<?xml version="1.0" encoding="UTF-8"?><!DOCTYPE article  PUBLIC "-//NLM//DTD Journal Publishing DTD v3.0 20080202//EN" "http://dtd.nlm.nih.gov/publishing/3.0/journalpublishing3.dtd"><article xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" dtd-version="3.0" xml:lang="en" article-type="research article"><front><journal-meta><journal-id journal-id-type="publisher-id">Graphene</journal-id><journal-title-group><journal-title>Graphene</journal-title></journal-title-group><issn pub-type="epub">2169-3439</issn><publisher><publisher-name>Scientific Research Publishing</publisher-name></publisher></journal-meta><article-meta><article-id pub-id-type="doi">10.4236/graphene.2014.31001</article-id><article-id pub-id-type="publisher-id">Graphene-42074</article-id><article-categories><subj-group subj-group-type="heading"><subject>Articles</subject></subj-group><subj-group subj-group-type="Discipline-v2"><subject>Chemistry&amp;Materials Science</subject></subj-group></article-categories><title-group><article-title>
 
 
  Optimization of Micromechanical Cleavage Technique of Natural Graphite by Chemical Treatment
 
</article-title></title-group><contrib-group><contrib contrib-type="author" xlink:type="simple"><name name-style="western"><surname>uis</surname><given-names>Torres</given-names></name><xref ref-type="aff" rid="aff1"><sup>1</sup></xref><xref ref-type="corresp" rid="cor1"><sup>*</sup></xref></contrib><contrib contrib-type="author" xlink:type="simple"><name name-style="western"><surname>Luis</surname><given-names>Gomez Armas</given-names></name><xref ref-type="aff" rid="aff2"><sup>2</sup></xref></contrib><contrib contrib-type="author" xlink:type="simple"><name name-style="western"><surname>Antonio</surname><given-names>Carlos Seabra</given-names></name><xref ref-type="aff" rid="aff3"><sup>3</sup></xref></contrib></contrib-group><aff id="aff3"><addr-line>Laboratório de Sistemas Integráveis do Departamento de Engenharia de Sistemas Eletronicos da Escola Politécnica da USP (LSI-PSI/EPUSP), Sao Paulo, Brazil</addr-line></aff><aff id="aff2"><addr-line>Grupo de óptica, Micro e Nanofabricao de Dispositivos (GOMNDI), Universidade Federal do Pampa, Rio Grande do Sul, Brazil</addr-line></aff><aff id="aff1"><addr-line>Centro de Ciências Naturais e Humanas, Universidade Federal do ABC, Sao Paulo, Brazil</addr-line></aff><author-notes><corresp id="cor1">* E-mail:<email>l.torre.q@gmail.com(UT)</email>;</corresp></author-notes><pub-date pub-type="epub"><day>16</day><month>01</month><year>2014</year></pub-date><volume>03</volume><issue>01</issue><fpage>1</fpage><lpage>5</lpage><history><date date-type="received"><day>November</day>	<month>11,</month>	<year>2013</year></date><date date-type="rev-recd"><day>December</day>	<month>18,</month>	<year>2013</year>	</date><date date-type="accepted"><day>January</day>	<month>8,</month>	<year>2014</year></date></history><permissions><copyright-statement>&#169; Copyright  2014 by authors and Scientific Research Publishing Inc. </copyright-statement><copyright-year>2014</copyright-year><license><license-p>This work is licensed under the Creative Commons Attribution International License (CC BY). http://creativecommons.org/licenses/by/4.0/</license-p></license></permissions><abstract><p>
 
 
   In this work,we report a method to improve the efficiency of the micromechanical cleavage technique to obtain few-layers graphene samples, from natural graphite flakes, which were previously submitted to two chemical treatment times with H<sub>2</sub>SO<sub>4</sub>(17 and 25 hours). After the chemical treatment times, Raman spectroscopy reveals a hydrogenation of the few-layer graphene samples, which were obtained from the treated graphite flakes. To analyze the hydrogenation of the samples, the G and 2D bands of the Raman spectra of the treated and un-treated samples were analyzed and compared, as well as the I(2D)/I(G) ratio, revealing a p-doping on the treated samples when compared with the untreated samples. Our studies could be of great importance to obtain larger and greater amount of few-layer graphene samples. 
