<?xml version="1.0" encoding="UTF-8"?><!DOCTYPE article  PUBLIC "-//NLM//DTD Journal Publishing DTD v3.0 20080202//EN" "http://dtd.nlm.nih.gov/publishing/3.0/journalpublishing3.dtd"><article xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" dtd-version="3.0" xml:lang="en" article-type="research article"><front><journal-meta><journal-id journal-id-type="publisher-id">MSA</journal-id><journal-title-group><journal-title>Materials Sciences and Applications</journal-title></journal-title-group><issn pub-type="epub">2153-117X</issn><publisher><publisher-name>Scientific Research Publishing</publisher-name></publisher></journal-meta><article-meta><article-id pub-id-type="doi">10.4236/msa.2013.45039</article-id><article-id pub-id-type="publisher-id">MSA-31468</article-id><article-categories><subj-group subj-group-type="heading"><subject>Articles</subject></subj-group><subj-group subj-group-type="Discipline-v2"><subject>Chemistry&amp;Materials Science</subject></subj-group></article-categories><title-group><article-title>
 
 
  XANES and XPS Study on Microstructure of Mn-Doped ZnO Films
 
</article-title></title-group><contrib-group><contrib contrib-type="author" xlink:type="simple"><name name-style="western"><surname>.</surname><given-names>Zhang</given-names></name><xref ref-type="aff" rid="aff1"><sup>1</sup></xref><xref ref-type="corresp" rid="cor1"><sup>*</sup></xref></contrib><contrib contrib-type="author" xlink:type="simple"><name name-style="western"><surname>M.</surname><given-names>Li</given-names></name><xref ref-type="aff" rid="aff1"><sup>1</sup></xref></contrib><contrib contrib-type="author" xlink:type="simple"><name name-style="western"><surname>J.</surname><given-names>Z. Wang</given-names></name><xref ref-type="aff" rid="aff1"><sup>1</sup></xref></contrib><contrib contrib-type="author" xlink:type="simple"><name name-style="western"><surname>L.</surname><given-names>Q. Shi</given-names></name><xref ref-type="aff" rid="aff1"><sup>1</sup></xref></contrib><contrib contrib-type="author" xlink:type="simple"><name name-style="western"><surname>H.</surname><given-names>S. Cheng</given-names></name><xref ref-type="aff" rid="aff1"><sup>1</sup></xref></contrib></contrib-group><aff id="aff1"><addr-line>Applied Ion Beam Physics Laboratory (Key Laboratory of the Ministry of Education), Institute of Modern Physics, Fudan University, Shanghai, China; Department of Nuclear Science and Technology, Fudan University, Shanghai, China</addr-line></aff><author-notes><corresp id="cor1">* E-mail:<email>binzhang@fudan.edu.cn(.Z)</email>;</corresp></author-notes><pub-date pub-type="epub"><day>21</day><month>05</month><year>2013</year></pub-date><volume>04</volume><issue>05</issue><fpage>307</fpage><lpage>311</lpage><history><date date-type="received"><day>January</day>	<month>24th,</month>	<year>2013</year></date><date date-type="rev-recd"><day>March</day>	<month>27th,</month>	<year>2013</year>	</date><date date-type="accepted"><day>April</day>	<month>11th,</month>	<year>2013</year></date></history><permissions><copyright-statement>&#169; Copyright  2014 by authors and Scientific Research Publishing Inc. </copyright-statement><copyright-year>2014</copyright-year><license><license-p>This work is licensed under the Creative Commons Attribution International License (CC BY). http://creativecommons.org/licenses/by/4.0/</license-p></license></permissions><abstract><p>
 
 
   Microstructure of ZnO:Mn films with various Mn concentration was investigated with XANES and XPS. The experimental results revealed a substitution of Mn in ZnO and also excluded the existence of Mn oxides or metallic manganese clusters. The substitutional Mn presented a divalent state and all the ZnO:Mn films were n-type. Room temperature ferromagnetism monotonously decreases with the decrease of the electron carrier concentration. The observed ferrmagnetism should come from the carrier-mediated exchange.  
