<?xml version="1.0" encoding="UTF-8"?><!DOCTYPE article  PUBLIC "-//NLM//DTD Journal Publishing DTD v3.0 20080202//EN" "http://dtd.nlm.nih.gov/publishing/3.0/journalpublishing3.dtd"><article xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" dtd-version="3.0" xml:lang="en" article-type="research article"><front><journal-meta><journal-id journal-id-type="publisher-id">EPE</journal-id><journal-title-group><journal-title>Energy and Power Engineering</journal-title></journal-title-group><issn pub-type="epub">1949-243X</issn><publisher><publisher-name>Scientific Research Publishing</publisher-name></publisher></journal-meta><article-meta><article-id pub-id-type="doi">10.4236/epe.2017.94B003</article-id><article-id pub-id-type="publisher-id">EPE-75215</article-id><article-categories><subj-group subj-group-type="heading"><subject>Articles</subject></subj-group><subj-group subj-group-type="Discipline-v2"><subject>Engineering</subject></subj-group></article-categories><title-group><article-title>
 
 
  Fault Identification of Power Grid Based on Wide-Area Differential Current and K-Means Clustering
 
</article-title></title-group><contrib-group><contrib contrib-type="author" xlink:type="simple"><name name-style="western"><surname>Hao</surname><given-names>Wu</given-names></name><xref ref-type="aff" rid="aff1"><sup>1</sup></xref></contrib><contrib contrib-type="author" xlink:type="simple"><name name-style="western"><surname>Qunzhan</surname><given-names>Li</given-names></name><xref ref-type="aff" rid="aff1"><sup>1</sup></xref></contrib></contrib-group><aff id="aff1"><addr-line>Electrical Engineering Institute, Southwest Jiaotong University, Chengdu, China</addr-line></aff><pub-date pub-type="epub"><day>06</day><month>04</month><year>2017</year></pub-date><volume>09</volume><issue>04</issue><fpage>19</fpage><lpage>29</lpage><history><date date-type="received"><day>March</day>	<month>9,</month>	<year>2017</year></date><date date-type="rev-recd"><day>Accepted:</day>	<month>March</month>	<year>30,</year>	</date><date date-type="accepted"><day>April</day>	<month>6,</month>	<year>2017</year></date></history><permissions><copyright-statement>&#169; Copyright  2014 by authors and Scientific Research Publishing Inc. </copyright-statement><copyright-year>2014</copyright-year><license><license-p>This work is licensed under the Creative Commons Attribution International License (CC BY). http://creativecommons.org/licenses/by/4.0/</license-p></license></permissions><abstract><p>
 
 
   
   A new method of fault domain identification is proposed based on K-means clustering analysis theories using the wide-area information of power grid. In the method, the node Intelligent Electronic Device (IED) associated domain is defined, and the relationship of positive sequence current fault component for the association domain boundaries is sought, then the conception of positive sequence fault component differential current for node IED association domains is introduced. The information of the positive sequence fault component differential current gathered by node IEDs is selected as the object of K-means clustering. The node IEDs of fault associated domains can be classified into one category, and the node IEDs of non-fault associated domains are classified into another category. With the fault area minimum principle, the group of node IEDs about fault associated domains can be obtained. The overlap of fault associated domains for different nodes is the fault area. A large number of simulations show that the algorithm proposed can identify fault domains with high accuracy and no influence by the operating mode of the system and topological changes. 