 
</p></abstract><kwd-group><kwd>Graphene; Micromechanical Cleavage; Raman Spectroscopy; Chemical Treatment</kwd></kwd-group></article-meta></front><body><sec id="s1"><title>1. Introduction</title><p>Graphene, by its fabulous mechanical, electronic, thermal and optical properties, is one of the most promising candidates for the next generation of electronic materials [<xref ref-type="bibr" rid="scirp.42074-ref1">1</xref>]. However, for the study and application of graphene, the identification and characterization of this material are of vital importance. In this sense, Raman spectroscopy plays a very important role, since it is a non-destructive, fast and simple characterization technique. The Raman spectrum of graphene shows some characteristic bands that provide structural, electronic and vibrational information [2-5].</p><p>The G (~1582 cm<sup>−1</sup>) and 2D (~2700 cm<sup>−1</sup>) bands are the most prominent bands of the spectrum, whose position changes and full width half maximum (FWHM) can monitor the type of doping of the sample [4,6,7]. Additionally, the 2D band also presents significant changes in position, shape and FWHM for samples with different numbers of layers that make of the Raman spectroscopy a highly reliable technique for determining the number of layers of few-layer graphene samples [5,8,9].</p><p>It has recently attracted much attention to the resulting structure of the interaction between molecules of H<sub>2</sub>SO<sub>4</sub> with few-layer graphene systems, due to their unusual properties. Theoretical studies between the interaction of H<sub>2</sub>SO<sub>4</sub> and bilayer graphene systems (BLG) have reported the possibility of intercalating the individual molecules of H<sub>2</sub>SO<sub>4</sub> between the graphene layers, given place to the charge transfer phenomena and increasing the distance between layers and variations of the electronic structure [10-13]. On the other hand, in a concentrated solution of H<sub>2</sub>SO<sub>4</sub> (18M/98%) may also exist free H<sup>+</sup> ions [<xref ref-type="bibr" rid="scirp.42074-ref11">11</xref>] that interact with the graphitic systems (graphite, graphene) and can form bonds with the π electrons of the carbon (C) atoms (C-H bonds), producing the hydrogenation of the system.</p><p>The hydrogenation has a surfactant effect on the process cleavage of graphite (reduction of the Van de Waals interaction between the adjacent layers) to obtain individual layers of graphene [<xref ref-type="bibr" rid="scirp.42074-ref14">14</xref>]. This effect can take advantage to increase the efficiency of the micromechanical cleavage technique in the preparation of few-layer graphene samples. Theoretical studies of hydrogenated graphene have shown that the hydrogen produces a p-doping on the graphene layers [<xref ref-type="bibr" rid="scirp.42074-ref15">15</xref>], as well as a significant structural change, and due to the hybridization, is no longer a purely trigonal planar (sp<sup>2</sup>) to acquire an intermediate character of the hybridization between sp<sup>2</sup> and sp<sup>3</sup> [16-19].</p><p>Additionally, the hydrogenated graphene was experimentally studied by Raman spectroscopy and the main reported characteristics were: 1) The G band position increases for increasing ǀE<sub>F</sub>ǀ and saturates for high doping [4,7,19]; 2) Increasing of the 2D band position corresponds to p-doping, as predicted theoretically [4,7,15]; 3) The integrated intensity ratio I(2D)/I(G) decreases, because the doping generates an additional contribution on the electron scattering defect (increasing γ’), where the intensity of the 2D band is proportional to 1/γ’<sup>2</sup> [15,20].</p></sec><sec id="s2"><title>2. Experimental</title><p>First, 10.0 g of natural graphite (9950 GRAFLAKE of the National of Graphite—MG, Brazil) was immersed in 120 ml of concentrated H<sub>2</sub>SO<sub>4</sub> (18M/98%) and mixture by magnetic stirring. Then, the graphite was extracted into two parts, the first (second) part was extracted after completing 17 (25) hours of magnetic stirring. Finally, the graphite was removed from H<sub>2</sub>SO<sub>4</sub> and the two parts were filtered and rinsed with deionized water, and placed in a hot plate (approximately 50˚C) to eliminate the liquid wastes. Henceforward, the treated graphite samples were named G17 (G25) for 17 hours (25 hours) and the untreated graphite sample G0.