<?xml version="1.0" encoding="UTF-8"?><!DOCTYPE article  PUBLIC "-//NLM//DTD Journal Publishing DTD v3.0 20080202//EN" "http://dtd.nlm.nih.gov/publishing/3.0/journalpublishing3.dtd"><article xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" dtd-version="3.0" xml:lang="en" article-type="research article"><front><journal-meta><journal-id journal-id-type="publisher-id">AMPC</journal-id><journal-title-group><journal-title>Advances in Materials Physics and Chemistry</journal-title></journal-title-group><issn pub-type="epub">2162-531X</issn><publisher><publisher-name>Scientific Research Publishing</publisher-name></publisher></journal-meta><article-meta><article-id pub-id-type="doi">10.4236/ampc.2013.31010</article-id><article-id pub-id-type="publisher-id">AMPC-29287</article-id><article-categories><subj-group subj-group-type="heading"><subject>Articles</subject></subj-group><subj-group subj-group-type="Discipline-v2"><subject>Chemistry&amp;Materials Science</subject><subject> Physics&amp;Mathematics</subject></subj-group></article-categories><title-group><article-title>
 
 
  Synthesis and Analysis of PZT Using Impedance Method of Reactance Estimation
 
</article-title></title-group><contrib-group><contrib contrib-type="author" xlink:type="simple"><name name-style="western"><surname>itsarut</surname><given-names>Sriratana</given-names></name><xref ref-type="aff" rid="aff1"><sup>1</sup></xref><xref ref-type="corresp" rid="cor1"><sup>*</sup></xref></contrib><contrib contrib-type="author" xlink:type="simple"><name name-style="western"><surname>Riichi</surname><given-names>Murayama</given-names></name><xref ref-type="aff" rid="aff1"><sup>1</sup></xref><xref ref-type="corresp" rid="cor1"><sup>*</sup></xref></contrib><contrib contrib-type="author" xlink:type="simple"><name name-style="western"><surname>Lerdlekha</surname><given-names>Tanachaikhan</given-names></name><xref ref-type="aff" rid="aff2"><sup>2</sup></xref><xref ref-type="corresp" rid="cor1"><sup>*</sup></xref></contrib></contrib-group><aff id="aff2"><addr-line>Faculty of Engineering, Ramkhamhaeng University, Bangkok, Thailand.</addr-line></aff><aff id="aff1"><addr-line>Department of Intelligent Mechanical Engineering, Faculty of Engineering, Fukuoka Institute of Technology, Fukuoka, Japan</addr-line></aff><author-notes><corresp id="cor1">* E-mail:<email>kswitsar@kmitl.ac.th(IS)</email>;<email>murayama@fit.ac.jp(RM)</email>;<email>lerdlekha@eng.ru.ac.th(LT)</email>;</corresp></author-notes><pub-date pub-type="epub"><day>21</day><month>03</month><year>2013</year></pub-date><volume>03</volume><issue>01</issue><fpage>62</fpage><lpage>70</lpage><history><date date-type="received"><day>January</day>	<month>28,</month>	<year>2013</year></date><date date-type="rev-recd"><day>February</day>	<month>16,</month>	<year>2013</year>	</date><date date-type="accepted"><day>February</day>	<month>25,</month>	<year>2013</year></date></history><permissions><copyright-statement>&#169; Copyright  2014 by authors and Scientific Research Publishing Inc. </copyright-statement><copyright-year>2014</copyright-year><license><license-p>This work is licensed under the Creative Commons Attribution International License (CC BY). http://creativecommons.org/licenses/by/4.0/</license-p></license></permissions><abstract><p>
 
 
  This study presents an analysis of equivalent circuit namely Butterworth Van Dyke (BVD) [1,2] by using impedance method to stimulate Zirconate Titanate
   (
  Piezoelectric ceramic) which is initially synthesized from Lead Oxide (PbO), Zirconium Dioxide (ZrO<sub>2</sub>) and Titanium Dioxide (TiO<sub>2</sub>) and vibrated in thickness mode. The reactance was estimated in the frequency range lower than the resonance frequency and then compared to the impedance obtained from meas
  urement using impedance analysis machine model HP4192A and HP4194 [
  3
  ]. The results from HP4194 were analyzed for BVD parameters: Motional resistance (R<sub>1</sub>), Inductor (L<sub>1</sub>), Capacitor (C<sub>1</sub>), and Capacitor corresponds to the electro
  static capacitance (C
  <sub>o</sub>
  ). Another accuracy analysis was compared by the calculation results using the method of IEEE 176-1987 [
  4
  ] to the impedance values measured by HP4192A. In this study, there were two conditions for experiment and consideration of parameter variation in BVD equivalent circuit: variation of temperature and mechanical force. These parameters are evaluated to design the efficient circuit for PZT utilization to obtain the optimal efficiency.
