<?xml version="1.0" encoding="UTF-8"?><!DOCTYPE article  PUBLIC "-//NLM//DTD Journal Publishing DTD v3.0 20080202//EN" "http://dtd.nlm.nih.gov/publishing/3.0/journalpublishing3.dtd"><article xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" dtd-version="3.0" xml:lang="en" article-type="research article"><front><journal-meta><journal-id journal-id-type="publisher-id">AMPC</journal-id><journal-title-group><journal-title>Advances in Materials Physics and Chemistry</journal-title></journal-title-group><issn pub-type="epub">2162-531X</issn><publisher><publisher-name>Scientific Research Publishing</publisher-name></publisher></journal-meta><article-meta><article-id pub-id-type="doi">10.4236/ampc.2013.31011</article-id><article-id pub-id-type="publisher-id">AMPC-29298</article-id><article-categories><subj-group subj-group-type="heading"><subject>Articles</subject></subj-group><subj-group subj-group-type="Discipline-v2"><subject>Chemistry&amp;Materials Science</subject><subject> Physics&amp;Mathematics</subject></subj-group></article-categories><title-group><article-title>
 
 
  Effect of Mechanical Treatment Temperature on Electrical Properties and Crystallite Size of PVDF Film
 
</article-title></title-group><contrib-group><contrib contrib-type="author" xlink:type="simple"><name name-style="western"><surname>mbran</surname><given-names>Hartono</given-names></name><xref ref-type="aff" rid="aff1"><sup>1</sup></xref><xref ref-type="corresp" rid="cor1"><sup>*</sup></xref></contrib><contrib contrib-type="author" xlink:type="simple"><name name-style="western"><surname>Suparno</surname><given-names>Satira</given-names></name><xref ref-type="aff" rid="aff2"><sup>2</sup></xref></contrib><contrib contrib-type="author" xlink:type="simple"><name name-style="western"><surname>Mitra</surname><given-names>Djamal</given-names></name><xref ref-type="aff" rid="aff2"><sup>2</sup></xref></contrib><contrib contrib-type="author" xlink:type="simple"><name name-style="western"><surname>Ramli</surname><given-names>Ramli</given-names></name><xref ref-type="aff" rid="aff3"><sup>3</sup></xref></contrib><contrib contrib-type="author" xlink:type="simple"><name name-style="western"><surname>Herman</surname><given-names>Bahar</given-names></name><xref ref-type="aff" rid="aff2"><sup>2</sup></xref></contrib><contrib contrib-type="author" xlink:type="simple"><name name-style="western"><surname>Edi</surname><given-names>Sanjaya</given-names></name><xref ref-type="aff" rid="aff1"><sup>1</sup></xref></contrib></contrib-group><aff id="aff2"><addr-line>Theoretical High Energy Physics and Instrumentation Research Group, Faculty of Mathematics and Natural Sciences, Institut Teknologi Bandung, Bandung, Indonesia</addr-line></aff><aff id="aff3"><addr-line>Department of Physics, Faculty of Mathematics and Natural Sciences, Universitas Negeri Padang, 
Padang, Indonesia</addr-line></aff><aff id="aff1"><addr-line>Department of Physics, Faculty of Science and Technology, Islamic State University Syarif Hidayatullah, 
Jakarta, Indonesia</addr-line></aff><author-notes><corresp id="cor1">* E-mail:<email>ambranhartono@yahoo.com(MH)</email>;</corresp></author-notes><pub-date pub-type="epub"><day>21</day><month>03</month><year>2013</year></pub-date><volume>03</volume><issue>01</issue><fpage>71</fpage><lpage>76</lpage><history><date date-type="received"><day>January</day>	<month>11,</month>	<year>2013</year></date><date date-type="rev-recd"><day>February</day>	<month>16,</month>	<year>2013</year>	</date><date date-type="accepted"><day>February</day>	<month>25,</month>	<year>2013</year></date></history><permissions><copyright-statement>&#169; Copyright  2014 by authors and Scientific Research Publishing Inc. </copyright-statement><copyright-year>2014</copyright-year><license><license-p>This work is licensed under the Creative Commons Attribution International License (CC BY). http://creativecommons.org/licenses/by/4.0/</license-p></license></permissions><abstract><p>
 
 