</p><p>Few-layer graphene samples were obtained from graphite flakes G0, G17 and G25, by micromechanical cleavage, and placed on 30 substrates of Si/SiO<sub>2</sub> (300 nm). In order to analyze the surfactant effect of the chemical treatment on graphite G0, which directly affects the number of samples obtained on each substrate, the number of layers (n) and type of doping on the samples were determined by Raman spectroscopy, using a spectrometer Jobin Yvon T64000 with a spectral resolution of 1 cm<sup>−1</sup>, in a simple mode with a grid of 1800 lines. The used solid-state laser was of 532 nm wavelength (2.33 eV), with a power output maintained at around 2 mW to avoid heating effect.</p></sec><sec id="s3"><title>3. Results and Discussion</title><p>Mapping the 30 substrates, where the exfoliated graphite were deposited, it was found that: in the 10 substrates of the G0 graphite flake only ~5 few-layer graphene samples with an average size ≤ 10 μm. For the treated graphite flakes (G17 and G25) were obtained between 15 and 20 samples with an average size ≥ 10 μm. From these observations, we conclude that the chemical treatment of graphite flakes with&#160;H<sub>2</sub>SO<sub>4</sub> produces a significant improvement on the micromechanical cleavage method, increasing considerably the efficiency to obtain few-layer graphene samples (above 300%).</p><p>The number of layers (n) of the obtained samples have been determined analyzing the FWHM of the 2D band (FWHM<sub>2D</sub>), by Raman spectroscopy [<xref ref-type="bibr" rid="scirp.42074-ref9">9</xref>], it has seen that the FWHM<sub>2D</sub> has minimal changes after the chemical treatment and it is possible to identify samples from n = 1 to 5 layers.  <xref ref-type="fig" rid="fig1">Figure 1</xref>(a) shows representative spectra from n = 1 to 5 of the obtained samples after exfoliation of the graphite G17, where one can see that as the number of layers increase, the 2D band is deformed as its FWHM increase, besides presenting a upshift. In order to quantify the FWHM<sub>2D</sub> and the upshift of the 2D band, this band was adjusted taking into account one Lorentzian function, as in [<xref ref-type="bibr" rid="scirp.42074-ref9">9</xref>], for each spectrum. The results are shown in <xref ref-type="fig" rid="fig1">Figure 1</xref>(b), by triangular (square) symbols, where we can see a variation of the FWHM<sub>2D</sub> (shift of the 2D band position) from 25.8 cm<sup>−1</sup> (2675 cm<sup>−1</sup>) for n = 1 to 64.9 cm<sup>−1</sup> (2711 cm<sup>−1</sup>) for n = 5.</p><p><xref ref-type="fig" rid="fig2">Figure 2</xref> shows the Raman spectra of monolayer graphene (SLG) samples obtained from the exfoliation of G0, G17 and G25 graphite flakes, called respectively M-0, M-17 and M-25, in which we can see that the G and 2D bands are respectively located at ~1586 cm<sup>−1</sup> and ~2676 cm<sup>−1</sup>. On the other hand,  <xref ref-type="fig" rid="fig3">Figure 3</xref> shows the Raman spectra of bilayer graphene (BLG) samples B-0, B-17 and B-25, in which the G and 2D bands are respectively located at ~1584 cm<sup>−1</sup> and ~2693 cm<sup>−1</sup>, where evidently the shape of the 2D band (contribution of 4 Lorentzian functions [3,5,21]) corresponds to BLG samples. The upper right inset in <xref ref-type="fig" rid="fig3">Figure 3</xref> shows fitting of the 2D band for one spectrum.</p><p>In order to have a better information of the effect of H<sub>2</sub>SO<sub>4</sub> solution on the treated samples, the doping effect on the 2D band was analyzed in more detail on the Raman spectra of SLG and BLG. This band on the SLG (BLG) samples was fitted with a single Lorentzian function to obtain its center position, founding that for the higher treatment time, the 2D band undergoes a upshift of 3.5 cm<sup>−1</sup> (4.4 cm<sup>−1</sup>), as shown in <xref ref-type="fig" rid="fig4">Figure 4</xref>(a). According to the literature [6,7], this kind of behavior corresponds to a p-doping, and is in accordance with the hydrogenation effect of graphite flakes [<xref ref-type="bibr" rid="scirp.42074-ref15">15</xref>], leaving therefore, a small concentration of H adsorbed atoms (inset in <xref ref-type="fig" rid="fig4">Figure 4</xref>(b)) in the samples after the exfoliation.