  
 
</p></abstract><kwd-group><kwd>Positive Sequence Fault Component Differential Current</kwd><kwd> K-Means  Clustering</kwd><kwd> Fault Association Domain</kwd><kwd> The Node IED</kwd><kwd> Fault Domain  Identification</kwd></kwd-group></article-meta></front><body><sec id="s1"><title>1. Introduction</title><p>With the increasingly complex structure and the continuously extended scale of power grid, the traditional backup protection based on local information can not satisfy requirements of complex and various operation modes of power grid. The rapid development of computer technologies and the wide-area measurement technologies make global information being introduced into protection possible. In recent years, extensive researches on wide-area backup protection have carried on at home and abroad, mainly concentrating in tripping strategies and fault areas identification of wide-area protection, etc. [<xref ref-type="bibr" rid="scirp.75215-ref1">1</xref>] [<xref ref-type="bibr" rid="scirp.75215-ref2">2</xref>] [<xref ref-type="bibr" rid="scirp.75215-ref3">3</xref>] [<xref ref-type="bibr" rid="scirp.75215-ref4">4</xref>].</p><p>The wide-area relay protection system given in reference [<xref ref-type="bibr" rid="scirp.75215-ref5">5</xref>] is based on the current differential principle, and problems such as protection domain division rules for wide-area protection are discussed in the reference. A wide-area current differential protection principle based on multi Agent is proposed in the reference [<xref ref-type="bibr" rid="scirp.75215-ref6">6</xref>], where an expert system is used to realize the area division of current differential protection, and the wide-area differential protection is achieved through coordination between protection Agents.</p><p>In order to further study the application of artificial intelligence algorithm in wide-area backup protection and improve the accuracy of fault identification with wide-area information under different working conditions, a new method for identifying failure areas of power grid based on k-means clustering according to wide-area positive sequence fault component differential current information is proposed on the basis of previous studies.</p></sec><sec id="s2"><title>2. K-Means Clustering</title><p>The K-means clustering algorithm is to cluster based on the objective function of a prototype. In the algorithm, the sum of distances from data to corresponding clustering centers is the optimized objective function and adjusting rules for iterative operations are obtained by finding the extremum solution of the function. The mean value of data samples of each cluster subset is selected as the clustering center of the corresponding cluster. The main idea of the algorithm is to divide data into different classes through iteration processes, and makes the clustering criterion function used to evaluate the clustering performance to achieve its optimum, so that each cluster generated can be compact inside and independent to others. The number k of clusters and a database contains n objects are needed to be input first of all, and then n objects are divided into k clusters, which can make the minimum square error criterion [<xref ref-type="bibr" rid="scirp.75215-ref7">7</xref>] [<xref ref-type="bibr" rid="scirp.75215-ref8">8</xref>]. For a given data set<inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/75215x2.png" xlink:type="simple"/></inline-formula>, processes of K-means clustering algorithm are as follows [<xref ref-type="bibr" rid="scirp.75215-ref8">8</xref>] [<xref ref-type="bibr" rid="scirp.75215-ref9">9</xref>]:</p><p>1) Select K initial clustering centers:<inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/75215x3.png" xlink:type="simple"/></inline-formula>.</p><p>2) Calculate the distance d from every data to each clustering center, and divide the data to the corresponding cluster <inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/75215x4.png" xlink:type="simple"/></inline-formula> with the minimum distance d.</p><p><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/75215x5.png" xlink:type="simple"/></inline-formula>.</p><p>3) Calculate the new clustering center vector <inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/75215x6.png" xlink:type="simple"/></inline-formula> of each cluster,</p><disp-formula id="scirp.75215-formula11"><graphic  xlink:href="http://html.scirp.org/file/75215x7.png"  xlink:type="simple"/></disp-formula><p>In which, q is the attribute number of data, <inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/75215x8.png" xlink:type="simple"/></inline-formula>is the number of data that the j-th cluster <inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/75215x9.png" xlink:type="simple"/></inline-formula> included.