    
 
</p></abstract><kwd-group><kwd>ZnO-Based DMS; Mn Substitution; XANES; XPS</kwd></kwd-group></article-meta></front><body><sec id="s1"><title>1. Introduction</title><p>Recently, diluted magnetic semiconductors (DMSs) [1-3] have attracted much interest for their potential applications in spintronics. Among them, Mn-doped ZnO is the most favorable candidate because the Mn ion possesses the highest magnetic moment among 3d transition metals and can create a fully polarized stable state due to halffilled 3d bands. There are many reports on room temperature ferromagnetism (RTFM) in the system since the theoretical prediction of RTFM by Dietl et al. in 2000 [<xref ref-type="bibr" rid="scirp.31468-ref4">4</xref>]. However, the origin of ferromagnetism (FM) is still unclear. Some studies indicate that FM might come from the precipitates (e.g., clusters and/or a secondary phase) [5-7]. On the other hand, some studies think that FM might originate from exchange interactions between the localized magnetic moment of the substitutional ions on Zn sites and free charge carriers generated by doping [8-10]. Another origin of FM might be defect-mediated coupling of spins [11-13]. In Mn-doped ZnO, the defects are mainly oxygen/zinc vacancies or interstitials. The defect like O vacancies or Zn interstitials might trap an electron, forming an H-like structure. These electrons confined in O vacancies or Zn interstitials would interact with the delectrons of a Mn atom within their orbits, yielding a bound magnetic polaron (BMP) [<xref ref-type="bibr" rid="scirp.31468-ref14">14</xref>]. The BMPs overlap with each other and hence inducing FM. Recently, FM is also observed in n-type ZnO:Mn films at or above RT, and the magnetization monotonously depends on the electron carrier concentration [15,16]. The experimental result contradicts the theoretical prediction which requires a high concentration of holes for FM [4,17]. Therefore, to further investigate and clarify the origin of FM, it is very important to investigate microstructrure of Mn doped ZnO, especially occupation sites and valent states of Mn atoms.</p><p>X-ray absorption near-edge structure (XANES) spectroscopy is a powerful probe for providing a “fingerprint” of chemical states and local electronic structure of incorporated atoms in the host compounds even in a dilute concentration. In particular, the absolute energy position of the edge spectra contains information about the valence state of the absorbing elements. In this paper we employ XANES combining other analysis techniques to investigate the Mn local atomic and electronic structures as well as magnetic interactions in Mn-doped ZnO film.</p></sec><sec id="s2"><title>2. Experimental</title><p>Mn-doped ZnO films were deposited on (0001) sapphire substrates (99.999%) by radio frequency (RF) magnetron sputtering, with a composite target of ZnO (99.99%) and Mn (99.99%). According to the area ratio of ZnO and Mn, the Mn-doped content could be adjusted. High purity Ar (99.999%) was introduced into the sputtering chamber at the base pressure of ≤6.0 &#215; 10<sup>−4</sup> Pa. The Arflow rate was 20 SCCM (SCCM denotes cubic centimeter per minute at STP (standard temperature and pressure)). The working pressure was 0.5 Pa, the sputtering power 90 W and the substrate temperature 500˚C. Prior to a deposition, a pre-sputtering cleaning was performed for about 20 minutes to eliminate possible contaminants from the target surface.</p><p>The Mn K-edge XANES (6.539 keV) spectra were measured at the U7C beamline of National Synchrotron Radiation Laboratory of China. High resolution XPS spectra were detected using a Kratos AXIS Ultra DLD spectrometer with a high resolution of 0.48 eV. The monochromatic Al Kα X-ray (λ = 0.8339 nm) was used as the incident light. The binding energy scale was calibrated using the C 1s line at 284.8 eV. Electrical properties were carried out at room temperature by Hall effect measurements using a Van der Pauw four-point method. An In electrode was made by soldering indium at four corns of the sample surface. The linear I-V behavior for all samples indicated a good Ohmic contact between In electrode and film layer. The magnetic property at room temperature was measured by the Quantum Design MPMSXL7 SQUID magnetometer.