 
</p></abstract><kwd-group><kwd>BVD; Capacitance; Force; Frequency; Impedance; Inductance; PZT; Temperature</kwd></kwd-group></article-meta></front><body><sec id="s1"><title>1. Introduction</title><p>Electronic circuit using BVD analysis for effectively stimulating PZT can be designed by adopting, for example, IEEE Standard [4,5], Smits [<xref ref-type="bibr" rid="scirp.29287-ref6">6</xref>], Sherrit [<xref ref-type="bibr" rid="scirp.29287-ref7">7</xref>], and Xu [<xref ref-type="bibr" rid="scirp.29287-ref8">8</xref>]. Smith’s method and Sherrit’s method would consider those parameters as complex numbers. Xu’s method would be similar to Smith’s method which considers the impedance of piezoelectric measured at the frequency values ranging from resonance frequency (f<sub>r</sub>) and antiresonance frequency (f<sub>a</sub>) as well as under mechanical force i.e. elastic, piezoelectric constant and coupling coefficient. In this study, five pieces of PZT, namely O01, N01, N02, N03, and N04, were synthesized from ratio of PbO:ZrO<sub>2</sub>:TiO<sub>2</sub> (100:52:48) and burned at 700˚C for 1 hour [9,10] in order to experiment the density (r), PZT constant (d<sub>33</sub>), dielectric constant (K) at 1 kHz, electromechanical coupling coefficient (k<sub>t</sub>) and mechanical quality factor (Q<sub>m</sub>). In addition, the PZT were utilized in an ultrasonic cleaner.</p></sec><sec id="s2"><title>2. Theory and Fundamental Method</title><sec id="s2_1"><title>2.1. Equivalent Circuit of BVD</title><p>Electrical characteristics in thickness mode of PZT [<xref ref-type="bibr" rid="scirp.29287-ref3">3</xref>] tested in this study were comparable to the BVD equivalent circuit, which consists of R<sub>1</sub> connected serially to C<sub>1</sub></p><p>and L<sub>1</sub> then all parallelly connected to C<sub>o</sub> [1,2,11] as shown in <xref ref-type="fig" rid="fig1">Figure 1</xref>(a). The resistance, the capacitance, and the inductance were comparable to the force friction (h), spring constant (k), and mass, respectively as shown in <xref ref-type="fig" rid="fig1">Figure 1</xref>(b).</p><p>Assuming R<sub>1</sub>, C<sub>1</sub>, L<sub>1</sub>, and C<sub>o</sub> were constants and independent on frequency and impedance [<xref ref-type="bibr" rid="scirp.29287-ref5">5</xref>] as given in Equation (1), the impedance equation at PZT resonance frequency (Z<sub>r</sub>), f<sub>r</sub> and f<sub>a</sub>, in terms of BVD relating parameters was obtained. In <xref ref-type="fig" rid="fig2">Figure 2</xref>, the impedance responding to f<sub>r</sub> and f<sub>a</sub> of PZT is shown.</p><disp-formula id="scirp.29287-formula17235"><label>(1)</label><graphic position="anchor" xlink:href="10-1510141\e05988a0-dd22-4b14-9324-c6eb1896b991.jpg"  xlink:type="simple"/></disp-formula><p>The calculation of BVD circuit using impedance method by the capacitor ratio (r) is as shown in Equation (2), where w<sub>a</sub> is the angular velocity of the anti-resonance frequency (2pf<sub>a</sub>) and w<sub>r</sub> is the angular velocity of the resonance frequency (2pf<sub>r</sub>).</p><disp-formula id="scirp.29287-formula17236"><label>(2)</label><graphic position="anchor" xlink:href="10-1510141\9fc778f8-544a-42ba-8f09-446880228110.jpg"  xlink:type="simple"/></disp-formula><p>The reactance values of C<sub>1</sub> and L<sub>1</sub> in BVD circuit at low frequency range was observed. It was noted that the reactance of PZT was performed as a capacitor as shown in Equation (3).