</p><p>4) Repeat processes 2 and 3, until each cluster is no longer changes.</p></sec><sec id="s3"><title>3. Fault Domain Identification Based on K-Means</title><sec id="s3_1"><title>3.1. The Analysis of Clustering Objects</title><p>Node IEDs of power grid are installed at substation nodes, corresponding to substations. Each node IED has the same status, whose works are mainly to collect electric information sent from related line IEDs, and upload them to wide-area decision center after preliminary processing. Line IEDs mainly acquire positive sequence current fault component information at installation places, and upload the information to the corresponding grid node IEDs. Fault domains of power grid can be identified by the fault recognition algorithm to process the data uploaded by node IEDs. The associated domain of node IED is defined in this paper. As shown in <xref ref-type="fig" rid="fig1">Figure 1</xref>, the domain surrounded by dotted line 2 is the associated domain of the node IED<sub>B</sub><sub>2</sub>, which consists of line L<sub>1</sub>, L<sub>2</sub> and bus B<sub>2</sub> with two boundary IEDs, IED<sub>1</sub> and IED<sub>4</sub>. Similarly, associated domains of other nodes are domains surrounded by dotted lines 1, 3, 4, 5.</p><p>The positive sequence fault component differential current of the node IED associated domain is defined as the sum of phasors of all positive sequence fault current components measured at boundary line IEDs. For example, at the node IED<sub>B</sub><sub>2</sub>, the positive sequence fault component differential current <inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/75215x10.png" xlink:type="simple"/></inline-formula> of the node associated domain is<inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/75215x11.png" xlink:type="simple"/></inline-formula>. Any fault occurs in the associated domain, the value of <inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/75215x12.png" xlink:type="simple"/></inline-formula> which is the total positive sequence fault current component will be very large and associated domain ② is the fault associated domain for the moment. When normal operation or external fault of the associated domain, the positive sequence fault component differential current <inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/75215x13.png" xlink:type="simple"/></inline-formula> whose ideal value is zero is actually an unbalanced current with small value. Thus, when a short-circuit fault occurs at K<sub>1</sub> point in the <xref ref-type="fig" rid="fig1">Figure 1</xref>, domains ①, ④ and ⑤ are non-fault domains, domains ② and ③ are fault domains and corresponding fault nodes are B<sub>2</sub> and B<sub>3</sub>. Therefore, it can be assured that the fault domain is the overlapped part of two node IEDs associated domains (as the shaded part shown in <xref ref-type="fig" rid="fig1">Figure 1</xref>), that is the line L<sub>2</sub>.</p><p>When a fault occurs at bus B<sub>3</sub> in the <xref ref-type="fig" rid="fig1">Figure 1</xref>, for domain ① we have<inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/75215x14.png" xlink:type="simple"/></inline-formula>, for domain ② we have<inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/75215x15.png" xlink:type="simple"/></inline-formula>, for domain ③ we have<inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/75215x16.png" xlink:type="simple"/></inline-formula>, for domain ④ we have</p><p><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/75215x17.png" xlink:type="simple"/></inline-formula>, for domain ⑤ we have<inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/75215x18.png" xlink:type="simple"/></inline-formula>. It can be</p><fig id="fig1"  position="float"><label><xref ref-type="fig" rid="fig1">Figure 1</xref></label><caption><title> IED associated domain analysis</title></caption><graphic mimetype="image"   position="float"  xlink:type="simple"  xlink:href="http://html.scirp.org/file/75215x19.png"/></fig><p>assured that the domain ③ is the fault associated domain. Hence, when a single independent fault associated domain appears, the bus in the associated domain is thought to be failed.