</p></sec><sec id="s3"><title>3. Results and Discussion</title><p>To detect Mn cluster and any secondary phases in the ZnO:Mn samples, we have measured Mn K-edge XANES of all the DMS samples and Mn metal. For clarity, <xref ref-type="fig" rid="fig1">Figure 1</xref> only shows the measured spectra of the Zn<sub>0.89</sub>Mn<sub>0.11</sub>O film and Mn metal. The FEFF 9.0 [<xref ref-type="bibr" rid="scirp.31468-ref18">18</xref>] simulations of Mn oxides (MnO, MnO<sub>2</sub>, Mn<sub>2</sub>O<sub>3</sub>, Mn<sub>3</sub>O<sub>4</sub>) are also shown in <xref ref-type="fig" rid="fig1">Figure 1</xref>. The spectrum of the DMS sample is quite different from Mn oxides and metallic Mn. The spectrum of MnO has the same features as that of the DMS film in a high energy region (Peak B, C and D), while there is no agreement in the low energy region</p><p>(Peak A). It implies that there are no Mn oxides or metallic manganese clusters in the films. The same results have been obtained using an extended X-ray absorption fine structure (EXAFS) and synchrotron radiation X-ray diffraction (SR-XRD) [<xref ref-type="bibr" rid="scirp.31468-ref19">19</xref>]. Additionally, the Mn absorption edge position of the DMS samples is close to that of MnO, suggesting the existence of Mn<sup>2+</sup>.</p><p>In order to further investigate Mn occupation sites, we have attempted to perform XANES calculations with the FDMNES 2007 code [<xref ref-type="bibr" rid="scirp.31468-ref20">20</xref>] at Mn K-edge for a lot of possible configurations such as the substitutional Mn<sub>Zn</sub>, the interstitial Mn<sub>I</sub>, the Mn<sub>Zn</sub>-Mn<sub>I</sub> dimer, and the Mn<sub>Zn</sub>-OMn<sub>Zn</sub>. For the interstitial Mn<sub>I</sub> model, Mn is placed at the void in wurtzite ZnO structure locating at the center of the Zn tetrahedron. The Mn<sub>Zn</sub>-Mn<sub>I</sub> dimer is based on the interstitial structure, where one Zn atom of the Mn-containing tetrahedron is substituted by a Mn atom. For the Mn<sub>Zn</sub>-O-Mn<sub>Zn</sub>, two subtitutional Mn atoms on Zn sites are separated by an O atom. All XANES functions are calculated within a sphere of 6 &#197; radius, whose center is the absorber atom Mn. <xref ref-type="fig" rid="fig2">Figure 2</xref> shows the spectra of the DMS samples and the calculated spectra from the above-mentioned models. Obviously, the spectra of the DMS samples are different from that of the interstitial Mn<sub>I</sub>, which means that Mn could not exist at the interstitial site. We also explore the clustering tendency of the Mn atoms in ZnO. From the obvious difference between the spectra of the Mn<sub>Zn</sub>-Mn<sub>I</sub> dimer, the Mn<sub>Zn</sub>-O-Mn<sub>Zn</sub> and the DMS samples, we can exclude the phenomena. In the XANES spectra of the DMS samples, there are four characteristic peaks A (6541 eV), B (6546 eV), C (6555 eV) and D (6567 eV). The preedge peak A can be interpreted as the transition of Mn 1s core electron to the unoccupied Mn 3d and O 2p hybridized states. In the sub stitutional model, “Mn<sub>Zn</sub>” represent the model of no op-</p><p>timizing the geometry of the studied configurations, i.e., the bond lengths of Mn<sub>Zn</sub>-O and Mn<sub>Zn</sub>-Zn is 1.97 and 3.20 &#197;, respectively, while “Mn<sub>Zn</sub> expand” represent the model in which the bond lengths of Mn<sub>Zn</sub>-O and Mn<sub>Zn</sub>-Zn is expanded to 2.03 and 3.28 &#197;, respectively. In the Mn<sub>Zn</sub> model, A, C and D peaks can be well reproduced except the B peak. On the other hand, the height of the Peak A in the Mn<sub>Zn</sub> model is much larger than that in the DMS samples. However, in the Mn<sub>Zn</sub> expand model, four characteristic peaks can be well reproduced and the calculated spectrum resembles those of the DMS samples. It implies that Mn atoms are incorporated into the ZnO crystal lattice by the substitution on Zn sites, accompanying with an expansion of the Mn<sub>Zn</sub>-O and Mn<sub>Zn</sub>-Zn bond lengths due to the larger atomic radius of Mn compared with Zn. The same results have been observed by an extended X-ray absorption fine structure (EXAFS) [<xref ref-type="bibr" rid="scirp.31468-ref19">19</xref>].