</p><disp-formula id="scirp.29287-formula17237"><label>(3)</label><graphic position="anchor" xlink:href="10-1510141\d0cef85e-8ea7-4b46-9e8f-680781c28ef2.jpg"  xlink:type="simple"/></disp-formula><p>Therefore,</p><disp-formula id="scirp.29287-formula17238"><label>(4)</label><graphic position="anchor" xlink:href="10-1510141\18a6b9c2-bfa2-45ec-984d-1be37c0c467f.jpg"  xlink:type="simple"/></disp-formula><p>Then the impedance equation of PZT can be revised as shown in Equation (5).</p><disp-formula id="scirp.29287-formula17239"><label>(5)</label><graphic position="anchor" xlink:href="10-1510141\b6741ae4-241c-4700-aeed-49ae23330718.jpg"  xlink:type="simple"/></disp-formula><p>C<sub>1</sub> can be calculated as given in Equation (6) by choosing the impedance measured at low frequency range where w is the angular velocity of the selected frequency and R is |Z| measured at resonance frequency.</p><disp-formula id="scirp.29287-formula17240"><label>(6)</label><graphic position="anchor" xlink:href="10-1510141\a6e85d29-6565-4884-9b3b-4574317c5e12.jpg"  xlink:type="simple"/></disp-formula></sec><sec id="s2_2"><title>2.2. Measurement of Dielectric Constant (K)</title><p>Measurement of K or relative permittivity (e<sub>r</sub>) of PZT is to test for the electrical characteristics which can be calculated by using Equation (7), where C<sub>f </sub>is the capacitance at 1 kHz, t is the thickness of PZT measured from both metal poles, A is the area of metal pole, and e<sub>o</sub> is the dielectric constant of vacuum. The dielectric constant can be varied depending on the temperature (T) of substance based on Curie-Weiss Law [<xref ref-type="bibr" rid="scirp.29287-ref12">12</xref>] where T<sub>c</sub> is the temperature of PZT with zero polarization, and C is Curie constant (10<sup>3</sup> to 10<sup>5</sup>) as given in Equation (8).</p><disp-formula id="scirp.29287-formula17241"><label>(7)</label><graphic position="anchor" xlink:href="10-1510141\fd0d0b53-7cf4-4cd8-8955-f2221418feb8.jpg"  xlink:type="simple"/></disp-formula><disp-formula id="scirp.29287-formula17242"><label>(8)</label><graphic position="anchor" xlink:href="10-1510141\b9b5fbca-ac32-4416-9f73-6ba2692fa1a5.jpg"  xlink:type="simple"/></disp-formula><p>Equations (7) and (8) can also be revised as shown in Equation (9).</p><disp-formula id="scirp.29287-formula17243"><label>(9)</label><graphic position="anchor" xlink:href="10-1510141\7c128ddf-3f08-4d01-aaac-e1984ecb1d33.jpg"  xlink:type="simple"/></disp-formula></sec><sec id="s2_3"><title>2.3. Measurement of PZT Constant (d<sub>33</sub>)</title><p>The value of d<sub>33</sub>, measured by Piezo-D meter model CADT (Channel Products Inc.), implies the ability to emit the electric charge of PZT when it is stimulated by mechanical force. Number 33 represents the three perpendicular directions of compression force on PZT.</p></sec><sec id="s2_4"><title>2.4. Measurement of Electromechanical Coupling Coefficient (k<sub>t</sub>)</title><p>Electromechanical coupling coefficient (k<sub>t</sub>) represents the efficiency of transformation from electrical energy to mechanical force. In Equation (10), Δf is the difference between f<sub>r</sub> and f<sub>a</sub>.</p><disp-formula id="scirp.29287-formula17244"><label>(10)</label><graphic position="anchor" xlink:href="10-1510141\9e6bd7c6-75c0-4797-a3d9-44bafc8442db.jpg"  xlink:type="simple"/></disp-formula></sec><sec id="s2_5"><title>2.5. Measurement of Mechanical Quality Factor (Q<sub>m</sub>)</title><p>Q<sub>m </sub>represents the maximum ability of mechanical vibration in f<sub>r</sub> range where R<sub>1</sub> is the impedance at resonance frequency as given in Equation (11).