   Fabrication of PVDF films has been making using Hot Roll Press. Preparation of samples carried out for nine different temperatures. This condition is carried out to see the effect of temperature fabrication on electrical properties and crystallite size of PVDF films. The electrical properties like as surface resistivity are discussion focus in this paper. Surface resistivity properties of PVDF can be improved by mechanical treatment on the varying film thickness and the temperature. To obtain the diffraction pattern of sample characterization is performed using X-Ray Diffraction. Crystallite size of PVDF films calculate from broadening pattern of X-Ray Diffraction. Furthermore, from the diffraction pattern calculated β fraction and crystallite size, for calculation to determine the crystallite size of the sample by using the Scherrer equation. Has been obtained an increase piezoelectric properties of PVDF films that characterized by increasing β fraction. Have been obtained β fraction increased from 25.4% up to 44% for temperatures of 130&#176;C up to 170&#176;C, respectively. Resistivity value has been obtained at temperature 130&#176;C up to 170&#176;C, decreased from 1.23 &#215; 10<sup>4</sup> Wm up to 0.21 &#215; 10<sup>4</sup> Wm respectively. From the experimental results and the calculation of crystallite sizes obtained for the samples with temperature 130&#176;C up to 170&#176;C respectively are increased from 7.2 nm up to 20.54 nm. These results indicate that mechanical treatment caused increase β fraction and decrease surface resistivity. Increasing temperatures will also increase the size of the crystallite of the sample. This happens because with the increasing temperature causes the higher the degree of crystallization of PVDF film sample is formed, so that the crystallite size also increases. 
 
</p></abstract><kwd-group><kwd>Crystallite Size; PVDF; Roll Hot Press; Scherrer Equation; Surface Resistivity; Temperature Different; XRD</kwd></kwd-group></article-meta></front><body><sec id="s1"><title>1. Introduction</title><p>Recently, the development of manufacturing technology and utilization of polymer films are increasing rapidly, especially polyvinylidene fluoride (PVDF) polymer. PVDF is a material typically used for applications requiring high purity when compared to other fluoropolymer. PVDF easier to melt due to have a low melting point [<xref ref-type="bibr" rid="scirp.29298-ref1">1</xref>]. PVDF can be synthesized from the gaseous VDF monomers via free radical polymerization process are shown in <xref ref-type="fig" rid="fig1">Figure 1</xref>.</p><p>PVDF polymer has three solid molecule structures that are β-phase, α-phase and γ-phase [<xref ref-type="bibr" rid="scirp.29298-ref2">2</xref>]. Chain agglomerations of α-phase in PVDF are shown in <xref ref-type="fig" rid="fig2">Figure 2</xref>.</p><p>α-phase of PVDF polymer have TGTG type conformation structure [<xref ref-type="bibr" rid="scirp.29298-ref2">2</xref>]. PVDF polymer with β-phase molecule structure is shown in <xref ref-type="fig" rid="fig3">Figure 3</xref>.</p><p>Recently, PVDF with β-phase structure are widely developed due to molecules with this structure provides the greatest piezoelectric effect compared with other phase.</p><p>β-phase have planar zig-zag formation which all trans (TTTT) [<xref ref-type="bibr" rid="scirp.29298-ref3">3</xref>] with deflection small because of fluor atoms bonded by nearest monomer.</p><p>The electrical properties like as piezoelectric are related to the β fraction PVDF polymer and surface resis-</p><p>tivity. Recently, PVDF with β-phase structure are widely developed due to molecules with this structure provides the greatest piezoelectric effect compared with other phase [<xref ref-type="bibr" rid="scirp.29298-ref4">4</xref>]. The α phase obtained by the crystallization of melt can be transformed to the β phase by mechanical deformation [<xref ref-type="bibr" rid="scirp.29298-ref2">2</xref>]. Drawing at lower temperatures to the natural draw ratio of −4 and at higher temperatures to higher draw ratios (&gt;4) favors the transformation from α to β phase [5-8]. From WAXD and FTIR studies, it is clear that there is a phase transformation during stretching and stretching at lower temperature to draw ratio of 4 or to higher draw ratios at higher temperature results in higher β phase contents [9,10].</p><p>The most common polymorph produced during crystallization from the melt is the α-form; it is essentially the sole crystalline obtaoined at all temperatures up to &#187;150˚C. Its crystallization kinetics have been studied by Gianotti et al. [<xref ref-type="bibr" rid="scirp.29298-ref11">11</xref>] in the range 147˚C - 165˚C, by Nakamura et al. [<xref ref-type="bibr" rid="scirp.29298-ref12">12</xref>], between 148˚C - 155˚C and by Mancarella and Martuscelli [<xref ref-type="bibr" rid="scirp.29298-ref13">13</xref>] between 134˚C and 149˚C. The dependence of crystalline and amorphous specific volume on temperature has been systematically studied by Nakagawa and Ishida [<xref ref-type="bibr" rid="scirp.29298-ref14">14</xref>].