</p><p>The valent state of Mn in the DMS films is detected by high resolution XPS. In <xref ref-type="fig" rid="fig3">Figure 3</xref>, the Mn 2p<sub>3/2</sub> peak for the DMS samples is located at 640.73 eV, which is very close to Mn<sup>2+</sup> in MnO (Mn 2p<sub>3/2</sub>: 640.7 eV) according to the XPS handbook. It well agrees with those reported in the literature, indicating a divalent state of the Mn ions in ZnO:Mn films [21,22]. Moreover, from the XPS handbook we also know that the Mn 2p<sub>3/2</sub> peaks for metallic Mn, Mn<sub>3</sub>O<sub>4</sub>, Mn<sub>2</sub>O<sub>3</sub> and MnO<sub>2</sub> are located at 639, 641.2, 641.6 and 642.2 eV, respectively. So we can exclude the existence of Mn oxides or metallic manganese clusters in the films, in good agreement with the XANES analysis.</p><p><xref ref-type="fig" rid="fig4">Figure 4</xref> shows the magnetization curves at room temperature. These magnetization curves are obtained with the applied field parallel to the plane of the sample. The diamagnetic background of ZnO and sapphire substrate are subtracted. The hysteresis loops show the clear ferromagnetic behavior of these Mn-doped ZnO films at room temperature. From <xref ref-type="fig" rid="fig4">Figure 4</xref>, the saturation mag-</p></sec></body><back><ref-list><title>References</title><ref id="scirp.31468-ref1"><label>1</label><mixed-citation publication-type="other" xlink:type="simple">B. Zhang, Q. H. Li, L. Q. Shi, H. S. Cheng and J. Z. Wang, “Room Temperature Ferromagnetism of Fe-Implanted ZnO Film,” Journal of Vacuum Science &amp; Technology A, Vol. 26, No. 6, 2008, pp. 1469-1473. 
doi:10.1116/1.2990855</mixed-citation></ref><ref id="scirp.31468-ref2"><label>2</label><mixed-citation publication-type="other" xlink:type="simple">B. Zhang, L. Q. Shi, C. C. Chen and D. G. Zhao, “PIXE Analysis of Fe Content in Fe-Implanted GaN Film,” Nuclear Instruments and Methods in Physics Research Section B, Vol. 252, No. 2, 2006, pp. 225-229. 
doi:10.1016/j.nimb.2006.09.007</mixed-citation></ref><ref id="scirp.31468-ref3"><label>3</label><mixed-citation publication-type="other" xlink:type="simple">X. F. Wang, J. B. Xu, W. Y. Cheng, J. An and N. Ke, “Aggregation-Based Growth and Magnetic Properties of Inhomogeneous Cu-Doped ZnO Nanocrystals,” Applied Physics Letters, Vol. 90, No. 21, 2007, Article ID: 212502. 
doi:10.1063/1.2741408</mixed-citation></ref><ref id="scirp.31468-ref4"><label>4</label><mixed-citation publication-type="other" xlink:type="simple">T. Dietl, H. Ohno, F. Matsukura, J. Cibert and D. Ferrand, “Zener Model Description of Ferromagnetism in ZincBlende Magnetic Semiconductors,” Science, Vol. 287, No. 5455, 2000, pp. 1019-1022. 
doi:10.1126/science.287.5455.1019</mixed-citation></ref><ref id="scirp.31468-ref5"><label>5</label><mixed-citation publication-type="other" xlink:type="simple">A. C. Tuan, J. D. Bryan, A. B. Pakhomov, V. Shutthanandan, S. Thevuthasan, D. E. McCready, D. Gaspar, M. H. Engelhard, J. W. Rogers Jr., K. Krishnan, D. R. Gamelin and S. A. Chambers, “Epitaxial Growth and Properties of Cobalt-Doped ZnO on α-Al2O3 Single-Crystal Substrates,” Physical Review B, Vol. 70, No. 5, 2004, Article ID: 054424. doi:10.1103/PhysRevB.70.054424</mixed-citation></ref><ref id="scirp.31468-ref6"><label>6</label><mixed-citation publication-type="other" xlink:type="simple">X. Z. Li, J. Zhang and D. J. Sellmyer, “Structural Study of Mn-Doped ZnO Films by TEM,” Solid State Communications, Vol. 141, No. 7, 2007, pp. 398-401. 