</p><disp-formula id="scirp.29287-formula17245"><label>(11)</label><graphic position="anchor" xlink:href="10-1510141\f61681cf-8d6a-401e-89cd-47c15cff0df9.jpg"  xlink:type="simple"/></disp-formula></sec></sec><sec id="s3"><title>3. Analysis of BVD Equivalent Circuit</title><p>The PZT with 40 mm of diameter and 3 mm of thickness is electrode by silver paste at the top and the bottom as shown in <xref ref-type="fig" rid="fig3">Figure 3</xref>, and then connected to the system as</p><p>shown in <xref ref-type="fig" rid="fig4">Figure 4</xref>. The HP Vee program is applied to control the impedance analyzer model HP4192A via HP-IB interface and collect the impedance at 100 Hz to 1.3 MHz [<xref ref-type="bibr" rid="scirp.29287-ref4">4</xref>]. Then, the resonance frequency and the impedance at resonance frequency and lower resonance frequency will be applied to calculate R, L, and C<sub>o</sub>. The calculated value will be evaluated and compared with the value calculated by using Equation (1). In this paper, only the fundamental resonance is considered regardless the resonance frequency at harmonic period.</p><p>From experiment and measurement of PZT impedance, the calculated parameters from BVD model are as shown in <xref ref-type="table" rid="table1">Table 1</xref>. Figures 5 and 6 are illustrated the comparison of size (|Z|m) and phase of the impedance at 100 Hz to 100 kHz measured by impedance analyzer model HP4192A and the calculated impedance (|Z|cal and Phase Cal). The impedance at 1 kHz is selected to calculate in Equation (6). To obtain the appropriate value of C, the impedance at lower resonance frequency is suggested such as 100 Hz, 1 kHz, 2 kHz, 3 kHz, 6 kHz, and 14 kHz. The BVD parameters are as shown in <xref ref-type="table" rid="table2">Table 2</xref> and the percentage of error is shown in <xref ref-type="fig" rid="fig7">Figure 7</xref>.</p></sec><sec id="s4"><title>4. Experiment of PZT under Temperature Control</title><p>Physical characteristics of PZT were experimented by considering r, PZT constant (d<sub>33</sub>), k<sub>t</sub>, and Q<sub>m</sub> of electrical charge at 1 kHz. In this study, only the results from N01 and N04 (details are given in <xref ref-type="table" rid="table3">Table 3</xref>) were compared under room and controlled temperatures. <xref ref-type="fig" rid="fig8">Figure 8</xref> shows</p><p>the PZT experimental system connected with impedance analysis model HP4192A under temperature conditions.</p><p>Measuring the PZT impedance under room temperature was for assessing the influences of temperature on PZT impedance and comparing the results under room temperature and controlled temperature at various frequency. Figures 9 and 10 illustrate the PZT impedance</p><p><xref ref-type="table" rid="table1">Table 1</xref>. The PZT properties.</p><p><img src="10-1510141\abacb6e4-3816-40a5-a7e9-45c041c5ed99.jpg" /></p><p><xref ref-type="table" rid="table2">Table 2</xref>. Calculated parameters of BVD circuit at 100 Hz, 1 kHz, 2 kHz, 3 kHz, 6 kHz, and 14 kHz.</p><p><img src="10-1510141\bb24e6c9-fe41-4d10-ad31-7e6af71c43eb.jpg" /></p><p><xref ref-type="table" rid="table3">Table 3</xref>. Physical and electrical characteristics of PZT (N01 and N04).</p><p>of N01 and N04 repeatedly measured 5 times by impedance analysis model HP4192A under room temperature at the frequency of 1 kHz to 80 kHz.