<?xml version="1.0" encoding="UTF-8"?><!DOCTYPE article  PUBLIC "-//NLM//DTD Journal Publishing DTD v3.0 20080202//EN" "http://dtd.nlm.nih.gov/publishing/3.0/journalpublishing3.dtd"><article xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" dtd-version="3.0" xml:lang="en" article-type="research article"><front><journal-meta><journal-id journal-id-type="publisher-id">WJET</journal-id><journal-title-group><journal-title>World Journal of Engineering and Technology</journal-title></journal-title-group><issn pub-type="epub">2331-4222</issn><publisher><publisher-name>Scientific Research Publishing</publisher-name></publisher></journal-meta><article-meta><article-id pub-id-type="doi">10.4236/wjet.2016.42019</article-id><article-id pub-id-type="publisher-id">WJET-66328</article-id><article-categories><subj-group subj-group-type="heading"><subject>Articles</subject></subj-group><subj-group subj-group-type="Discipline-v2"><subject>Chemistry&amp;Materials Science</subject><subject> Engineering</subject></subj-group></article-categories><title-group><article-title>
 
 
  Accelerated Testing of Devices on Durability and Fatigue Failure
 
</article-title></title-group><contrib-group><contrib contrib-type="author" xlink:type="simple"><name name-style="western"><surname>rchil</surname><given-names>Prangishvili</given-names></name><xref ref-type="aff" rid="aff1"><sup>1</sup></xref></contrib><contrib contrib-type="author" xlink:type="simple"><name name-style="western"><surname>Oleg</surname><given-names>Namicheishvili</given-names></name><xref ref-type="aff" rid="aff1"><sup>1</sup></xref></contrib></contrib-group><aff id="aff1"><addr-line>Department of Computer Engineering, Georgian Technical University, Tbilisi, Georgia</addr-line></aff><pub-date pub-type="epub"><day>29</day><month>04</month><year>2016</year></pub-date><volume>04</volume><issue>02</issue><fpage>200</fpage><lpage>205</lpage><history><date date-type="received"><day>8</day>	<month>March</month>	<year>2016</year></date><date date-type="rev-recd"><day>accepted</day>	<month>7</month>	<year>May</year>	</date><date date-type="accepted"><day>10</day>	<month>May</month>	<year>2016</year></date></history><permissions><copyright-statement>&#169; Copyright  2014 by authors and Scientific Research Publishing Inc. </copyright-statement><copyright-year>2014</copyright-year><license><license-p>This work is licensed under the Creative Commons Attribution International License (CC BY). http://creativecommons.org/licenses/by/4.0/</license-p></license></permissions><abstract><p>
 
 
  The problems of accelerated testing on durability are formulated and the basic definitions are given. The concept of so-called acceleration function is determined. In the case of linear model, integral function of distribution of time of failure-free operation of a device is determined on the basis of this concept. The criterions of linearity of acceleration function are formulated. The technique of accelerated testing is developed on the basis of correlation that conveys the generalized principle of Palmgren-Miner. This technique guarantees computation of reliability, when load increases permanently or stepwise.
