<?xml version="1.0" encoding="UTF-8"?><!DOCTYPE article  PUBLIC "-//NLM//DTD Journal Publishing DTD v3.0 20080202//EN" "http://dtd.nlm.nih.gov/publishing/3.0/journalpublishing3.dtd"><article xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" dtd-version="3.0" xml:lang="en" article-type="research article"><front><journal-meta><journal-id journal-id-type="publisher-id">JSEMAT</journal-id><journal-title-group><journal-title>Journal of Surface Engineered Materials and Advanced Technology</journal-title></journal-title-group><issn pub-type="epub">2161-4881</issn><publisher><publisher-name>Scientific Research Publishing</publisher-name></publisher></journal-meta><article-meta><article-id pub-id-type="doi">10.4236/jsemat.2014.42008</article-id><article-id pub-id-type="publisher-id">JSEMAT-44876</article-id><article-categories><subj-group subj-group-type="heading"><subject>Articles</subject></subj-group><subj-group subj-group-type="Discipline-v2"><subject>Chemistry&amp;Materials Science</subject><subject> Engineering</subject></subj-group></article-categories><title-group><article-title>
 
 
  &lt;i&gt;In Situ&lt;/i&gt; ATR-FTIR Observation about Surfactant/Hydrogen-TerminatedSi(111) Interface in Solution
 
</article-title></title-group><contrib-group><contrib contrib-type="author" xlink:type="simple"><name name-style="western"><surname>oshihito</surname><given-names>Ohtake</given-names></name><xref ref-type="aff" rid="aff1"><sub>1</sub></xref><xref ref-type="corresp" rid="cor1"><sup>*</sup></xref></contrib></contrib-group><aff id="aff1"><label>1</label><addr-line>Department of Mechanical Systems Engineering, Faculty of Engineering, Aichi University of Technology, 
Aichi, Japan</addr-line></aff><author-notes><corresp id="cor1">* E-mail:<email>ohtake@aut.ac.jp</email></corresp></author-notes><pub-date pub-type="epub"><day>16</day><month>04</month><year>2014</year></pub-date><volume>04</volume><issue>02</issue><fpage>47</fpage><lpage>52</lpage><history><date date-type="received"><day>1</day>	<month>March</month>	<year>2014</year></date><date date-type="rev-recd"><day>30</day>	<month>March</month>	<year>2014</year>	</date><date date-type="accepted"><day>10</day>	<month>April</month>	<year>2014</year></date></history><permissions><copyright-statement>&#169; Copyright  2014 by authors and Scientific Research Publishing Inc. </copyright-statement><copyright-year>2014</copyright-year><license><license-p>This work is licensed under the Creative Commons Attribution International License (CC BY). http://creativecommons.org/licenses/by/4.0/</license-p></license></permissions><abstract><p>
 
 
   Development of novel functional devices has been expected by modification for Si surface. This study investigated immobilization and roles of the Si surface with flowing surfactant by in situ ATR-FTIR method. This result suggested that the surfactant prevented oxidation of the hydrogen-terminated Si surface from the higher concentration in aqueous solution. These would guard the Si surface against H<sub>2</sub>O molecules. 