</p><p>PZT was experimented by placing on heater plate in vacuum chamber under controlled temperature. The temperature can be controlled by a program developed on HP Vee via HP-IB port as shown in <xref ref-type="fig" rid="fig1">Figure 1</xref>1. The temperature was varied from 25˚C to 230˚C with 20˚C</p><p>interval of measurement and the frequency was varied from 2 kHz to 80 kHz. Uncertainty of measurement and PZT was estimated by repeating 3 times of measurement.</p><sec id="s4_1"><title>4.1. Experimental Results under Temperature Conditions</title><p>The impedance of PZT in temperature controlled chamber (only N01) under specific temperature was similar to that under room temperature. However, it was observed that f<sub>r </sub>and f<sub>a </sub>were drifted. At 230˚C, f<sub>r</sub> increased about &#187;1.6 kHz while f<sub>a </sub>decreased about &#187;1 kHz. Therefore, the difference between f<sub>r</sub> and f<sub>a</sub><sub> </sub>decreased about 2.6 kHz as shown in <xref ref-type="fig" rid="fig1">Figure 1</xref>2. Moreover, when the temperature was increasing, the impedance at f<sub>r</sub><sub> </sub>was also increasing up until 190˚C and then starting to decrease as illustrated in <xref ref-type="fig" rid="fig1">Figure 1</xref>3.</p></sec><sec id="s4_2"><title>4.2. Analysis of Impedance Variation in the Range of 100 Hz to 10 kHz</title><p>Experiment of PZT in the range of 100 Hz to 10 kHz was to calculate the impedance of BVD circuit by repeatedly measuring 30 times. An average and standard deviation of impedance are given in Figures 14 and 15, respectively. It can be noted that the standard deviation would increase at low frequency range and decrease as the frequency is rising.</p></sec><sec id="s4_3"><title>4.3. Calculation of BVD Circuit Using Impedance Method</title><p>To calculate BVD circuit, average experimental values of f<sub>r</sub>, f<sub>a</sub>, and Z<sub>r</sub> at selected frequency ranging from 0.1 kHz to 10 kHz were used and then BVD parameters were obtained. The results were ranged as follows: L<sub>1</sub> &#187; 0.16 mH to 0.2 mH, C<sub>1</sub> &#187; 0.018 nF to 0.040 nF, C<sub>o</sub> &#187; 0.06 nF to 0.18 nF. However, R<sub>1</sub> was uniform due to the identical impedance at f<sub>r</sub> as shown in <xref ref-type="table" rid="table4">Table 4</xref>.</p></sec><sec id="s4_4"><title>4.4. Influences of Temperature Variation on BVD Parameters</title><p>When PZT was placed in the temperature controlling chamber at 23˚C, C<sub>1</sub> would be decrease by 72% or 0.726%/˚C that leads to 255% of increase in L<sub>1</sub>. Therefore, the temperature would directly influence the char-</p><p><xref ref-type="table" rid="table4">Table 4</xref>. BVD calculating parameters of N01 and N04 using impedance method.</p><p><img src="10-1510141\9d3e3977-ac6f-40b5-9da1-339895fbbe14.jpg" /></p><p>where s is the standard deviation.</p><p>acteristics of PZT as provided in <xref ref-type="table" rid="table5">Table 5</xref>.</p></sec></sec><sec id="s5"><title>5. Experiment of PZT under Mechanical Force</title><p>The parameters which was use in consideration of physical and electrical characteristics of PZT consists of r, d<sub>33</sub>, k<sub>t</sub>, and Q<sub>m</sub> at 1 kHz. In this case, comparison of N02 and N03 is as shown in <xref ref-type="table" rid="table6">Table 6</xref>.</p><p>Measurement of Z<sub>r</sub> under mechanical force was performed by using 0.5 lbs, 1.0 lbs, and 1.5 lbs of brass standard weights at room temperature. Each measurement was varied the frequency starting from 2 kHz to 80 kHz and repeated 30 times for calculating an average value. Figures 16(a) and (b) illustrate the experimental system and the brass standard weights, respectively.