</p><p>Until now research on PVDF piezoelectric properties is still being developed, both in terms of increasing the piezoelectric material and the analysis of physical parameters related to the amount of beta fraction of the sample as well as in its application to sensors. In our research conducted by making a thin layer of material PVDF polymer with Roll Hot Press for several different temperatures. Having obtained samples were then carried out characterization using XRD to analyze the influence of different temperatures on the manufacture of crystallite size of PVDF films [<xref ref-type="bibr" rid="scirp.29298-ref15">15</xref>].</p><p>Surface Resistivity value of PVDF film calculated by measurement using I-V meter. Electro active polymers, especially polyvinylidene fluoride, its polyvinylidene fluoride trifluoroethylene copolymer and cellular polymer ferroelectrics’—have interesting and useful piezoelectric and pyroelectric properties [<xref ref-type="bibr" rid="scirp.29298-ref16">16</xref>].</p></sec><sec id="s2"><title>2. Experiment</title><p>In the experiments performed and characterization of PVDF film using such equipment; Roll Hot Press machine, micrometer screw, IV meter and X-Ray Diffraction. Initially, the PVDF samples in powder form were placed on the engine cylinder is then heated until it melts and then hot press roll device is operated to obtain a thin film. Fabrication of PVDF films made for variations in temperature from 130˚C to 170˚C. PVDF film thickness was measured with a micrometer screw, the surface resistivity of film obtained by four point probes that was realized using I-V meter, β fraction and the crystalline phase is determined by using the X-Ray Diffraction. Roll hot press machine are shown in <xref ref-type="fig" rid="fig4">Figure 4</xref>.</p><p>The scheme of four point probes is shown in <xref ref-type="fig" rid="fig5">Figure 5</xref>.</p></sec><sec id="s3"><title>3. Results and Discussion</title><p>PVDF films have been obtained with thicknesses of 13 &#181;m as shown in <xref ref-type="fig" rid="fig6">Figure 6</xref>. Characterization results performed on samples by using XRD.</p><p>X-Ray Diffraction characterization results of sample for temperature variation from 130˚C to 170˚C as shown in <xref ref-type="fig" rid="fig7">Figure 7</xref>.</p><p>XRD characterization results of sample with temperature at 130˚C as shown in <xref ref-type="fig" rid="fig8">Figure 8</xref>.</p><p>While the results for the characterization of the sample for temperature at 135˚C as shown in <xref ref-type="fig" rid="fig9">Figure 9</xref>.</p><p>Calculation to determine the amount of beta fraction of each sample using the Equation (1):</p><disp-formula id="scirp.29298-formula23010"><label>(1)</label><graphic position="anchor" xlink:href="11-1510125\4efa513b-b339-419a-8cb7-a86771416beb.jpg"  xlink:type="simple"/></disp-formula><p>From this characterization obtained β fraction of sample for temperature variation 130˚C to 170˚C are shown in <xref ref-type="table" rid="table1">Table 1</xref>. Graph of increasing β fraction with increas-</p><p>ing temperature is shown in <xref ref-type="fig" rid="fig1">Figure 1</xref>0.</p><p>The increase in temperature causes an increase in polarity due to the dipole orientation resulting in the transformation of the structure occurs. It is characterized by the addition of β fraction [<xref ref-type="bibr" rid="scirp.29298-ref17">17</xref>].</p><p>The results of current-voltage measurements for the same thickness of 13 nm with a temperature variation of 130˚C to 170˚C are shown in <xref ref-type="fig" rid="fig1">Figure 1</xref>1.</p><p>The results of resistivity measurements show that the applied voltage is proportional to the increase in current, in accordance with Ohm’s law.</p><disp-formula id="scirp.29298-formula23011"><label>(2)</label><graphic position="anchor" xlink:href="11-1510125\7f0e4d36-69dc-4be6-ac46-e2f21486042b.jpg"  xlink:type="simple"/></disp-formula><p>where R is resistance (Ω), V is applied voltage (V) and I is current (A).</p><p>The value of R can obtained from I-V curve gradient. Resistivity of sample calculated by Equation (3):</p><disp-formula id="scirp.29298-formula23012"><label>(3)</label><graphic position="anchor" xlink:href="11-1510125\9f065559-6206-41e9-b65a-b7f9238b457f.jpg"  xlink:type="simple"/></disp-formula><p><xref ref-type="table" rid="table1">Table 1</xref>. β fraction of sample for temperature variation from 130˚C up to 170˚C.