 
</p></abstract><kwd-group><kwd>ATR-FTIR</kwd><kwd> Si</kwd><kwd> Hydrogen Termination</kwd><kwd> Surfactant</kwd></kwd-group></article-meta></front><body><sec id="s1"><title>1. Introduction</title><p>Recently, functional surfaces have been noticed on metal, semiconductor or other materials for general devices [<xref ref-type="bibr" rid="scirp.44876-ref1">1</xref>] [<xref ref-type="bibr" rid="scirp.44876-ref2">2</xref>] . Especially, Si semiconductor surface immobilized various molecules controllably is expected as a functional substrate and electrode for noble devices. Otherwise, a functional biological membrane consists of phosphatide, which has various properties by a part of hydrophobic and hydrophilic [<xref ref-type="bibr" rid="scirp.44876-ref3">3</xref>] - [<xref ref-type="bibr" rid="scirp.44876-ref6">6</xref>] . By its mimetic structure, this study has tried to immobilize surfactant molecules on a single crystal Si to inhibit the surface oxidation in solution toward applying electrochemical electrode. The Si surface is modified to atomically flat and hydrogen termination with etching by HF and NH<sub>4</sub>F solution [<xref ref-type="bibr" rid="scirp.44876-ref7">7</xref>] -[<xref ref-type="bibr" rid="scirp.44876-ref9">9</xref>] . Self-assembled monolayer (SAM) formation is expected on Si surface by the use of the surfactant molecules, which is a part of hydrophobia, and will be assembled on the hydrogen terminated Si surface. Hence, the SAM formation processes and inhibition of oxidation on Si surface were observed by in-situ ATR-FTIR in aqueous solution.</p></sec><sec id="s2"><title>2. Experimental</title><p>Silicon wafers used Si(111) with mirror polishing both faces at 0.5 mm thickness, which was also applied as an ATR prism by cutting its both ends at 45 degrees. The Si(111) substrate was washed with RCA clean by boiling up solution of conc. H<sub>2</sub>SO<sub>4</sub> and 30% H<sub>2</sub>O<sub>2</sub> mixed solution immersing at 10 min, and 5% HF, NH<sub>4</sub>OH and H<sub>2</sub>O<sub>2</sub> mixed 80˚C solution at 10 min, and washed pure water. Finally, the substrate was immersed in boiling up with solution of conc. H<sub>2</sub>SO<sub>4</sub> and 30% H<sub>2</sub>O<sub>2</sub> solution at 10 min to form SiO<sub>2</sub> thin film on the silicon wafers.</p><p>In situ ATR-FTIR was measured by IR incidence at 45 degrees to Si ATR prism with flowing pure water in <xref ref-type="fig" rid="fig1">Figure 1</xref>(a), and the Si surface is modified to atomically flat and hydrogen termination by flowing 5% HF for 10 min and 40% NH<sub>4</sub>F for 7 min. In situ measurement was carried out with flowing pure water or surfactant to a cell in <xref ref-type="fig" rid="fig1">Figure 1</xref>(b). The measurement was from 4000 cm<sup>−1</sup> to 1500 cm<sup>−1</sup> and cumulative number of fifty.</p></sec><sec id="s3"><title>3. Results and Discussion</title><p>First, hydrogen terminated Si(111) surface was observed by ex situ ATR-FTIR in <xref ref-type="fig" rid="fig2">Figure 2</xref>(a). A sharp spectrum was at 2083 cm<sup>−1</sup> assigned to Si-H stretching vibration on the terrace surface, otherwise a broad spectrum of half-width 30 cm<sup>−1</sup> was observed in situ in <xref ref-type="fig" rid="fig2">Figure 2</xref>(b). The broadness would cause the wide vibration energy by H<sub>2</sub>O adsorption on the Si surface in flowing pure water [<xref ref-type="bibr" rid="scirp.44876-ref10">10</xref>] -[<xref ref-type="bibr" rid="scirp.44876-ref12">12</xref>] . Di-2-ethylhexyl sulfosuccinate sodium salt (aerosol OT) as surfactant is C<sub>8</sub>H<sub>17</sub>COOCH<sub>2</sub>CH(COOC<sub>8</sub>H<sub>17</sub>)SO<sub>3</sub>Na, which the spectrum is assigned to 3467 cm<sup>−1</sup> (O-H stretching vibration), 2957 cm<sup>−1</sup> (CH<sub>3</sub> asymmetry), 2926 cm<sup>−1</sup> (CH<sub>2</sub> asymmetry), 2858 cm<sup>−1</sup> (CH<sub>2</sub> symmetry), 1735 cm<sup>−1</sup> (C=O stretching vibration), 1459 cm<sup>−1</sup> (CH<sub>2</sub> bending vibration), 1212 cm<sup>−1</sup> (C-C(=O)-O stretching vibration) in <xref ref-type="fig" rid="fig3">Figure 3</xref>.