 
</p></abstract><kwd-group><kwd>Resource of Reliability</kwd><kwd> Acceleration Function</kwd><kwd> Rule of Palmgren-Miner</kwd><kwd> Hypothesis of N.M.  Sediakin</kwd></kwd-group></article-meta></front><body><sec id="s1"><title>1. Introduction</title><p>The problem of forced testing on reliability, i.e. the problem of construction of probability models for forced testing is formulated as an interposition of a distribution function <inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x7.png" xlink:type="simple"/></inline-formula> of time of failure-free operation of a device under load X on a distribution function <inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x8.png" xlink:type="simple"/></inline-formula> of the same quantity in the conditions of forced load<inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x9.png" xlink:type="simple"/></inline-formula>. The principle of forcing is that for random value<inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x10.png" xlink:type="simple"/></inline-formula>, we have inequality <inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x11.png" xlink:type="simple"/></inline-formula> and functions <inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x12.png" xlink:type="simple"/></inline-formula> and <inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x13.png" xlink:type="simple"/></inline-formula> satisfy the following conditions:</p><p><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x14.png" xlink:type="simple"/></inline-formula>,</p><p><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x15.png" xlink:type="simple"/></inline-formula>.</p><p>In the particular case of forced testing, we are concerned in finding certain quantitative properties of the distribution <inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x16.png" xlink:type="simple"/></inline-formula> according to known properties of the distribution<inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x17.png" xlink:type="simple"/></inline-formula>.</p><p>The problem of forced testing is reduced to definition of so-called “acceleration function” <inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x18.png" xlink:type="simple"/></inline-formula>that represents the function of regression, i.e. correlation of quantiles (fractiles) <inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x19.png" xlink:type="simple"/></inline-formula>and t that correspond to equal probabilities <inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x20.png" xlink:type="simple"/></inline-formula> and <inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x21.png" xlink:type="simple"/></inline-formula> of failure-free operation in the face of nominal X and forced Y loads correspondingly. In general, this correlation is non-linear:</p><p><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x22.png" xlink:type="simple"/></inline-formula>.</p><p>The correlation of quantitative properties (moments) and the corresponding distributions <inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x23.png" xlink:type="simple"/></inline-formula> and <inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x23.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x24.png" xlink:type="simple"/></inline-formula> is easily determined from the following equations:</p><disp-formula id="scirp.66328-formula528"><graphic  xlink:href="http://html.scirp.org/file/8-1560292x25.png"  xlink:type="simple"/></disp-formula><p>where <inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x26.png" xlink:type="simple"/></inline-formula> and <inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x26.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x27.png" xlink:type="simple"/></inline-formula> are initial and central moments of order k of distributions <inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x26.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x27.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x28.png" xlink:type="simple"/></inline-formula> and<inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x26.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x27.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x28.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x29.png" xlink:type="simple"/></inline-formula>.</p><p>In the case of linear model, when<inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x30.png" xlink:type="simple"/></inline-formula>, the problem is reduced to determination of sole coefficient c that depends only on the rules of distribution of failure-free operation of device with loads X and Y.</p></sec><sec id="s2"><title>2. Linear Theory of Forced Testing</title><sec id="s2_1"><title>2.1. Physical Principle of Reliability</title><p>When acceleration function is linear, it is enough to offer a technique of deterministic, forced testing that gives estimation <inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x31.png" xlink:type="simple"/></inline-formula> of coefficient c, as well as lower <inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x31.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x32.png" xlink:type="simple"/></inline-formula> and upper <inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x31.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x32.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x33.png" xlink:type="simple"/></inline-formula> boundaries of a sphere, where lies the true value of magnitude c with confidence level<inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x31.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x32.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x33.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x34.png" xlink:type="simple"/></inline-formula>.</p><p>It is more important that on the basis of acceleration function g, mathematical notation of so-called physical principle of reliability [<xref ref-type="bibr" rid="scirp.66328-ref1">1</xref>] gets absolutely new form. This hypothesis belongs to N.M. Sediakin:</p><disp-formula id="scirp.66328-formula529"><label>(1)</label><graphic position="anchor" xlink:href="http://html.scirp.org/file/8-1560292x35.png"  xlink:type="simple"/></disp-formula><p>where <inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x36.png" xlink:type="simple"/></inline-formula> signifies the distribution function of time of failure-free operation of a device, when set of these devices are initially tested with nominal load X during certain interval <inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x36.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x37.png" xlink:type="simple"/></inline-formula> and then tested with forced load Y, when the same probability of failure is reached in lesser interval<inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x36.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x37.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x38.png" xlink:type="simple"/></inline-formula>. Correlations <inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x36.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x37.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x38.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x39.png" xlink:type="simple"/></inline-formula> and <inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x36.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x37.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x38.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x39.