doi:10.1016/j.ssc.2006.11.022</mixed-citation></ref><ref id="scirp.31468-ref7"><label>7</label><mixed-citation publication-type="other" xlink:type="simple">K. Potzger, S. Q. Zhou, H. Reuther, A. Mücklich, F. Eichhorn, N. Schell, W. Skorupa, M. Helm, J. Fassbender, T. Herrmannsd0rfer and T. P. Papageorgiou, “Fe Implanted Ferromagnetic ZnO,” Applied Physics Letters, Vol. 88, No. 5, 2006, Article ID: 052508. 
doi:10.1063/1.2169912</mixed-citation></ref><ref id="scirp.31468-ref8"><label>8</label><mixed-citation publication-type="other" xlink:type="simple">C. Yang, B. Zhang, J. Z. Wang, L. Q. Shi, H. S. Cheng, T. Y. Yang, W. Wen and F. C. Hu, “Microstructure and Room Temperature Ferromagnetism of Cu-Doped ZnO Films,” Nuclear Instruments and Methods in Physics, Vol. 283, 2012, pp. 24-28. doi:10.1016/j.nimb.2012.04.007</mixed-citation></ref><ref id="scirp.31468-ref9"><label>9</label><mixed-citation publication-type="other" xlink:type="simple">C. Yang, B. Zhang, J. Z. Wang, L. Q. Shi, H. S. Cheng, T. Y. Yang, W. Wen and F. C. Hu, “EXAFS and SR-XRD Study on Cu Occupation Sites in Zn1-xCuxO Diluted Magnetic Semiconductors,” Nuclear Science and Techniques, Vol. 23, 2012, pp. 65-69.</mixed-citation></ref><ref id="scirp.31468-ref10"><label>10</label><mixed-citation publication-type="other" xlink:type="simple">X. J. Liu, X. Y. Zhu, C. Song, F. Zeng and F. Pan, “Intrinsic and Extrinsic Origins of Room Temperature Ferromagnetism in Ni-Doped ZnO Films,” Journal of Physics D: Applied Physics, Vol. 42, 2009, Article ID: 035004. 
doi:10.1088/0022-3727/42/3/035004</mixed-citation></ref><ref id="scirp.31468-ref11"><label>11</label><mixed-citation publication-type="other" xlink:type="simple">D. Gao, Z. Zhang, J. Fu, Y. Xu, J. Qi and D. Xue, “Room Temperature Ferromagnetism of Pure ZnO Nanoparticles,” Journal of Applied Physics, Vol. 105, No. 11, 2009, Article ID: 113928. doi:10.1063/1.3143103</mixed-citation></ref><ref id="scirp.31468-ref12"><label>12</label><mixed-citation publication-type="other" xlink:type="simple">S. Banerjee, M. Mandal, N. Gayathri and M. Sardar, “Enhancement of Ferromagnetism upon Thermal Annealing in Pure ZnO,” Applied Physics Letters, Vol. 91, No. 18, 2007, Article ID: 182501. doi:10.1063/1.2804081</mixed-citation></ref><ref id="scirp.31468-ref13"><label>13</label><mixed-citation publication-type="other" xlink:type="simple">X. G. Chen, Y. B. Yang, R. Wu, R. Liu, X. D. Kong, L. Han, Y. C. Yang and J. B. Yang, “Room Temperature Magnetic Properties of ZnO Nanostructured Films,” Physica B, Vol. 406, No. 6, 2011, pp. 1341-1344. 