</p><fig-group id="fig1"><label><xref ref-type="fig" rid="fig1">Figure 1</xref></label><caption><title> In situ ATR-FTIR cell system at about (a) a cross section of the cell; (b) a general view of them.</title></caption><fig id ="fig1_1"><label> (b)</label><graphic mimetype="image"   position="float"  xlink:type="simple"  xlink:href="http://html.scirp.org/file/1-1180223x5.png"/></fig><fig id ="fig1_2"><label></label><graphic mimetype="image"   position="float"  xlink:type="simple"  xlink:href="http://html.scirp.org/file/1-1180223x6.png"/></fig></fig-group><fig-group id="fig2"><label><xref ref-type="fig" rid="fig2">Figure 2</xref></label><caption><title> ATR-FTIR spectra of hydrogen-terminated Si(111) surface of (a) ex situ; (b) in situ in aqueous solution.</title></caption><fig id ="fig2_1"><label> (b)</label><graphic mimetype="image"   position="float"  xlink:type="simple"  xlink:href="http://html.scirp.org/file/1-1180223x7.png"/></fig><fig id ="fig2_2"><label></label><graphic mimetype="image"   position="float"  xlink:type="simple"  xlink:href="http://html.scirp.org/file/1-1180223x8.png"/></fig></fig-group><p>Spectra of Si-CH<sub>x</sub> on the Si surface was obtained at the aerosol OT concentration of 1 &#215; 10<sup>−4</sup> M, 1 &#215; 10<sup>−3</sup> M, 1 &#215; 10<sup>−2</sup> M in situ in <xref ref-type="fig" rid="fig4">Figure 4</xref>. The spectra showed CH<sub>x</sub> stretching vibration, and the peak intensity was increased with the flowing time. These results would indicate that the aerosol OT adsorbed on the Si surface by interaction between hydrophobic hydrogen-terminated Si surface and alkyl base of the aerosol OT. Furthermore, the methyl base at the extremity of the aerosol OT would selectively adsorbed on the Si surface by indicating the intense peaks based on the CH<sub>3</sub> relatively compared with the CH<sub>2</sub> peaks, nevertheless, the methyl base is less than the methylene base. <xref ref-type="fig" rid="fig5">Figure 5</xref> showed peak area of CH<sub>x</sub> in situ in the flowing aerosol OT, which saturation time of</p><fig id="fig3"  position="float"><label><xref ref-type="fig" rid="fig3">Figure 3</xref></label><caption><title> Absorption spectra of the aerosol OT about CH<sub>x</sub> peaks</title></caption><graphic mimetype="image"   position="float"  xlink:type="simple"  xlink:href="http://html.scirp.org/file/1-1180223x9.png"/></fig><fig-group id="fig4"><label><xref ref-type="fig" rid="fig4">Figure 4</xref></label><caption><title> In situ ATR-FTIR spectra of the Si surface under the flowing aerosol OT at the concentration of (a) 1 &#215; 10<sup>−4</sup> M; (b) 1 &#215; 10<sup>−3</sup> M and (c) 1 &#215; 10<sup>−2</sup> M.</title></caption><fig id ="fig4_1"><label> (b)</label><graphic mimetype="image"   position="float"  xlink:type="simple"  xlink:href="http://html.scirp.org/file/1-1180223x10.png"/></fig><fig id ="fig4_2"><label>(c)</label><graphic mimetype="image"   position="float"  xlink:type="simple"  xlink:href="http://html.scirp.org/file/1-1180223x11.png"/></fig><fig id ="fig4_3"><label></label><graphic mimetype="image"   position="float"  xlink:type="simple"  xlink:href="http://html.scirp.org/file/1-1180223x12.png"/></fig></fig-group><p>the peak area was shorter with higher concentration to be adsorbed on Si surface by diffusion rapidly.</p><p>In the same way, spectrum of Si-H was obtained in the flowing pure water in <xref ref-type="fig" rid="fig6">Figure 6</xref>(a), which indicated decrease with the flowing time. This result would show oxidation on the Si surface. On the other hand, the spectrum under the flowing aerosol OT obtained the gradual decrease in <xref ref-type="fig" rid="fig6">Figure 6</xref>(b). The tendency indicated dependence on the aerosol OT concentration remarkably, which was indicated by plotting normalized peak areas to flowing time in <xref ref-type="fig" rid="fig6">Figure 6</xref>(c). These results will suggest that the aerosol OT prevented the oxidation on the Si surface by guarding against from H<sub>2</sub>O molecules.