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x40.png" xlink:type="simple"/></inline-formula> are functions of distribution of time of failure-free operation of a device in modes X and Y correspondingly.</p><p>It is quite interesting to determine the criterions of linearity of acceleration function, because the problem of forced testing is essentially simplified for linear model. These criterions are formulated in the following form [<xref ref-type="bibr" rid="scirp.66328-ref2">2</xref>] .</p><p>Let us assume that one of the two sets are tested with load X during interval <inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x41.png" xlink:type="simple"/></inline-formula> and then―with load <inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x41.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x42.png" xlink:type="simple"/></inline-formula> during interval<inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x41.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x42.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x43.png" xlink:type="simple"/></inline-formula>. At the moment<inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x41.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x42.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x43.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x44.png" xlink:type="simple"/></inline-formula>, when testing is finished, probability of failure is<inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x41.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x42.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x43.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x44.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x45.png" xlink:type="simple"/></inline-formula>. The second set of the same devices are initially tested with load Y during interval <inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x41.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x42.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x43.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x44.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x45.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x46.png" xlink:type="simple"/></inline-formula> and then―with load X during interval<inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x41.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x42.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x43.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x44.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x45.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x46.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x47.png" xlink:type="simple"/></inline-formula>. At the moment<inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x41.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x42.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x43.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x44.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x45.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x46.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x47.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x48.png" xlink:type="simple"/></inline-formula>, when testing is finished, probability of failure is<inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x41.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x42.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x43.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x44.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x45.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x46.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x47.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x48.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x49.png" xlink:type="simple"/></inline-formula>. Let us also assume that hypothesis of N.M. Sediakin is correct, i.e. physical principle of reliability is in force. In this case acceleration function g is linear, if <inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x41.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x42.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x43.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x44.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x45.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x46.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x47.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x48.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x49.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x50.png" xlink:type="simple"/></inline-formula> and vice versa, i.e. if acceleration function is linear, then probabilities <inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x41.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x42.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x43.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x44.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x45.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x46.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x47.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x48.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x49.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x50.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x51.png" xlink:type="simple"/></inline-formula> and <inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x41.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x42.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x43.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x44.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x45.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x46.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x47.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x48.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x49.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x50.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x51.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x52.png" xlink:type="simple"/></inline-formula> are equal.</p></sec><sec id="s2_2"><title>2.2. Linear Summation of Failures</title><p>The physical principle of reliability in the form of (1) is essentially used for proving the above-mentioned theorem. Therefore, this theorem is realized only in those conditions, when hypothesis of N.M. Sediakin is correct.</p><p>We strictly prove [<xref ref-type="bibr" rid="scirp.66328-ref3">3</xref>] that when acceleration function is linear, physical principle of reliability is a sufficient condition for validity of so-called correlation of linear summation of failures which is also known as the rule of Palmgren-Miner:</p><p><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x53.png" xlink:type="simple"/></inline-formula>.</p><p><xref ref-type="fig" rid="fig1">Figure 1</xref> describes the meanings of magnitudes of this equation.</p><p>A.G. Palmgren [<xref ref-type="bibr" rid="scirp.66328-ref4">4</xref>] studied durability of bearings and offered above-mentioned equation in 1924 as a hypothesis. M.A. Minerused the same equation in 1945 in his studies [<xref ref-type="bibr" rid="scirp.66328-ref5">5</xref>] .</p><p>If we change the test a little bit and test the set of devices under load Y not during fixed time interval<inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x54.png" xlink:type="simple"/></inline-formula>, but until the moment of failure, then the last equation should be transformed. Particularly, <inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x54.