doi:10.1016/j.physb.2011.01.030</mixed-citation></ref><ref id="scirp.31468-ref14"><label>14</label><mixed-citation publication-type="other" xlink:type="simple">J. M. D. Coey, M. Venkatesan and C. B. Fitzgerald, “Donor Impurity Band Exchange in Dilute Ferromagnetic Oxides,” Nature Materials, Vol. 4, No. 2, 2005, pp. 173-179. doi:10.1038/nmat1310</mixed-citation></ref><ref id="scirp.31468-ref15"><label>15</label><mixed-citation publication-type="other" xlink:type="simple">Z. Yang, J. L. Liu, M. Biasini and W. P. Beyermann, “Electron Concentration Dependent Magnetization and Magnetic Anisotropy in ZnO:Mn Thin Films,” Applied Physics Letters, Vol. 92, No. 4, 2008, Article ID: 042111. 
doi:10.1063/1.2838753</mixed-citation></ref><ref id="scirp.31468-ref16"><label>16</label><mixed-citation publication-type="other" xlink:type="simple">M. Ivill, S. J. Pearton, Y. W. Heo, J. Kelly, A. F. Hebard and D. P. Norton, “Magnetization Dependence on Carrier Doping in Epitaxial ZnO Thin Films Co-Doped with Mn and P,” Journal of Applied Physics, Vol. 101, No. 12, 2007, Article ID: 123909. doi:10.1063/1.2739302</mixed-citation></ref><ref id="scirp.31468-ref17"><label>17</label><mixed-citation publication-type="other" xlink:type="simple">K. Sato and H. Katayama-Yoshida, “Material Design for Transparent Ferromagnets with ZnO-Based Magnetic Semiconductors,” Japanese Journal of Applied Physics Part 2, Vol. 39, 2000, pp. L555-L558. 
doi:10.1143/JJAP.39.L555</mixed-citation></ref><ref id="scirp.31468-ref18"><label>18</label><mixed-citation publication-type="other" xlink:type="simple">A. L. Ankudinov, B. Ravel, J. J. Rehr and S. D. Conradson, “Real-Space Multiple-Scattering Calculation and Interpretation of x-Ray-Absorption Near-Edge Structure,” Physical Review B, Vol. 58, No. 12, 1998, pp. 7565-7576.  
doi:10.1103/PhysRevB.58.7565</mixed-citation></ref><ref id="scirp.31468-ref19"><label>19</label><mixed-citation publication-type="other" xlink:type="simple">M. Li, B. Zhang, J. Z. Wang, L. Q. Shi, H. S. Cheng, Y. Z. Wang, H. Y. Lv, T. Y. Yang, W. Wen and F. C. Hu, “EXAFS and SR-XRD Study on Mn Occupations in Zn1-xMnxO Diluted Magnetic Semiconductors,” Nuclear Instruments and Methods in Physics Research Section B, Vol. 269, No. 21, 2011, pp. 2610-2613. 
doi:10.1016/j.nimb.2011.07.094</mixed-citation></ref><ref id="scirp.31468-ref20"><label>20</label><mixed-citation publication-type="other" xlink:type="simple">Y. Joly, “X-Ray Absorption Near-Edge Structure Calculations beyond the Muffin-Tin Approximation,” Physical Review B, Vol. 63, No. 12, 2001, Article ID: 125120.  
doi:10.1103/PhysRevB.63.125120</mixed-citation></ref><ref id="scirp.31468-ref21"><label>21</label><mixed-citation publication-type="other" xlink:type="simple">H. Y. Xu, Y. C. Liu, C. S. Xu, Y. X. Liu, C. L. Shao and R. Mu, “Room-Temperature Ferromagnetism in (Mn, N)Codoped ZnO Thin Films Prepared by Reactive Magnetron Cosputtering,” Applied Physics Letters, Vol. 88, No. 24, 2006, Article ID: 242502. doi:10.1063/1.2213929</mixed-citation></ref><ref id="scirp.31468-ref22"><label>22</label><mixed-citation publication-type="other" xlink:type="simple">Z. B. Gu, M. H. Lu, J. Wang, D. Wu, S. T. Zhang, X. K. Meng, Y. Y. Zhu, S. N. Zhu, Y. F. Chen and X. Q. Pan, “Structure, Optical, and Magnetic Properties of Sputtered Manganese and Nitrogen-Codoped ZnO Films,” Applied Physics Letters, Vol. 88, No. 8, 2006, Article ID: 082111. 
doi:10.1063/1.2178466</mixed-citation></ref></ref-list></back></article>