</p><p><xref ref-type="fig" rid="fig7">Figure 7</xref> shows AFM images on the Si(111) surface after measuring in situ ATR-AFM with flowing (a): 1 &#215; 10<sup>−4</sup> M and (b): 1 &#215; 10<sup>−2</sup> M aerosol OT for 90 min. The surface was rough in the concentration of 1 &#215; 10<sup>−4</sup> M, and was smooth in that of 1 &#215; 10<sup>−2</sup> M. These results will indicate difference of amounts of adsorption, and will adsorp densely and orientationally in the case of flowing the 1 &#215; 10<sup>−2</sup> M aerosol OT. Hence, the hydrogen-terminated Si(111) surface would prevented the oxidation from attacking the H<sub>2</sub>O molecules by adsorption the aerosol OT, which will be efficient with the higher concentration to larger coverage as shown in <xref ref-type="fig" rid="fig8">Figure 8</xref>.</p><fig id="fig5"  position="float"><label><xref ref-type="fig" rid="fig5">Figure 5</xref></label><caption><title> Time course of the CH<sub>x</sub> peaks area in <xref ref-type="fig" rid="fig4">Figure 4</xref></title></caption><graphic mimetype="image"   position="float"  xlink:type="simple"  xlink:href="http://html.scirp.org/file/1-1180223x13.png"/></fig><fig-group id="fig6"><label><xref ref-type="fig" rid="fig6">Figure 6</xref></label><caption><title> In situ ATR-FTIR spectra of the Si-H peaks on the hydrogen-terminated Si(111) under the flowing (a) aqueous solution and (b) aerosol OT. Time course of normalized peak area is in (c) at the concentration of ◆; 1 &#215; 10<sup>−2</sup> M, ■; 1 &#215; 10<sup>−3</sup> M, ▲; 1 &#215; 10<sup>−4</sup> M and ●; 0 M.</title></caption><fig id ="fig6_1"><label> (b)</label><graphic mimetype="image"   position="float"  xlink:type="simple"  xlink:href="http://html.scirp.org/file/1-1180223x14.png"/></fig><fig id ="fig6_2"><label>(c)</label><graphic mimetype="image"   position="float"  xlink:type="simple"  xlink:href="http://html.scirp.org/file/1-1180223x15.png"/></fig><fig id ="fig6_3"><label></label><graphic mimetype="image"   position="float"  xlink:type="simple"  xlink:href="http://html.scirp.org/file/1-1180223x16.png"/></fig></fig-group><fig id="fig7"  position="float"><label><xref ref-type="fig" rid="fig7">Figure 7</xref></label><caption><title> AFM images after the measuring samples in the aerosol OT at the concentration of (a) 1 &#215; 10<sup>−4</sup> M and (b) 1 &#215; 10<sup>−2</sup> M</title></caption><graphic mimetype="image"   position="float"  xlink:type="simple"  xlink:href="http://html.scirp.org/file/1-1180223x17.png"/></fig><fig-group id="fig8"><label><xref ref-type="fig" rid="fig8">Figure 8</xref></label><caption><title> Mechanism of preventing the oxidation by interaction between surfactant and H<sub>2</sub>O molecules on the hydrogen-terminated Si(111) surface at (a) 1 &#215; 10<sup>−2</sup> M and (b) 1 &#215; 10<sup>−4</sup> M.</title></caption><fig id ="fig8_1"><label>(b)</label><graphic mimetype="image"   position="float"  xlink:type="simple"  xlink:href="http://html.scirp.org/file/1-1180223x18.png"/></fig><fig id ="fig8_2"><label></label><graphic mimetype="image"   position="float"  xlink:type="simple"  xlink:href="http://html.scirp.org/file/1-1180223x19.png"/></fig></fig-group></sec><sec id="s4"><title>4. Conclusion</title><p>This study was investigated about surfactant/hydrogen-terminated Si(111) interface with in situ. Area of Si-H peak by in situ ATR-FTIR measurement does not have much change with the higher aerosol OT concentration. This result will suggest that the aerosol OT guard the oxidation against H<sub>2</sub>O molecules by adsorption to the Si surface, and AFM images will support them.