 3<sup>rd</sup> and 4<sup>th</sup> order derivatives of ε i for a sample of CuIn<sub>3</sub>Se<sub>5</sub>.and CuGa<sub>3</sub>Se<sub>5</sub>.</p><p>Zeaiter et al. [<xref ref-type="bibr" rid="scirp.80457-ref18">18</xref>] were studied the stœchiometry effect on the dielectric functions. They found that the imaginary dielectric function ( ε i ) of CuInSe<sub>2</sub> evolves for different values of Cu/In ratio. In fact, the peaks widen when the percentage of indium is increased, because the dielectric function is directly related to the crystal structure. Since the crystal is rich in In, involves a disorder in the crystal lattice and a loss of crystallinity which proved more significantly for high energies. This effect was observed in the case of silicon [<xref ref-type="bibr" rid="scirp.80457-ref19">19</xref>] [<xref ref-type="bibr" rid="scirp.80457-ref20">20</xref>] .</p><p>Therefore, the implementation has the effect of widening the peaks and simultaneously decreasing the intensity of the peaks of the imaginary dielectric function (ε<sub>i</sub>). The same effects were noticed on the spectra of Cu(In<sub>1−x</sub>Ga<sub>x</sub>)<sub>3</sub>Se<sub>5</sub> compounds [<xref ref-type="bibr" rid="scirp.80457-ref21">21</xref>] . Cu(In<sub>1−x</sub>Ga<sub>x</sub>)<sub>3</sub>Se<sub>5</sub> compounds are like CuIn<sub>1−x</sub>Ga<sub>x</sub>Se<sub>2</sub> compounds.</p><p><xref ref-type="table" rid="table3">Table 3</xref> shows the observed transitions values (E<sub>1</sub>, E<sub>2</sub> and E<sub>3</sub>) for different samples of the Cu(In<sub>1−x</sub>Ga<sub>x</sub>)<sub>3</sub>Se<sub>5</sub> (0 &#163; x &#163; 1) alloy. <xref ref-type="fig" rid="fig7">Figure 7</xref> illustrates the variation of these transitions as a function of the initial composition x. Parabolic variations are obtained for E<sub>1</sub>, E<sub>2</sub> and E<sub>3</sub> (as a function of the composition x). The equations for the fitted curves are:</p><p>E 1 = 2.76 + 0.29 x − 0.06 x 2 E 2 = 3.73 + 0.27 x − 0.146 x 2 E 3 = 4.64 + 0.245 x − 0.033 x 2</p><table-wrap id="table3" ><label><xref ref-type="table" rid="table3">Table 3</xref></label><caption><title> The transitions energies obtained by the 3<sup>rd</sup> order derivative of ε r and the 4<sup>th</sup> order derivative of ε i for different samples</title></caption><table><tbody><thead><tr><th align="center" valign="middle" >Samples</th><th align="center" valign="middle" >E<sub>1</sub> (eV)</th><th align="center" valign="middle" >E<sub>2</sub> (eV)</th><th align="center" valign="middle" >E<sub>3</sub> (eV)</th></tr></thead><tr><td align="center" valign="middle" >x = 0</td><td align="center" valign="middle" >2.75</td><td align="center" valign="middle" >3.68</td><td align="center" valign="middle" >4.62</td></tr><tr><td align="center" valign="middle" >x = 0.21</td><td align="center" valign="middle" >2.85</td><td align="center" valign="middle" >3.86</td><td align="center" valign="middle" >4.72</td></tr><tr><td align="center" valign="middle" >x = 0.36</td><td align="center" valign="middle" >2.85</td><td align="center" valign="middle" >3.78</td><td align="center" valign="middle" >4.73</td></tr><tr><td align="center" valign="middle" >x = 0.5</td><td align="center" valign="middle" >2.9</td><td align="center" valign="middle" >3.84</td><td align="center" valign="middle" >4.773</td></tr><tr><td align="center" valign="middle" >x = 0.78</td><td align="center" valign="middle" >2.95</td><td align="center" valign="middle" >3.786</td><td align="center" valign="middle" >4.83</td></tr><tr><td align="center" valign="middle" >x = 1</td><td align="center" valign="middle" >3</td><td align="center" valign="middle" >3.89</td><td align="center" valign="middle" >4.93</td></tr></tbody></table></table-wrap><p>The transitions E<sub>1</sub> and E<sub>3</sub> can be attributed to the ionization of levels d of Cu. In contrary, the transition E<sub>2</sub> is related to the hybridization s-s between the s-levels of indium and that of Cu.