</p><p><xref ref-type="table" rid="table5">Table 5</xref>. Percentage of BVD parameter changes as PZT temperature increasing by 230˚C.</p><p><img src="10-1510141\9e6161f5-e1b7-4670-addd-07708dc29352.jpg" /></p><p><xref ref-type="table" rid="table6">Table 6</xref>. Physical and electrical characteristics of PZT (N02 and N03).</p><p><img src="10-1510141\b435cdc5-b8b6-48e9-acd4-5b6b75357a96.jpg" /></p><sec id="s5_1"><title>5.1. Experiment of PZT at f<sub>r</sub></title><p>Standard weights (0.5 lbs, 1.0 lbs, and 1.5 lbs) were pressed to estimate f<sub>r</sub>, f<sub>a</sub>, and Z<sub>r</sub> as shown in <xref ref-type="table" rid="table7">Table 7</xref> compared to weightless condition. The comparison was shown in <xref ref-type="table" rid="table8">Table 8</xref>. It can be noted that PZT pressed by 1.5 lbs standard weight would express higher f<sub>r</sub> and f<sub>a</sub> by &#187;0.24 kHz and 2 kHz, respectively. However, Z<sub>r</sub> would be varied by the weight pressing and become stable at &#187;6.5 W.</p></sec><sec id="s5_2"><title>5.2. Experiment of Z<sub>r</sub> of PZT Connected Serially with Specific Capacitors</title><p>A capacitor (1.097 nF, 1.46 nF, 1.92 nF, 4.48 nF, 5.92 nF, 8.97 nF, and 33.016 nF) was connected serially with a given PZT (N02 and N03) and then, f<sub>r</sub>, f<sub>a</sub>, and Z<sub>r</sub><sub> </sub>were</p><p><xref ref-type="table" rid="table7">Table 7</xref>. f<sub>r</sub>, f<sub>a</sub>, and Z<sub>r</sub> of PZT under mechanical force loads.</p><p><img src="10-1510141\73eab884-0298-47ae-bb14-55ca12b76920.jpg" /></p><p><xref ref-type="table" rid="table8">Table 8</xref>. Variation of f<sub>r</sub>, f<sub>a</sub>, and Z<sub>r</sub> of PZT under mechanical force loads.</p><p><img src="10-1510141\03685041-d3b8-49af-8051-176570ca0b70.jpg" /></p><p>measured. The relationships of f<sub>s</sub>/2 (f<sub>sCL</sub>-f<sub>s</sub>) are as illustrated in Figures 17-20 where f<sub>s</sub> is the serial resonance frequency based on IEEE method [4,5]. The slope of linear relationship is 1/C<sub>1</sub> as shown in <xref ref-type="table" rid="table9">Table 9</xref>.</p></sec><sec id="s5_3"><title>5.3. Calculation of BVD Using Impedance Method</title><p>The average values of f<sub>r</sub>, f<sub>a</sub>, and Z<sub>r</sub> at resonance frequency obtained from experiments of N02 and N03 were used for analyzing BVD. By selecting the frequency ranging from 0.1 kHz to 10 kHz, it can be observed that</p><p><xref ref-type="table" rid="table9">Table 9</xref>. Slopes of f<sub>s</sub>/2(f<sub>sCL</sub>-f<sub>s</sub>).</p><p><img src="10-1510141\a271e69d-b714-4375-b481-406cbac9174e.jpg" /></p><p>C<sub>o</sub> &#187; 0.06 nF, C<sub>1</sub> &#187; 0.018 nF, L<sub>1</sub> &#187; 0.184 mH to 0.190 mH while R<sub>1</sub> was identical due to the same impedance at f<sub>r</sub> as given in <xref ref-type="table" rid="table1">Table 1</xref>0. The <xref ref-type="table" rid="table1">Table 1</xref>1 shows the comparison of BVD parameters calculated by using impedance method, IEEE method, and HP4194 where IEEE method is the method of IEEE 176-1987, Δ<sub>1 </sub>is the percentage of difference between values obtained from impedance and IEEE 176-1987 method, and Δ<sub>2</sub> is the percentage of difference between values obtained from impedance and HP4194 method.</p></sec><sec id="s5_4"><title>5.4. Influences of Temperature on BVD Parameters under Mechanical Force</title><p>Variation of f<sub>r</sub>, f<sub>a</sub>, and Z<sub>r</sub> when PZT was pressed by standard weights was calculated for C<sub>o</sub>, C<sub>1</sub>, and L<sub>1</sub> by impedance method. The differences are given in <xref ref-type="table" rid="table1">Table 1</xref>2.