</p><p>Clustering status characteristic values selected in this paper are the RMS <inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/75215x20.png" xlink:type="simple"/></inline-formula> in the first cycle and the RMS <inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/75215x20.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/75215x21.png" xlink:type="simple"/></inline-formula> in second cycle of the positive sequence fault component differential current at the node IED associated domain after the fault, that is, the status information vector for the i-th node IED is<inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/75215x20.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/75215x21.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/75215x22.png" xlink:type="simple"/></inline-formula>. If there are n substations (n nodes) in power grid, the wide-area information matrix A <inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/75215x20.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/75215x21.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/75215x22.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/75215x23.png" xlink:type="simple"/></inline-formula> could be</p><disp-formula id="scirp.75215-formula12"><graphic  xlink:href="http://html.scirp.org/file/75215x24.png"  xlink:type="simple"/></disp-formula><p>Row vectors of the matrix A correspond to node IED status information, that is clustering objects of K-means.</p></sec><sec id="s3_2"><title>3.2. The Fault Domain Identification of Power Grid Based on K-Means</title><p>The wide-area information matrix A of power grid is the input of K-means clustering for the clustering analysis of the associated domain of each grid node. Still the circuit in <xref ref-type="fig" rid="fig1">Figure 1</xref>, for example, the wide-area information matrix A is</p><disp-formula id="scirp.75215-formula13"><graphic  xlink:href="http://html.scirp.org/file/75215x25.png"  xlink:type="simple"/></disp-formula><p>where, nodes corresponded to fault domains are IED<sub>B</sub><sub>2</sub> and IED<sub>B</sub><sub>3</sub>, nodes corresponded to non-fault domains are IED<sub>B</sub><sub>1</sub>, IED<sub>B</sub><sub>4</sub> and IED<sub>B</sub><sub>5</sub>. Characteristic information of associated node IEDs in fault domains are all the whole fault current at fault points in domains with similar vector information. And all characteristic information of associated node IEDs in non-fault domains are merely unbalanced currents with small values and their vector information are similar. But vectors information are different vigorously between node IEDs of fault domain s and non-fault domain. Based on a large number of simulations, wide-area information samples acquired by node IEDs are divided into two groups: the IED class of fault domain associated nodes and the IED class of non-fault domain associated nodes.</p><p>In a large multi-station power system, the principle of minimum fault area is satisfied, based on which, the cluster with the least node IED number in clustering results is chosen as the associated node IED class of fault domains in this paper. In the class, the overlapped domain of associated fault domains of each node IED is thought as the fault domain. If there is no overlapped domain, bus failure at associated node is thought to happen in corresponding fault domain. The process of the fault identification based on K-means algorithm is shown in <xref ref-type="fig" rid="fig2">Figure 2</xref>.</p></sec></sec><sec id="s4"><title>4. Example Analysis</title><p>As shown in <xref ref-type="fig" rid="fig3">Figure 3</xref>, simulations with the fault identification method based on K-means are carried on IEEE-3 machine 9-node system. Several typical fault situations are analyzed and tested on this paper.</p><fig id="fig2"  position="float"><label><xref ref-type="fig" rid="fig2">Figure 2</xref></label><caption><title> Fault domain identification flow based on K-means</title></caption><graphic mimetype="image"   position="float"  xlink:type="simple"  xlink:href="http://html.scirp.org/file/75215x26.png"/></fig><fig id="fig3"  position="float"><label><xref ref-type="fig" rid="fig3">Figure 3</xref></label><caption><title> IEEE 3-machine 9-node system</title></caption><graphic mimetype="image"   position="float"  xlink:type="simple"  xlink:href="http://html.scirp.org/file/75215x27.png"/></fig><p>According to the definition above, the positive sequence fault component differential current of the node IED associated domain is referred as the sum of current phasors measured by boundary line IEDs in the associated domain. Calculations of positive sequence fault component differential currents for node IED associated domains of the IEEE-3 machine 9-node system are as shown in <xref ref-type="table" rid="table1">Table 1</xref>.