</p><p>The highest levels of the valence band are essentially composed of the 4p-levels of Se and the localized strong density d-levels of Cu. Thus, the valence band is nearly independent of the variation of composition.</p><p>The lowest levels of the conduction band are essentially composed of s-levels for copper and indium. Gallium is specified by a 4 s band with higher energy than that of 3 s of indium. When a gallium atom replaces an indium atom, one assumes globally that the levels related to selenium and copper are unchanged. Conversely, the levels corresponding to the conduction band are shifted towards higher energies. Thus, the gap increase as the composition of gallium increases.</p></sec></sec><sec id="s3"><title>3. Conclusion</title><p>The Cu(In<sub>1−x</sub>Ga<sub>x</sub>)<sub>3</sub>Se<sub>5</sub> for (0 ≤ x ≤ 1) compounds were prepared by the Bridgman method. The different samples have been characterized by several techniques of characterization. Samples show a good stœchiometry. These materials are well crystallized having a preferential orientation. In addition, they have a stannite structure, an Ordered Vacancy Chalcopyrite (OVC) or an Ordered Defect Chalcopyrite (OVC). The lattice parameters (a and c) vary between a = 5.76, c = 11.2 for the CuIn<sub>3</sub>Se<sub>5</sub> and a = 5.49, c = 10.93 for the CuGa<sub>3</sub>Se<sub>5</sub>. These simples have p-type conductivity for the values of x ≠ 0, the band gap energy values of these compounds, which vary from 1.23 eV for the CuIn<sub>3</sub>Se<sub>5</sub> to 1.85 eV for the CuGa<sub>3</sub>Se<sub>5</sub>. Spectroscopic Ellipsometry was used to determine the energy levels above the gap in the band scheme. We measured the dielectric function &#225;ε&#241; at room temperature by varying the energy between 1.5 to 5.5 eV. We observed several transitions (E<sub>1</sub>, E<sub>2</sub>, E<sub>3</sub>) above the gap for the different samples of the Cu(In<sub>1−x</sub>Ga<sub>x</sub>)<sub>3</sub>Se<sub>5</sub> alloy (0 &#163; x &#163; 1). These transitions vary parabolically as a function of the starting composition x. When a gallium atom replaces an indium atom, the levels of the conduction band move to higher energies. Thus the gap will increase when the gallium composition increases. The study by spectroscopic ellipsometry allowed us to explain the increase in the energy gap as a function of the Gallium concentration, and consequently to prepare a more efficient junction, simply by choosing the correct x value of the Cu(In<sub>1−x</sub>Ga<sub>x</sub>)<sub>3</sub>Se<sub>5</sub> alloy when the gap value is matched to the solar spectrum.</p></sec><sec id="s4"><title>Cite this paper</title><p>Habib, D. and El Haj Moussa, G. (2017) Spectroscopic Ellipsometry Study of the Dielectric Function of Cu(In<sub>1-x</sub>Ga<sub>x</sub>)<sub>3</sub>Se<sub>5</sub> Bulk Compounds: Identification of Optical Transitions. World Journal of Condensed Matter Physics, 7, 99-110. https://doi.org/10.4236/wjcmp.2017.74009</p></sec></body><back><ref-list><title>References</title><ref id="scirp.80457-ref1"><label>1</label><mixed-citation publication-type="other" xlink:type="simple">Laes, K., Bereznev, S., Tverjanovich, A., Borisov, E.N., Varema, T., Volobujeva, O. and Andres, O. (2009) Shallow Defect Density