</p><p>where ρ is resistivity (Ωm) and S is distance between the electrodes (5 mm). Surface Resistivity values of PVDF film for temperature 130˚C to 170˚C are decreased from 1.23 &#215; 10<sup>4</sup> Wm to 0.21 &#215; 10<sup>4</sup> Wm respectively. Graph of surface resistivity versus temperature are shown in <xref ref-type="fig" rid="fig1">Figure 1</xref>2.</p><p>While the temperature increase causes a decrease in the resistivity value, which indicates that there has been an increase in piezoelectric properties.</p><p>Crystallite size of PVDF film is determined by using scherrer equation. Scherrer has derived an expression for broadening of x-ray diffraction peaks due only to small crystallite sizes [<xref ref-type="bibr" rid="scirp.29298-ref18">18</xref>]:</p><disp-formula id="scirp.29298-formula23013"><label>(4)</label><graphic position="anchor" xlink:href="11-1510125\6e2a5418-7cfb-4fce-8d4d-3399e8a04d99.jpg"  xlink:type="simple"/></disp-formula><p>where l is the wavelength of the x-ray used, q is the Bragg angle, L is the “average” crystallite size measured in a direction perpendicular to the surface of the specimen, and k is a constant. Equation (4) is commonly known as the Scherrer equation and was derived based on uniform size. However, this equation is now frequently used to estimate the crystallite sizes of both cubic and noncubic materials. The constant k has been determined to vary between 0.89 and 1.39, but is usually taken as close to unity, the assumption that k = 1.0 is generally justifiable.</p><p>In experiment for fabrication temperature is 130˚C, this pattern was indexed, and we found that these three reflections have indices (020), (200) and (001) at the 2q value of 18.67, 20.405, and 27.09, respectively. From this characterization and calculation has produces crystallite size is 7.2 nm.</p><p>From second experiment for fabrication temperature is 135˚C, we found that these three reflections have indi-</p><p>ces (020), (200) and (002) at the 2q value of 18.72, 20.51, and 27.19, respectively. From this characterization and calculation has produces crystallite size is 7.9 nm. From the difraction pattern for temperature 140˚C, we found that these three reflections have indices (020), (200) and (022) at the 2q value of 18.63, 20.40, and 27.08 respectively. From this characterization and calculation has produces crystallite size is 19 nm [<xref ref-type="bibr" rid="scirp.29298-ref15">15</xref>].</p><p>Completely experimental results from this experiment are shown in <xref ref-type="table" rid="table2">Table 2</xref>.</p><p>These results show that increasing temperatures will</p><p><xref ref-type="table" rid="table2">Table 2</xref>. Crystallite size for each sample.</p><p><img src="11-1510125\6f516e39-e5d3-41c1-a553-a1327bf71071.jpg" /></p><p>also increase the size of the crystallite of the sample. This happens because with the increasing temperature causes the higher the degree of crystallization of PVDF film sample is formed, so that the crystallite size also increases.</p></sec><sec id="s4"><title>4. Conclusion</title><p>Has been successfully produced PVDF films with using roll hot press. XRD characterization showed increase in the β fraction when the temperature is raised. PVDF films showed a decrease in resistivity for every increase of temperature. This indicates that mechanical treatment to produce film thickness and temperature has a strong influence on the β fraction of PVDF films. Increasing of temperatures will also increase the size of the crystallite of the sample. This happens because with the increasing temperature causes the higher the degree of crystallization of PVDF film sample is formed, so that the crystallite size also increases.</p></sec><sec id="s5"><title>5. Acknowledgements</title><p>The authors thank to Mr. Priambodo as laborant at Integrated Centre Laboratory of State Islamic University (UIN JAKARTA) for support in X-Ray Diffraction Characterization.</p></sec><sec id="s6"><title>REFERENCES</title></sec><sec id="s7"><title>NOTES</title></sec></body><back><ref-list><title>References</title><ref id="scirp.29298-ref1"><label>1</label><mixed-citation publication-type="other" xlink:type="simple">C. L. 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