</p></sec></body><back><ref-list><title>References</title><ref id="scirp.44876-ref1"><label>1</label><mixed-citation publication-type="other" xlink:type="simple">Aoki, H., Hasegawa, K., Tohda, K. and Umezawa, Y. (2003) Voltammetric Detection of Inorganic Phosphate Using Ion-Channel Sensing with Self-Assembled Monolayers of a Hydrogen Bond-Forming Receptor. Biosensors and Bioelectronics, 18, 261-267. http://dx.doi.org/10.1016/S0956-5663(02)00177-X</mixed-citation></ref><ref id="scirp.44876-ref2"><label>2</label><mixed-citation publication-type="other" xlink:type="simple">Xiao, K.P., Bühlmann, P. and Umezawa, Y. (1999) Ion-Channel-Mimetic Sensing of Hydrophilic Anions Based on Monolayers of a Hydrogen Bond-Forming Receptor. Analytical Chemistry, 71, 1183-1187.http://dx.doi.org/10.1021/ac9809635</mixed-citation></ref><ref id="scirp.44876-ref3"><label>3</label><mixed-citation publication-type="other" xlink:type="simple">Tang, Z., Jing, W. and Wang, E. (2000) Self-Assembled Monolayer Growth of Phospholipids on Hydrophobic Surface toward Mimetic Biomembranes: Scanning Probe Microscopy Study. Langmuir, 16, 1696-1702.http://dx.doi.org/10.1021/la981491s</mixed-citation></ref><ref id="scirp.44876-ref4"><label>4</label><mixed-citation publication-type="other" xlink:type="simple">Yang, Z. and Yu, H. (1999) Biomembrane Mimetic Surfaces by Phospholipid Self-Assembled Monolayers on Silica Substrates. Langmuir, 15, 1731-1737. http://dx.doi.org/10.1021/la980839g</mixed-citation></ref><ref id="scirp.44876-ref5"><label>5</label><mixed-citation publication-type="other" xlink:type="simple">Rossi, S., Karlsson, G., Ristori, S., Martini, G. and Edwards, K. (2001) Aggregate Structures in a Dilute Aqueous Dispersion of a Fluorinated/Hydrogenated Surfactant System. A Cryo-Transmission Electron Microscopy Study. Langmuir, 17, 2340-2345. http://dx.doi.org/10.1021/la001444b</mixed-citation></ref><ref id="scirp.44876-ref6"><label>6</label><mixed-citation publication-type="other" xlink:type="simple">Yang, W.Y. and Youn-Sik, L. (2002) Surface Modification of Porous Vesicles via Hydrolysis. Langmuir, 18, 6071-6074. http://dx.doi.org/10.1021/la0203077</mixed-citation></ref><ref id="scirp.44876-ref7"><label>7</label><mixed-citation publication-type="other" xlink:type="simple">Dumas, P., Chabal, Y.J. and Jakob, P. (1992) Morphology of Hydrogen-Terminated Si(111) and Si(100) Surfaces upon Etching in HF and Buffered-HF Solutions. Surface Science, 269-270, 867-878. http://dx.doi.org/10.1016/0039-6028(92)91363-G</mixed-citation></ref><ref id="scirp.44876-ref8"><label>8</label><mixed-citation publication-type="other" xlink:type="simple">Jakob, P. and Chabal, Y.J. (1991) Chemical Etching of Vicinal Si(111): Dependence of the Surface Structure and the Hydrogen Termination on the pH of the Etching Solutions. The Journal of Chemical Physics, 95, 2897-2909. http://dx.doi.org/10.1063/1.460892</mixed-citation></ref><ref id="scirp.44876-ref9"><label>9</label><mixed-citation publication-type="other" xlink:type="simple">Jakob, P., Chabal, Y.J., Raghavachari, K., Becker, R.S. and Becker, A.J. (1992) Kinetic Model of the Chemical Etching of Si(111) Surfaces by Buffered HF Solutions. Surface Science, 275, 407-413. http://dx.doi.org/10.1016/0039-6028(92)90813-L</mixed-citation></ref><ref id="scirp.44876-ref10"><label>10</label><mixed-citation publication-type="other" xlink:type="simple">Kimura, Y., Kondo, Y. and Niwano, M. (2001) Initial Stages of Porous Si Formation on Si Surfaces Investigated by Infrared Spectroscopy. Applied Surface Science, 175-176, 157-162. http://dx.doi.org/10.1016/S0169-4332(01)00029-0</mixed-citation></ref><ref id="scirp.44876-ref11"><label>11</label><mixed-citation publication-type="other" xlink:type="simple">Niwano, M., Miura, T., Tajima, R. and Miyamono, N. (1996) Infrared Study of Chemistry of Si Surfaces in Etching Solution. Applied Surface Science, 100-101, 607-611. http://dx.doi.org/10.1016/0169-4332(96)00348-0</mixed-citation></ref><ref id="scirp.44876-ref12"><label>12</label><mixed-citation publication-type="other" xlink:type="simple">Niwano, M., Kondo, Y. and Kimira Y. (2000) In Situ Infrared Observation of Etching and Oxidation Processes on Si Surfaces in NH4F Solution. Journal of the Electrochemical Society, 147, 1555-1559. http://dx.doi.org/10.1149/1.1393393</mixed-citation></ref></ref-list></back></article>