Determination in CuIn3Se5 Thin Film Photoabsorber by Impedance Spectroscopy. Thin Solid Films, 517, 2286-2290. https://doi.org/10.1016/j.tsf.2008.10.106</mixed-citation></ref><ref id="scirp.80457-ref2"><label>2</label><mixed-citation publication-type="other" xlink:type="simple">Schmidt, D., Ruckh, M., Grunwald, F. and Sckock, H.W. (1993) Chalcopyrite/Defect Chalcopyrite Heterojunctions on the Basis of CuInSe2. Journal of Applied Physics, 73, 2902. https://doi.org/10.1063/1.353020</mixed-citation></ref><ref id="scirp.80457-ref3"><label>3</label><mixed-citation publication-type="other" xlink:type="simple">Contreras, M.A., Wiesner, H., Mtson, R., Tuttle, J., Ramanathan, K., Noufi, R. (1996) Defect Chalcopyrite Cu(In1&amp;minus;xGax)3Se5 Polycrystalline Thin-Film Materials. Materials Research Society Symposium Proceedings 426, 243. https://doi.org/10.1557/PROC-426-243</mixed-citation></ref><ref id="scirp.80457-ref4"><label>4</label><mixed-citation publication-type="other" xlink:type="simple">Marin, G., Tauleigne, S., Wasim, S.M., Rincon, C., Guervara, R., Delgado, J.M. and Rincón, C. (1998) X-Ray Powder Diffraction and Optical Characterizations of the Cu(In1&amp;minus;xGax)3Se5 Semiconducting Systems. Materials Research Bulletin, 33, 1057-1068.</mixed-citation></ref><ref id="scirp.80457-ref5"><label>5</label><mixed-citation publication-type="other" xlink:type="simple">Negami, T., Kohara, N., Nikihiko, M., Wada, T. and Hirao, T. (1995) Preparation and Characterization of Cu(In1&amp;minus;xGax)3Se5 Thin Films. Applied Physics Letters, 67, 825-827. https://doi.org/10.1063/1.115456</mixed-citation></ref><ref id="scirp.80457-ref6"><label>6</label><mixed-citation publication-type="other" xlink:type="simple">Habib, D., Aoudé, O., Karishy, S. and Moussa, G.E.H. (2015) Fabrication, Characterization and Optical Properties of CuIn3Se5 Bulk. Compounds. World Journal of Condensed Matter Physics, 5, 201-208. https://doi.org/10.4236/wjcmp.2015.53021</mixed-citation></ref><ref id="scirp.80457-ref7"><label>7</label><mixed-citation publication-type="other" xlink:type="simple">Habib, D., Moussa, G.E.H. (2016) Crystal Growth, Structural and Optical Studies of CuGa3Se5 Bulk Compounds. World Journal of Condensed Matter Physics, 6, 27-34.https://doi.org/10.4236/wjcmp.2016.61004</mixed-citation></ref><ref id="scirp.80457-ref8"><label>8</label><mixed-citation publication-type="other" xlink:type="simple">Suzuki, M., Uenoyama, T., Wada, T., Hanada, T. and Nakamura, Y. (1997) Effect of Crystal Symmetry on Electronic Structures of CuInSe2 and Related Compounds. Japanese Journal of Applied Physics, 36, L1139-L1141.https://doi.org/10.1143/JJAP.36.L1139</mixed-citation></ref><ref id="scirp.80457-ref9"><label>9</label><mixed-citation publication-type="other" xlink:type="simple">Marin, G., Tauleigne, S., Guervara, R., Degado, J.M., Wasim, S.M., Bocaranda, P., Sanchez Perez, G. and Diaz, J. (1997) The 11th International Conference on Ternary and Multinary Compounds, ICTMC-11, Salford, 8-12 September, 573.</mixed-citation></ref><ref id="scirp.80457-ref10"><label>10</label><mixed-citation publication-type="other" xlink:type="simple">Contreras, M.A., Wiesner, H., Mtson, R., Tuttle, J., Ramanathan, K. and Noufi, R. (1996) Defect Chalcopyrite Cu(In1&amp;minus;xGax)3Se5 Polycrystalline Thin-Film Materials. Materials Research Society Symposium Proceedings, 426, 243-254. https://doi.org/10.4236/wjcmp.2013.34026</mixed-citation></ref><ref id="scirp.80457-ref11"><label>11</label><mixed-citation publication-type="other" xlink:type="simple">Habib, D., Al Asmar, R., El Helou, Z., Moussa, G.E.H. (2013) Influence of Iodine Pressure on the