</p></sec></sec><sec id="s6"><title>6. Conclusion</title><p>From calculation, it was observed that |Z| and Z(θ) of the impedance ranging from low frequency to f<sub>r</sub> and f<sub>a</sub> tended to be equal to the impedance measured by impedance analysis model HP4192A. Selecting low frequency range (100 Hz, 1 kHz, and 2 kHz) for calculating C would cause the error of |Z| by &#187;−1%, On the other hand, selecting the impedance and frequency at 3 kHz the error would be exhibit less than 1%. However, the impedance and frequency at 14 kHz would exhibit the greater error by &#187;5% because wL can much influence the impedance while 1/wL decreases. Therefore, the impedance selected for calculating should have the frequency lower than<img src="10-1510141\6aa3c08e-7884-4162-a207-27869c20cf22.jpg" />. Considering the percentage of impedance error, it can noted that the impedance at the frequency of 100 Hz, 1 kHz, and 2 kHz would provide the similar results with 20% - 25% of the maximum error of f<sub>a</sub>. From experiment of the calculated impedance, the accuracy of f<sub>r</sub> and f<sub>a</sub> was &#177;0.0033 kHz with the standard deviation of 0.00129 kHz which would be reliable for calculating BVD circuit. From experiment of accuracy which was compared between Z<sub>r</sub> of BVD equivalent circuit and Z<sub>r</sub> from measurement, it can be noted that Z<sub>r</sub> at f<sub>r</sub> of BVD circuit calculated by impedance method and IEEE 176-1987 would exhibit the error by &#187;2.37% which was lower than HP4194 method (&#187;4%). It would be because the impedance analysis using impedance analysis model HP4192A is applied the program to estimate f<sub>r</sub> more accurately. However, R<sub>1</sub> was less different as it was a specific resistance at resonance frequency. Considering the influence of temperature on PZT characteristic, it was noted that the increase of temperature would contribute to less difference of f<sub>r</sub> and f<sub>a</sub>.</p><p><xref ref-type="table" rid="table1">Table 1</xref>0. Calculation of BVD parameters based on impedance method: a case of N02 and N03.</p><p><img src="10-1510141\b747a760-8a16-426b-a22e-ba799913825b.jpg" /></p><p><xref ref-type="table" rid="table1">Table 1</xref>1. Comparison of average BVD parameters from each method.</p><p><img src="10-1510141\52c93c63-6fb3-4453-8e09-230d0795f2ca.jpg" /></p><p><xref ref-type="table" rid="table1">Table 1</xref>2. Percentage of BVD parameter variation with 1.5 lbs standard weight pressing.</p><p><img src="10-1510141\3735223d-d26c-416d-a60b-a0b372961d18.jpg" /></p><p>However, the increase of Z<sub>r</sub> would cause the variation of BVD calculated parameters such as decrease of C<sub>1</sub>, increase of R<sub>1</sub>, L<sub>1</sub>, and C<sub>o</sub>. On the other hand, the influences of mechanical force load on PZT parameters would cause f<sub>r</sub>, f<sub>a</sub>, and Z<sub>r</sub> increase that also contribute to R<sub>1 </sub>and C<sub>1 </sub>increase while L<sub>1 </sub>and C<sub>o</sub><sub> </sub>decrease.</p></sec><sec id="s7"><title>REFERENCES</title></sec></body><back><ref-list><title>References</title><ref id="scirp.29287-ref1"><label>1</label><mixed-citation publication-type="other" xlink:type="simple">S. Sherrit, H. D. Wiederick and B. K. Mukherjee, “Accurate Equivalent Circuits for Unloaded Piezoelectric Resonators,” IEEE Ultrasonics Symposium Proceedings, Vol. 2, 1997, pp. 931-935.