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x55.png" xlink:type="simple"/></inline-formula>should be replaced with mathematical expectation <inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x54.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x55.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x56.png" xlink:type="simple"/></inline-formula> of time, when the sample is tested under load Y until the moment of failure, if before that it was under load X during interval<inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x54.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x55.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x56.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x57.png" xlink:type="simple"/></inline-formula>. Similarly, quantity <inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x54.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x55.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x56.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x57.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x58.png" xlink:type="simple"/></inline-formula> should be replaced with mathematical expectation <inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x54.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x55.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x56.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x57.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x58.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x59.png" xlink:type="simple"/></inline-formula> of time of failure-free operation of device in normal mode X. Finally, <inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x54.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x55.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x56.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x57.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x58.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x59.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x60.png" xlink:type="simple"/></inline-formula>should be replaced with mathematical expectation <inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x54.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x55.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x56.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x57.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x58.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x59.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x60.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x61.png" xlink:type="simple"/></inline-formula> of time of failure-free operation of device in forced mode Y. As a result, we get:</p><p><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x62.png" xlink:type="simple"/></inline-formula>.</p><p>This equation represents the basic correlation for definitive, forced testing with technique of so-called “destruction” [<xref ref-type="bibr" rid="scirp.66328-ref6">6</xref>] . It is proved [<xref ref-type="bibr" rid="scirp.66328-ref7">7</xref>] [<xref ref-type="bibr" rid="scirp.66328-ref8">8</xref>] that random magnitude <inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x63.png" xlink:type="simple"/></inline-formula> of resource of reliability</p><p><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x64.png" xlink:type="simple"/></inline-formula>,</p><p>That is spent by device in random time <inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x65.png" xlink:type="simple"/></inline-formula> of failure-free operation under any permanent load and intensity <inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x65.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x66.png" xlink:type="simple"/></inline-formula> of failure, has exponential distribution and its mathematical expectation equals to 1, i.e.</p><disp-formula id="scirp.66328-formula530"><label>. (2)</label><graphic position="anchor" xlink:href="http://html.scirp.org/file/8-1560292x67.png"  xlink:type="simple"/></disp-formula><p>This statement is true at any rule of distribution of random magnitude <inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x68.png" xlink:type="simple"/></inline-formula> of time of failure-free operation of device.</p><p>In the model of stepwise load that is shown in <xref ref-type="fig" rid="fig2">Figure 2</xref>, it is implied that load H is measured in discrete steps after time intervals <inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x69.png" xlink:type="simple"/></inline-formula> and gets value<inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x69.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x70.png" xlink:type="simple"/></inline-formula>. Index n is assigned to load, when there is failure. It is easy to see that</p><p><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x71.png" xlink:type="simple"/></inline-formula>,</p><p>where index n, as well as<inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x72.png" xlink:type="simple"/></inline-formula>, have random values.</p><p>Average time of failure-free operation of device in normal conditions (under nominal load) is denoted with symbol<inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x73.png" xlink:type="simple"/></inline-formula>. Symbol <inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x73.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x74.png" xlink:type="simple"/></inline-formula> is used for average time of failure-free operation in mode <inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x73.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x74.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x75.png" xlink:type="simple"/></inline-formula> under stepwise load and symbol <inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x73.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x74.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x75.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x76.png" xlink:type="simple"/></inline-formula> is used for the same value under permanent load <inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x73.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x74.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x75.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x76.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x77.png" xlink:type="simple"/></inline-formula> in time x.</p><p>If we assume that in every described mode, time of failure-free operation of element has exponential distribution, then the following equations are true:</p><disp-formula id="scirp.66328-formula531"><label>. (3)</label><graphic position="anchor" xlink:href="http://html.scirp.org/file/8-1560292x78.png"  xlink:type="simple"/></disp-formula><p>If we use property of additivity of resource of reliability and Equation (2) for the described two examples, then:</p><fig id="fig1"  position="float"><label><xref ref-type="fig" rid="fig1">Figure 1</xref></label><caption><title> Graphical interpretation of palmgren-miner hypothesis</title></caption><graphic mimetype="image"   position="float"  xlink:type="simple"  xlink:href="http://html.scirp.org/file/8-1560292x79.png"/></fig><fig id="fig2"  position="float"><label><xref ref-type="fig" rid="fig2">Figure 2</xref></label><caption><title> Model of stepwise load</title></caption><graphic mimetype="image"   position="float"  xlink:type="simple"  xlink:href="http://html.scirp.org/file/8-1560292x80.png"/></fig><disp-formula id="scirp.66328-formula532"><graphic  xlink:href="http://html.scirp.org/file/8-1560292x81.png"  xlink:type="simple"/></disp-formula><p>These equations represent mathematical notations of correlation of linear summation of failures in discrete and permanent modes.