</p><p>After calculating all positive sequence fault component differential currents of the node IED associated domains, the RMS value ∆I<sub>i</sub><sub>1</sub> in first circle and the RMS value ∆I<sub>i</sub><sub>2</sub> in second circle of differential currents after fault are selected as wide-area information vector for the i-th node IED<sub>Bi</sub>. Hence, the node IED wide-area information matrix A <inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/75215x28.png" xlink:type="simple"/></inline-formula> of IEEE-3 machine 9-node system is represented as</p><disp-formula id="scirp.75215-formula14"><graphic  xlink:href="http://html.scirp.org/file/75215x29.png"  xlink:type="simple"/></disp-formula><sec id="s4_1"><title>4.1. A Fault Occurs at Line L<sub>9</sub></title><p>Assume three-phase short circuit fault occurs at line L<sub>9</sub>, the wave of positive sequence fault component differential currents measured at part node IEDs is shown in <xref ref-type="fig" rid="fig4">Figure 4</xref>.</p><p>The RMS values ∆I<sub>i</sub><sub>1</sub> in first circle and the RMS values ∆I<sub>i</sub><sub>2</sub> in second circle of positive sequence fault component differential currents in the associated domain of each node IED are as shown in <xref ref-type="table" rid="table2">Table 2</xref>.</p><p>Therefore, the wide-area information matrix A <inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/75215x30.png" xlink:type="simple"/></inline-formula> of the IEEE-3 machine 9-node system is represented as</p><table-wrap id="table1" ><label><xref ref-type="table" rid="table1">Table 1</xref></label><caption><title> Calculations of positive sequence fault component differential currents</title></caption><table><tbody><thead><tr><th align="center" valign="middle" >Node IED</th><th align="center" valign="middle" >Calculations of differential currents in associated domains</th><th align="center" valign="middle" >Node IED</th><th align="center" valign="middle" >Calculations of differential currents in associated domains</th></tr></thead><tr><td align="center" valign="middle" >IED<sub>B</sub><sub>1</sub></td><td align="center" valign="middle" ><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/75215x31.png" xlink:type="simple"/></inline-formula></td><td align="center" valign="middle" >IED<sub>B6</sub></td><td align="center" valign="middle" ><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/75215x32.png" xlink:type="simple"/></inline-formula></td></tr><tr><td align="center" valign="middle" >IED<sub>B</sub><sub>2</sub></td><td align="center" valign="middle" ><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/75215x33.png" xlink:type="simple"/></inline-formula></td><td align="center" valign="middle" >IED<sub>B7</sub></td><td align="center" valign="middle" ><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/75215x34.png" xlink:type="simple"/></inline-formula></td></tr><tr><td align="center" valign="middle" >IED<sub>B</sub><sub>3</sub></td><td align="center" valign="middle" ><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/75215x35.png" xlink:type="simple"/></inline-formula></td><td align="center" valign="middle" >IED<sub>B8</sub></td><td align="center" valign="middle" ><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/75215x36.png" xlink:type="simple"/></inline-formula></td></tr><tr><td align="center" valign="middle" >IED<sub>B</sub><sub>4</sub></td><td align="center" valign="middle" ><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/75215x37.png" xlink:type="simple"/></inline-formula></td><td align="center" valign="middle" >IED<sub>B9</sub></td><td align="center" valign="middle" ><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/75215x38.png" xlink:type="simple"/></inline-formula></td></tr><tr><td align="center" valign="middle" >IED<sub>B</sub><sub>5</sub></td><td align="center" valign="middle" ><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/75215x39.png" xlink:type="simple"/></inline-formula></td><td align="center" valign="middle" ></td><td align="center" valign="middle" ></td></tr></tbody></table></table-wrap><table-wrap id="table2" ><label><xref