</mixed-citation></ref><ref id="scirp.29287-ref2"><label>2</label><mixed-citation publication-type="other" xlink:type="simple">S. Sherrit, H. D. Wiederick, B. K. Mukherjee and M. Sayer, “An Accurate Equivalent Circuits for the Unloaded Piezoelectric Vibrator in the Thickness Mode,” Journal of Physics D: Applied Physics, Vol. 30, No. 16, 1997, pp. 2354-2363. doi:10.1088/0022-3727/30/16/014</mixed-citation></ref><ref id="scirp.29287-ref3"><label>3</label><mixed-citation publication-type="other" xlink:type="simple">C. Jeerapan, W. Sriratana, P. Julsereewong and S. Kummool, “Analysis of Appropriate Parameters for Piezoelectric Ceramic Utilization by Using BVD Model,” ICCAS 2005, International Conference on Control, Automation and System, Gyeonggi-Do, 2-5 June 2005, pp. 2067-2070.</mixed-citation></ref><ref id="scirp.29287-ref4"><label>4</label><mixed-citation publication-type="other" xlink:type="simple">“An American National Standard IEEE Standard on Piezoelectricity,” IEEE Ultrasonics, Ferroelectrics, and Frequency Control Society, New York, 1988, ANSI/IEEE Std 176-1987.</mixed-citation></ref><ref id="scirp.29287-ref5"><label>5</label><mixed-citation publication-type="other" xlink:type="simple">“Standard Definitions and Method of Measurement for Piezoelectric Vibrators,” The Institute of Electrical and Electronics Engineers Inc., New York, 1966, IEEE No. 177.</mixed-citation></ref><ref id="scirp.29287-ref6"><label>6</label><mixed-citation publication-type="other" xlink:type="simple">J. G. Smits, “Iterative Method for Accurate Determination of Real and Imaginary Parts of the Materials Coefficients of Piezoelectric Ceramics,” IEEE Transactions on Sonics and Ultrasonics, Vol. 23, No. 6, 1976, pp. 393-402. 
doi:10.1109/T-SU.1976.30898</mixed-citation></ref><ref id="scirp.29287-ref7"><label>7</label><mixed-citation publication-type="other" xlink:type="simple">S. Sherrit, H. D. Wiederick and B. K. Mukherjee, “NonIterative Evaluation of the Real and Imaginary Material Constants of Piezoelectric Resonators,” Ferroelectrics, Vol. 134, No. 1-4, 1992, pp. 111-119.  
doi:10.1080/00150199208015574</mixed-citation></ref><ref id="scirp.29287-ref8"><label>8</label><mixed-citation publication-type="other" xlink:type="simple">Q. C. Xu, A. R. Ramachandran and R. E. Newnham, “Resonance Measuring Technique for Complex Coefficients of Piezoelectric Composites,” Journal of Wave-Material Interaction, Vol. 2, 1987, pp. 105-122.</mixed-citation></ref><ref id="scirp.29287-ref9"><label>9</label><mixed-citation publication-type="other" xlink:type="simple">B. Jaffe, W. R. Cook Jr and H. Jaffe, “Piezoelectric Ceramics,” Journal of Sound and Vibration, Vol. 20, No. 4, 1972, pp. 562-563.</mixed-citation></ref><ref id="scirp.29287-ref10"><label>10</label><mixed-citation publication-type="other" xlink:type="simple">T. Ikeda, “Fundamentals of Piezoelectricity,” 19th Edition, Oxford University Press, New York, 1990.</mixed-citation></ref><ref id="scirp.29287-ref11"><label>11</label><mixed-citation publication-type="other" xlink:type="simple">S. Fujishima, K. Togawa and S. Ohta, “Analysis and Design of the Piezoelectric Ceramic Resonator Osillators,” 41st Annual Symposium on Frequency Control, Pennsylvania, 27-29 May 1987, pp. 391-397. 
doi:10.1109/FREQ.1987.201052</mixed-citation></ref><ref id="scirp.29287-ref12"><label>12</label><mixed-citation publication-type="other" xlink:type="simple">M. Trainer, “Ferroelectrics and the Curie-Weiss Law,” European Journal of Physics, Vol. 21, No. 5, 2000, pp. 459-469. doi:10.1088/0143-0807/21/5/312</mixed-citation></ref></ref-list></back></article>