Growth of CuIn1&amp;minus;xGaxSe2 Thin Films Obtained by Close-Spaced Vapor Transport “CSVT”. World Journal of Condensed Matter Physics, 3, 164-168.https://doi.org/10.4236/wjcmp.2013.34026</mixed-citation></ref><ref id="scirp.80457-ref12"><label>12</label><mixed-citation publication-type="other" xlink:type="simple">Malar, P., Kasiviswanathan, S. (2005) A Comparative Study of CuInSe2 and CuIn3Se5 Films Using Transmission Electron Microscopy, Optical Absorption and Rutherford Backscattering Spectrometry. Solar Energy Materials and Solar Cells, 88, 281-292. https://doi.org/10.1016/j.solmat.2004.11.002</mixed-citation></ref><ref id="scirp.80457-ref13"><label>13</label><mixed-citation publication-type="other" xlink:type="simple">Zott, S., Leo, K., Ruckh, M. and Schock, H. (1997) Radiative Recombination in CuInSe2 Thin Films. Journal of Applied Physics, 82, 356. https://doi.org/10.1063/1.366546</mixed-citation></ref><ref id="scirp.80457-ref14"><label>14</label><mixed-citation publication-type="other" xlink:type="simple">Zott, S., Leo, K., Ruckh, M. and Schock, H.W. (1996) Photoluminescence of Polycrystalline CuInSe2 Thin Films. Applied Physics Letters, 68, 1144.https://doi.org/10.1063/1.115704</mixed-citation></ref><ref id="scirp.80457-ref15"><label>15</label><mixed-citation publication-type="other" xlink:type="simple">Orsal, G., Mailly, F., Romain, N., Artaud, M.C., Rushwort, S. and Duchemin, S. (2000) Study of Polycrystalline CuGaSe2 Thin Films Deposited by MOCVD onto ZnO Substrates. Thin Solid Films, 135, 361-263.</mixed-citation></ref><ref id="scirp.80457-ref16"><label>16</label><mixed-citation publication-type="other" xlink:type="simple">Ariswan, G., Moussa, E.H., Abdelali, M., Guastavino, F. and Llinares, C. (2002) Structural, Optical and Electrical Properties of the Ordered Vacancy Compound CuIn3Se5 Thin Films Fabricated by Flash Evaporation. Solid State Communications, 124, 391-396. https://doi.org/10.1016/S0038-1098(02)00603-8</mixed-citation></ref><ref id="scirp.80457-ref17"><label>17</label><mixed-citation publication-type="other" xlink:type="simple">Aspnes, D.E. and Studna, A.A. (1983) Dielectric Functions and Optical Parameters of Si, Ge, GaP, GaAs, GaSb, InP, InAs, and InSb from 1.5 to 6.0 eV. Physical Review B, 27, 985. https://doi.org/10.1103/PhysRevB.27.985</mixed-citation></ref><ref id="scirp.80457-ref18"><label>18</label><mixed-citation publication-type="other" xlink:type="simple">Zeaiter, K., Yanuar, A. and Llinares, C. (2001) Off-Stoichiometry Effect on the CuInSe2 Dielectric Function. Solar Energy Materials &amp; Solar Cells, 70, 213-218.https://doi.org/10.1016/S0927-0248(01)00026-5</mixed-citation></ref><ref id="scirp.80457-ref19"><label>19</label><mixed-citation publication-type="other" xlink:type="simple">Aspnes, D.E. (1982) Optical Properties of Thin Films. Thin Solid Films, 89, 249-262.https://doi.org/10.1016/0040-6090(82)90590-9</mixed-citation></ref><ref id="scirp.80457-ref20"><label>20</label><mixed-citation publication-type="book" xlink:type="simple">Aspnes, D.E. (1985) Chapter 5—The Accurate Determination of Optical Properties by Ellipsometry. In: Palik, E.D., Ed., Handbook of Optical Constant of Solid, Academic Press, 88-110.</mixed-citation></ref><ref id="scirp.80457-ref21"><label>21</label><mixed-citation publication-type="other" xlink:type="simple">El Haj Moussa, G.W., Ajaka, M., El Tahchi, M., Eid, E. and Llinares, C. (2005) Ellipsometric Spectroscopy on Polycrystalline CuIn1–xGaxSe2: Identification of Optical Transitions. Physica Status Solidi (a), 202, 469-475. https://doi.org/10.1002/pssa.200406934</mixed-citation></ref></ref-list></back></article>