ref-type="table" rid="table2">Table 2</xref></label><caption><title> The RMS values of positive sequence fault component differential currents at each node IED</title></caption><table><tbody><thead><tr><th align="center" valign="middle" >Node IED</th><th align="center" valign="middle" ><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/75215x40.png" xlink:type="simple"/></inline-formula></th><th align="center" valign="middle" ><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/75215x41.png" xlink:type="simple"/></inline-formula></th></tr></thead><tr><td align="center" valign="middle" >IED<sub>B</sub><sub>1</sub></td><td align="center" valign="middle" >0.003262</td><td align="center" valign="middle" >0.00434</td></tr><tr><td align="center" valign="middle" >IED<sub>B</sub><sub>2</sub></td><td align="center" valign="middle" >0.04379</td><td align="center" valign="middle" >0.049084</td></tr><tr><td align="center" valign="middle" >IED<sub>B</sub><sub>3</sub></td><td align="center" valign="middle" >0.039394</td><td align="center" valign="middle" >0.052657</td></tr><tr><td align="center" valign="middle" >IED<sub>B</sub><sub>4</sub></td><td align="center" valign="middle" >4.650301</td><td align="center" valign="middle" >5.788424</td></tr><tr><td align="center" valign="middle" >IED<sub>B</sub><sub>5</sub></td><td align="center" valign="middle" >0.019525</td><td align="center" valign="middle" >0.026133</td></tr><tr><td align="center" valign="middle" >IED<sub>B</sub><sub>6</sub></td><td align="center" valign="middle" >0.043009</td><td align="center" valign="middle" >0.056496</td></tr><tr><td align="center" valign="middle" >IED<sub>B</sub><sub>7</sub></td><td align="center" valign="middle" >4.70755</td><td align="center" valign="middle" >5.794702</td></tr><tr><td align="center" valign="middle" >IED<sub>B</sub><sub>8</sub></td><td align="center" valign="middle" >0.043522</td><td align="center" valign="middle" >0.05657</td></tr><tr><td align="center" valign="middle" >IED<sub>B</sub><sub>9</sub></td><td align="center" valign="middle" >0.015611</td><td align="center" valign="middle" >0.020266</td></tr></tbody></table></table-wrap><fig-group id="fig4"><label><xref ref-type="fig" rid="fig4">Figure 4</xref></label><caption><title> The wave of positive sequence fault component differential currents at some node IEDs. (a) The wave of positive sequence fault component differential currents at node IED<sub>B</sub><sub>1</sub>. (b) The wave of positive sequence fault component differential currents at node IED<sub>B</sub><sub>4</sub>.</title></caption><fig id ="fig4_1"><label>(b)</label><graphic mimetype="image"   position="float"  xlink:type="simple"  xlink:href="http://html.scirp.org/file/75215x42.png"/></fig><fig id ="fig4_2"><label></label><graphic mimetype="image"   position="float"  xlink:type="simple"  xlink:href="http://html.scirp.org/file/75215x43.png"/></fig></fig-group><disp-formula id="scirp.75215-formula15"><graphic  xlink:href="http://html.scirp.org/file/75215x44.png"  xlink:type="simple"/></disp-formula><p>Row vectors of the matrix are objects analyzed according to K-means clustering algorithm. The dimension of sample characteristic values is m =2, the number of data samples is n = 9, and the initial cluster number is h = 2. Select randomly the 1-th and 6-th rows as initial clustering centers, the class centroid coordinate matrix C of two classes is</p><disp-formula id="scirp.75215-formula16"><graphic  xlink:href="http://html.scirp.org/file/75215x45.png"  xlink:type="simple"/></disp-formula><p>The distance sum vector in classes is SUMD = [0.00039 0.0008]</p><p>The distance matrix D of each data to their class center is</p><disp-formula id="scirp.75215-formula17"><graphic  xlink:href="http://html.scirp.org/file/75215x46.png"  xlink:type="simple"/></disp-formula><p>The outline of K-means clustering is as shown in <xref ref-type="fig" rid="fig5">Figure 5</xref>.</p><p>Clustering results are as shown in <xref ref-type="table" rid="table3">Table 3</xref>.</p><fig-group id="fig5"><label><xref ref-type="fig" rid="fig5">Figure 5</xref></label><caption><title> The outline of K-means clustering.