</p><p>Another feature that indicates the doping effect is manifested by reduction of the integrated intensity ratio I(2D)/I(G) as the doping increase. Therefore, this ratio</p><p>was analyzed on the spectra of all samples, estimating the variation of the Fermi energy using a relation reported at the literature [<xref ref-type="bibr" rid="scirp.42074-ref7">7</xref>]. For the M-0 sample the I(2D)/I(G) ratio is ~3.12, which is approximately to the value reported by A. Das et al. [<xref ref-type="bibr" rid="scirp.42074-ref7">7</xref>] for E<sub>F</sub> ≈ 0 (null</p><p>electron concentration); for sample M-17 (M-25) this ratio is ~2.28 (~1.17), as shown by the square symbols in <xref ref-type="fig" rid="fig4">Figure 4</xref>(b). According to the work of A. Das et al. [<xref ref-type="bibr" rid="scirp.42074-ref7">7</xref>], these results correspond to Fermi energy of about −110 meV for M-17 and −410 meV for M-25. In the insets of  <xref ref-type="fig" rid="fig4">Figure 4</xref>(a) is schematically represented, changing of the Fermi energy with the chemical treatment time for the three monolayer samples (M-0, M-17 and M-25).</p><p>Similar analyses were done for BLG samples, obtaining a small decrease of the I(2D)/I(G) parameter with the chemical treatment time. For instance, the values for B-0, B-17 and B-25 samples were respectively 1.33, 1.25 and 1.14 as shown by the triangular symbols in  <xref ref-type="fig" rid="fig4">Figure 4</xref>(b). These values are also very close to that reported in another studies of A. Das et al., doping the bilayer system using an electrochemically top-gated transistor [<xref ref-type="bibr" rid="scirp.42074-ref4">4</xref>].</p></sec><sec id="s4"><title>4. Conclusion</title><p>We report a chemical method to optimize the micromechanical cleavage technique to obtain a larger and greater amount of few-layer graphene samples, taking advantage of the surfactant effect of the treatment of graphite with H<sub>2</sub>SO<sub>4</sub>. Studies by Raman spectroscopy revealed that the SLG and BLG samples obtained from the treated graphite exhibit a p-doping, and characteristics of the Raman spectra reinforce the idea of certain concentration of H atoms adsorbed on the surface of the SLG and BLG samples. Additional measurements, such as infrared spectroscopy and DRX, would be necessary to be sure of the hydrogenation in our samples.</p></sec><sec id="s5"><title>Acknowledgements</title><p>We thank Professors C. Rettori and A. Champi for their initial contributions to this research. Universidade Federal do ABC (UFABC), FAPESP and CAPES agencies for the financial support.</p></sec><sec id="s6"><title>REFERENCES</title></sec><sec id="s7"><title>NOTES</title></sec></body><back><ref-list><title>References</title><ref id="scirp.42074-ref1"><label>1</label><mixed-citation publication-type="other" xlink:type="simple">K. S. Novoselov, A. K. Geim, S. V. Morozov, D. Jiang, Y. Zhang, S. V. Dubonos, I. V. Grigorieva and A. A. Firsov, “Electric Field Effect in Atomically Thin Carbon Films,” Science, Vol. 306, No. 5696, 2004, pp. 666-669.  
http://dx.doi.org/10.1126/science.1102896</mixed-citation></ref><ref id="scirp.42074-ref2"><label>2</label><mixed-citation publication-type="other" xlink:type="simple">F. Banhart, J. Kotakoski and A. V. Krasheninnikov, “Struc- tural Defects in Graphene,” ACS Nano, Vol. 5, No. 26, 2011, pp. 26-41. http://dx.doi.org/10.1021/nn102598m</mixed-citation></ref><ref id="scirp.42074-ref3"><label>3</label><mixed-citation publication-type="other" xlink:type="simple">M. Begliarbekov, O. Sul, S. Kalliakos, E.-H. Yang and S. Strauf, “Determination of Edge Purity in Bilayer Graphene Using μ-Raman Spectroscopy,” Applied Physics Letters, Vol. 97, No. 3, 2010, Article ID: 031908.  
http://dx.doi.org/10.1063/1.3464972</mixed-citation></ref><ref id="scirp.42074-ref4"><label>4</label><mixed-citation publication-type="other" xlink:type="simple">A. Das, B. Chakraborty, S. Piscanec, S. Pisana, A. K. Sood and A. C. Ferrari, “Phonon Renormalization in Doped Bilayer Graphene,” Physical Review B, Vol. 79, No. 15, 2009, Article ID: 155417.  
http://dx.doi.org/10.1103/PhysRevB.79.155417</mixed-citation></ref><ref id="scirp.42074-ref5"><label>5</label><mixed-citation publication-type="other" xlink:type="simple">A. C. Ferrari, J. C. Meyer, V. Scardaci, C. Casiraghi, M. Lazzeri, F. Mauri, S. Piscanec, D. Jiang, K. S. Novoselov, S. Roth and A. K. Geim, “Raman Spectrum of Graphene and Graphene Layers,” Physical Review Letters, Vol. 97, No. 18, 2006, Article ID: 187401. 