</p></sec><sec id="s2_3"><title>2.3. Models of Reliability for Certain Types of Load</title><p>We can describe considerable amount of reliability models for stepwise and permanent load, if we use mathematical notations of correlations of linear summation of failures that are based on the property of reliability resource.</p><p>For example, the following model is known:</p><disp-formula id="scirp.66328-formula533"><label>, (4)</label><graphic position="anchor" xlink:href="http://html.scirp.org/file/8-1560292x82.png"  xlink:type="simple"/></disp-formula><p>where m is a certain constant. Many researchers have got the same result. For example, for ball bearings <inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x83.png" xlink:type="simple"/></inline-formula> [<xref ref-type="bibr" rid="scirp.66328-ref9">9</xref>] , for paper capacitors <inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x83.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x84.png" xlink:type="simple"/></inline-formula> [<xref ref-type="bibr" rid="scirp.66328-ref10">10</xref>] [<xref ref-type="bibr" rid="scirp.66328-ref11">11</xref>] , for filaments <inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x83.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x84.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x85.png" xlink:type="simple"/></inline-formula> [<xref ref-type="bibr" rid="scirp.66328-ref12">12</xref>] .</p><p>For stepwise load, this model gives:</p><p><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x86.png" xlink:type="simple"/></inline-formula>.</p><p>If load is permanent and load H varies in time x with constant “rate” v on the basis of linear rule<inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x87.png" xlink:type="simple"/></inline-formula>, where <inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x87.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x88.png" xlink:type="simple"/></inline-formula> is initial value of load, then for average time <inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x87.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x88.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x89.png" xlink:type="simple"/></inline-formula> of failure-free operation, we get:</p><p><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x90.png" xlink:type="simple"/></inline-formula>.</p><p>According to the work [<xref ref-type="bibr" rid="scirp.66328-ref13">13</xref>] , the following model satisfactorily describes the durability of many soft metals:</p><p><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x91.png" xlink:type="simple"/></inline-formula>,</p><p>where E and m are certain constants.</p><p>For stepwise model and above-mentioned model, we get:</p><p><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x92.png" xlink:type="simple"/></inline-formula>.</p><p>When load increases permanently with constant “rate” ν and failure is observed at the random moment<inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x93.png" xlink:type="simple"/></inline-formula>, for the average value (mathematical expectation) we get:</p><p><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x94.png" xlink:type="simple"/></inline-formula>.</p><p>It is easy to see that the Equation (4) with assumption (3) and linear increasing load with initial value<inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x95.png" xlink:type="simple"/></inline-formula>, takes the following form:</p><p><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x96.png" xlink:type="simple"/></inline-formula>,</p><p>Hence</p><p><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x97.png" xlink:type="simple"/></inline-formula>.</p><p>On the basis of previous equation we conclude that in the case of described conditions, random value <inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x98.png" xlink:type="simple"/></inline-formula> of time of failure-free operation of device is distributed according to Weibul’s law:</p><p><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x99.png" xlink:type="simple"/></inline-formula>.</p><p>The specifications of form and scale of this law is described with the following equations correspondingly: <inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x100.png" xlink:type="simple"/></inline-formula>and<inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x100.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x101.png" xlink:type="simple"/></inline-formula>.</p><p>These conclusions are based on a fact that if random value of time of failure-free operation of certain device is distributed according to Weibul’s law, then intensity of failure of this device is described with the equation<inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x102.png" xlink:type="simple"/></inline-formula>.</p><p>The result is important, because value m can be determined with the same statistical data that is given from the experiment with permanent load of the basic set of devices. It is sufficient to create the function of distribution of random value <inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x103.png" xlink:type="simple"/></inline-formula> upon its N realizations<inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x103.png" xlink:type="simple"/></inline-formula><inline-formula><inline-graphic xlink:href="http://html.scirp.org/file/8-1560292x104.png" xlink:type="simple"/></inline-formula>.</p></sec></sec><sec id="s3"><title>3. Conclusions</title><p>The problems of accelerated testing on durability are formulated newly, the basic definitions are given and the concept of so-called acceleration function is introduced. In the case of linear model, integral function of distribution of time of failure-free operation of a device is determined on the basis of this concept. The criterions of linearity of acceleration function are formulated and the techniques of accelerated testing are developed on the basis of correlation that generalizes the principle of Palmgren-Miner. This technique guarantees computation of reliability, when load increases permanently or stepwise.</p><p>Described method is easily generalized to the case of chemical engineering kinetics and chemical rate phenomenon.</p></sec><sec id="s4"><title>Acknowledgements</title><p>We would like to express our very great appreciation to Dr. David Gorgidze for his valuable and constructive suggestions during the planning and development of this research work. His willingness to give his time so generously has been very much appreciated.</p><p>We would also like to thank the staff of the Strength of materials Laboratory at the Georgian Technical University for enabling us to visit their offices to observe their daily operations.</p></sec><sec id="s5"><title>Cite this paper</title><p>Archil Prangishvili,Oleg Namicheishvili, (2016) Accelerated Testing of Devices on Durability and Fatigue Failure. World Journal of Engineering and Technology,04,200-205. doi: 10.4236/wjet.2016.42019</p></sec><sec id="s6"><title>NOTES</title></sec></body><back><ref-list><title>References</title><ref id="scirp.66328-ref1"><label>1</label><mixed-citation publication-type="other" xlink:type="simple">Sediakin, N.M. (1966) About the One Physical Principle of Theory of Reliability. 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