</title></caption><fig id ="fig5_1"><label></label><graphic mimetype="image"   position="float"  xlink:type="simple"  xlink:href="http://html.scirp.org/file/75215x47.png"/></fig></fig-group><table-wrap id="table3" ><label><xref ref-type="table" rid="table3">Table 3</xref></label><caption><title> K-means classification for L<sub>9</sub> fault</title></caption><table><tbody><thead><tr><th align="center" valign="middle" >Class 1</th><th align="center" valign="middle" >Class 2</th></tr></thead><tr><td align="center" valign="middle" >“IED<sub>B</sub><sub>7</sub>”</td><td align="center" valign="middle" >“IED<sub>B</sub><sub>6</sub>”</td></tr><tr><td align="center" valign="middle" >“IED<sub>B</sub><sub>4</sub>”</td><td align="center" valign="middle" >“IED<sub>B</sub><sub>3</sub>”</td></tr><tr><td align="center" valign="middle" ></td><td align="center" valign="middle" >“IED<sub>B</sub><sub>2</sub>”</td></tr><tr><td align="center" valign="middle" ></td><td align="center" valign="middle" >“IED<sub>B</sub><sub>9</sub>”</td></tr><tr><td align="center" valign="middle" ></td><td align="center" valign="middle" >“IED<sub>B</sub><sub>1</sub>”</td></tr><tr><td align="center" valign="middle" ></td><td align="center" valign="middle" >“IED<sub>B</sub><sub>5</sub>”</td></tr><tr><td align="center" valign="middle" ></td><td align="center" valign="middle" >“IED<sub>B</sub><sub>8</sub>”</td></tr></tbody></table></table-wrap><p>According clustering results, the wide-area information of 9 node IEDs are divided into two classes, in which the one with least nodes are identified as the node IED class of fault associated domains according to the algorithm proposed. As in <xref ref-type="table" rid="table3">Table 3</xref>, class 1 is the node IED class of fault associated domains. The overlapped domain of node IEDs associated domains is where faults occur. If there is no overlapped domain, a bus fault occurs in the domain. In the class 1, the associated domains of IED<sub>7</sub> and IED<sub>4</sub> are overlapped at line L<sub>9</sub>, then line L<sub>9</sub> is the domain where the fault happens.</p></sec><sec id="s4_2"><title>4.2. A Fault Occurs at Bus B2<sub> </sub></title><p>Assume AC two-phase to ground fault occurs at bus B<sub>2</sub>, the node IED wide-area information matrix A <inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/75215x48.png" xlink:type="simple"/></inline-formula> obtained accordingly is</p><disp-formula id="scirp.75215-formula18"><graphic  xlink:href="http://html.scirp.org/file/75215x49.png"  xlink:type="simple"/></disp-formula><p>Clustering results are as shown in <xref ref-type="table" rid="table4">Table 4</xref>. The class 1 with least associated IED number is the node class of the fault associated domain with only one node IED, that is one independent fault associated domain. According to the algorithm, no overlapped area exists, the fault occurs at the bus in the fault associated domain, that is at bus B<sub>2</sub>.</p></sec><sec id="s4_3"><title>4.3. Clustering Analysis under Other Fault Conditions</title><p>To test accuracy of the identification algorithm based on K-means, clustering analysis are carried on when faults occur under other fault conditions, results seen in <xref ref-type="table" rid="table5">Table 5</xref>. Experiments shown that the algorithm proposed in this paper can identify fault domains when power grid operates under different modes and with different topology structures.</p><table-wrap id="table4" ><label><xref ref-type="table" rid="table4">Table 4</xref></label><caption><title> K-means classification for bus B<sub>2</sub> fault</title></caption><table><tbody><thead><tr><th align="center" valign="middle" >Class 1</th><th align="center" valign="middle" >Class 2</th></tr></thead><tr><td align="center" valign="middle" >“IED<sub>B</sub><sub>2</sub>”</td><td align="center" valign="middle" >“IED<sub>B</sub><sub>6</sub>”</td></tr><tr><td align="center" valign="middle" ></td><td align="center" valign="middle" >“IED<sub>B</sub><sub>7</sub>”</td></tr><tr><td align="center" valign="middle" ></td><td align="center" valign="middle" >“IED<sub>B</sub><sub>3</sub>”</td></tr><tr><td align="center" valign="middle" ></td><td align="center" valign="middle" >“IED<sub>B</sub><sub>4</sub>”</td></tr><tr><td align="center" valign="middle" ></td><td align="center" valign="middle" >“IED<sub>B</sub><sub>9</sub>”</td></tr><tr><td align="center" valign="middle" ></td><td align="center" valign="middle" >“IED<sub>B</sub><sub>1</sub>”</td></tr><tr><td align="center" valign="middle" ></td><td align="center" valign="middle" >“IED<sub>B</sub><sub>5</sub>”</td></tr><tr><td align="center" valign="middle" ></td><td align="center" valign="middle" >“IED<sub>B</sub><sub>8</sub>”</td></tr></tbody></table></table-wrap><table-wrap id="table5" ><label><xref