&lt;br /&gt;http://dx.doi.org/10.1103/PhysRevLett.97.187401</mixed-citation></ref><ref id="scirp.42074-ref6"><label>6</label><mixed-citation publication-type="other" xlink:type="simple">S. Pisana, M. Lazzeri, C. Casiraghi, K. S. Novoselov, A. K. Geim, A. C. Ferrari and F. Mauri, “Breakdown of the Adiabatic Born-Oppenheimer Approximation in Graphene,” Nature Materials, Vol. 6, No. 3, 2007, pp. 198-201.  
http://dx.doi.org/10.1038/nmat1846</mixed-citation></ref><ref id="scirp.42074-ref7"><label>7</label><mixed-citation publication-type="other" xlink:type="simple">A. Das, S. Pisana, B. Chakraborty, S. Piscanec, S. K. Saha, U. V. Waghmare, W. S. Novoselov, H. R. Krish- namurthy, A. K. Geim, A. C. Ferrari and A. K. Sood, “Mo- nitoring Dopants by Raman Scattering in an Electrochemically Top-Gated Graphene Transistor,” Nature Nanotechnology, Vol. 3, No. 4, 2008, pp. 210-215.  
http://dx.doi.org/10.1038/nnano.2008.67</mixed-citation></ref><ref id="scirp.42074-ref8"><label>8</label><mixed-citation publication-type="other" xlink:type="simple">A. Gupta, G. Chen, P. Joshi, S. Tadigadapa and P. C. Eklund, “Raman Scattering from High-Frequency Phonons in Supported n-Graphene Layer Films,” Nano Letters, Vol. 6, No. 12, 2006, pp. 2667-2673.  
http://dx.doi.org/10.1021/nl061420a</mixed-citation></ref><ref id="scirp.42074-ref9"><label>9</label><mixed-citation publication-type="other" xlink:type="simple">Y. F. Hao, Y. Y. Wang, L. Wang, Z. H. Ni, Z. Q. Wang, R. Wang, C. K. Koo, Z. X. Shen and J. T. L. Thong, “Probing Layer Number and Stacking Order of Few-Layer Graphene by Raman Spectroscopy,” Small, Vol. 6, No. 2, 2010, pp. 195-200.  
http://dx.doi.org/10.1002/smll.200901173</mixed-citation></ref><ref id="scirp.42074-ref10"><label>10</label><mixed-citation publication-type="other" xlink:type="simple">N. A. Cordero and J. A. Alonso, “The Interaction of Sulfuric Acid with Graphene and Formation of Adsorbed Crystals,” Nanotechnology, Vol. 18, No. 48, 2007.  
http://dx.doi.org/10.1088/0957-4484/18/48/485705</mixed-citation></ref><ref id="scirp.42074-ref11"><label>11</label><mixed-citation publication-type="other" xlink:type="simple">I. G. Ayala, N. A. Cordero and J. A. Alonso, “Surfactant Effect of Sulfuric Acid on the Exfoliation of Bilayer Graphene,” Physical Review B, Vol. 84, No. 16, 2011, Article ID: 165424 .  
http://dx.doi.org/10.1103/PhysRevB.84.165424</mixed-citation></ref><ref id="scirp.42074-ref12"><label>12</label><mixed-citation publication-type="other" xlink:type="simple">K. S. Novoselov, D. Jiang, F. Schedin, T. J. Booth, V. V. Khotkevich, S. V. Morozov and A. K. Geim, “Two-Dimensional Atomic Crystals,” Proceedings of the National Academy of Sciences of the USA, Vol. 102, No. 30, 2005, pp. 10451-10453.  
http://dx.doi.org/10.1073/pnas.0502848102</mixed-citation></ref><ref id="scirp.42074-ref13"><label>13</label><mixed-citation publication-type="other" xlink:type="simple">S. Stankovich, D. A. Dikin, G. H. Dommett, K. M. Kohl- haas, E. J. Zimney, E. A. Stach, R. D. Piner, S. T. Nguyen and R. S. Ruoff, “Graphene-Based Composite Materials,” Nature, Vol. 442, 2006, pp. 282-286.  