ref-type="table" rid="table5">Table 5</xref></label><caption><title> Simulation analysis of the fault domain identification based on K-means for different faults</title></caption><table><tbody><thead><tr><th align="center" valign="middle" >Real fault element</th><th align="center" valign="middle" >Class 1</th><th align="center" valign="middle" >Class 2</th><th align="center" valign="middle" >Identification results</th></tr></thead><tr><td align="center" valign="middle" >L<sub>4</sub></td><td align="center" valign="middle" >“IEDB<sub>4</sub>” “IEDB<sub>5</sub>”</td><td align="center" valign="middle" >“IEDB<sub>6</sub>” “IEDB<sub>3</sub>” “IEDB<sub>9</sub>” “IEDB<sub>1</sub>” “IEDB<sub>7</sub>” “IEDB<sub>8</sub>” “IEDB<sub>2</sub>”</td><td align="center" valign="middle" >Line L<sub>4</sub></td></tr><tr><td align="center" valign="middle" >L<sub>1</sub></td><td align="center" valign="middle" >“IEDB<sub>1</sub>” “IEDB<sub>2</sub>”</td><td align="center" valign="middle" >“IEDB<sub>4</sub>” “IEDB<sub>5</sub>” “IEDB<sub>9</sub>” “IEDB<sub>6</sub>” “IEDB<sub>7</sub>” “IEDB<sub>8</sub>” “IEDB<sub>3</sub>”</td><td align="center" valign="middle" >Line L<sub>1</sub></td></tr><tr><td align="center" valign="middle" >B<sub>4</sub></td><td align="center" valign="middle" >“IEDB<sub>4</sub>”</td><td align="center" valign="middle" >“IEDB<sub>6</sub>” “IEDB<sub>5</sub>” “IEDB<sub>8</sub>” “IEDB<sub>1</sub>” “IEDB<sub>3</sub>” “IEDB<sub>9</sub>” “IEDB<sub>2</sub>” “IEDB<sub>7</sub>”</td><td align="center" valign="middle" >Bus B<sub>4</sub></td></tr><tr><td align="center" valign="middle" >B<sub>8</sub></td><td align="center" valign="middle" >“IEDB<sub>8</sub>”</td><td align="center" valign="middle" >“IEDB<sub>9</sub>” “IEDB<sub>5</sub>” “IEDB<sub>6</sub>” “IEDB<sub>1</sub>” “IEDB<sub>3</sub>” “IEDB<sub>4</sub>” “IEDB<sub>2</sub>” “IEDB<sub>7</sub>”</td><td align="center" valign="middle" >Bus B<sub>8</sub></td></tr><tr><td align="center" valign="middle" >L<sub>3</sub>is not in operation, B<sub>7</sub> faults</td><td align="center" valign="middle" >“IEDB<sub>7</sub>”</td><td align="center" valign="middle" >“IEDB<sub>6</sub>” “IEDB<sub>5</sub>” “IEDB<sub>8</sub>” “IEDB<sub>1</sub>” “IEDB<sub>3</sub>” “IEDB<sub>4</sub>” “IEDB<sub>2</sub>” “IEDB<sub>9</sub>”</td><td align="center" valign="middle" >Bus B<sub>7</sub></td></tr><tr><td align="center" valign="middle" >G<sub>2</sub> is not in operation, L<sub>3</sub> faults</td><td align="center" valign="middle" >“IEDB<sub>3</sub>” “IEDB<sub>4</sub>”</td><td align="center" valign="middle" >“IEDB<sub>6</sub>” “IEDB<sub>5</sub>” “IEDB<sub>9</sub>” “IEDB<sub>1</sub>” “IEDB<sub>7</sub>” “IEDB<sub>8</sub>” “IEDB<sub>2</sub>”</td><td align="center" valign="middle" >Line L<sub>3</sub></td></tr></tbody></table></table-wrap></sec></sec><sec id="s5"><title>5. Conclusions</title><p>A new method for fault domain identification based on wide-area positive sequence fault component differential currents and K-means algorithm is proposed in this paper. Wide-area information of node IEDs are clustered by K-means according to the fault domain minimum principle to assure the class with least node IEDs to be the associated node class of fault associated domains. The fault identification can be realized by finding the overlapped area of fault associated domains of those node IEDs.</p><p>Simulation results show that fault domains can be identified correctly when the operational mode of power grid changes, such as one line or one source is not in operation. Fault domain identification based on wide-area status information and the intelligent algorithm are discussed in this paper, which provides a new way to diagnose faults in grid.</p></sec><sec id="s6"><title>Acknowledgements</title><p>The research work was financially supported by the artificial intelligence key laboratory of Sichuan province ( 2014RYY05，2015RYY01).</p></sec><sec id="s7"><title>Cite this paper</title><p>Wu, H. and Li, Q.Z. (2017) Fault Identification of Power Grid Based on Wide-Area Differential Cur- rent and K-Means Clustering. Energy and Power Engineering, 9, 19-29. https://doi.org/10.4236/epe.2017.94B003</p></sec></body><back><ref-list><title>References</title><ref id="scirp.75215-ref1"><label>1</label><mixed-citation publication-type="other" xlink:type="simple">He, Z.Q., Zhang, Z., Yin, X.G. and Cheng, W. (2010) Overview of Power System Wide Area Protection. Electric Power Automation Equipment, 30, 125-130. 
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