http://dx.doi.org/10.1038/nature04969</mixed-citation></ref><ref id="scirp.42074-ref14"><label>14</label><mixed-citation publication-type="other" xlink:type="simple">M. Bostr?m and B. E. Sernelius, “Repulsive van der Waals Forces Due to Hydrogen Exposure on Bilayer Graphene,” Physical Review A, Vol. 85, No. 1, 2012, Article ID: 012508.http://dx.doi.org/10.1103/PhysRevA.85.012508 </mixed-citation></ref><ref id="scirp.42074-ref15"><label>15</label><mixed-citation publication-type="other" xlink:type="simple">D. C. Elias, R. R. Nair, T. M. G. Mohiuddin, S. V. Mo- rozov, P. Blake, M. P. Halsall, A. C. Ferrari, D. W. Boukhvalov, M. I. Katsnelson, A. K. Geim and K. S. Novoselov, “Control of Graphene’s Properties by Reversible Hydrogenation,” Science, Vol. 323, No. 5914, 2009, pp. 610-613. http://dx.doi.org/10.1126/science.1167130</mixed-citation></ref><ref id="scirp.42074-ref16"><label>16</label><mixed-citation publication-type="other" xlink:type="simple">Z. Q. Luo, T. Yu, K.-J. Kim, Z. H. Ni, Y. M. You, S. Lim, Z. X. Shen, S. Z. Wang and J. Y. Lin, “Thickness-Dependent Reversible Hydrogenation of Graphene Layers,” ACS Nano, Vol. 3, No. 7, 2009, pp. 1781-1788.  
http://dx.doi.org/10.1021/nn900371t</mixed-citation></ref><ref id="scirp.42074-ref17"><label>17</label><mixed-citation publication-type="other" xlink:type="simple">A. Castellanos-Gomez, M. Wojtaszek, Arramel, N. Tombros and B. J. van Wees, “Reversible Hydrogenation and Bandgap Opening of Graphene and Graphite Surfaces Probed by Scanning Tunneling Spectroscopy,” Small, Vol. 8, No. 10, 2012, pp. 1607-1613.  
&lt;br /&gt;http://dx.doi.org/10.1002/smll.201101908</mixed-citation></ref><ref id="scirp.42074-ref18"><label>18</label><mixed-citation publication-type="other" xlink:type="simple">D. W. Boukhvalov, “Hydrogen on Graphene: Electronic Structure, Total Energy, Structural Distortions and Magnetism from First-Principles Calculations,” Physical Review B, Vol. 77, No. 3, 2008, Article ID: 035427. 
http://dx.doi.org/10.1103/PhysRevB.77.035427</mixed-citation></ref><ref id="scirp.42074-ref19"><label>19</label><mixed-citation publication-type="other" xlink:type="simple">C. Casiraghi, “Raman Intensity of Graphene,” Status Solidi B, Vol. 248, No. 11, 2011, pp. 2593-2597.  
http://dx.doi.org/10.1002/pssb.201100040</mixed-citation></ref><ref id="scirp.42074-ref20"><label>20</label><mixed-citation publication-type="other" xlink:type="simple">Z. Q. Luo, T. Yu, Z. H. Ni, S. H. Lim, H. L. Hu, J. Z. Shang, L. Liu, Z. X. Shen and J. Y. Lin, “Electronic Structures and Structural Evolution of Hydrogenated Graphene Probed by Raman Spectroscopy,” The Journal of Physical Chemistry C, Vol. 115, No. 5, 2011, pp. 1422-1427.  
&lt;br /&gt;http://dx.doi.org/10.1021/jp107109h</mixed-citation></ref><ref id="scirp.42074-ref21"><label>21</label><mixed-citation publication-type="other" xlink:type="simple">L. M. Malard, J. Nilsson, D. C. Elias, J. C. Brant, F. Plentz, E. S. Alves, A. H. Castro Neto and M. A. Pimenta, “Probing the Electronic Structure of Bilayer Graphene by Raman Scattering,” Physical Review B, Vol. 76, No. 20, 2007, pp. 201401-201404.  
http://dx.doi.org/10.1103/PhysRevB.76.201401</mixed-citation></ref></ref-list></back></article>