<?xml version="1.0" encoding="UTF-8"?><!DOCTYPE article  PUBLIC "-//NLM//DTD Journal Publishing DTD v3.0 20080202//EN" "http://dtd.nlm.nih.gov/publishing/3.0/journalpublishing3.dtd"><article xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" dtd-version="3.0" xml:lang="en" article-type="research article"><front><journal-meta><journal-id journal-id-type="publisher-id">JSEMAT</journal-id><journal-title-group><journal-title>Journal of Surface Engineered Materials and Advanced Technology</journal-title></journal-title-group><issn pub-type="epub">2161-4881</issn><publisher><publisher-name>Scientific Research Publishing</publisher-name></publisher></journal-meta><article-meta><article-id pub-id-type="doi">10.4236/jsemat.2013.31006</article-id><article-id pub-id-type="publisher-id">JSEMAT-27329</article-id><article-categories><subj-group subj-group-type="heading"><subject>Articles</subject></subj-group><subj-group subj-group-type="Discipline-v2"><subject>Chemistry&amp;Materials Science</subject><subject> Engineering</subject></subj-group></article-categories><title-group><article-title>
 
 
  Role of Substrate Temperatures on Structural, Optical, Wetting and Electrical Transport Properties of CdS Thin Films
 
</article-title></title-group><contrib-group><contrib contrib-type="author" xlink:type="simple"><name name-style="western"><surname>.</surname><given-names>D. More</given-names></name><xref ref-type="aff" rid="aff1"><sub>1</sub></xref><xref ref-type="corresp" rid="cor1"><sup>*</sup></xref></contrib></contrib-group><aff id="aff1"><label>1</label><addr-line>Materials Research Laboratory, Department of Physics, Ahmednagar College, Ahmednagar, India</addr-line></aff><author-notes><corresp id="cor1">* E-mail:<email>drpravinmore@gmail.com</email></corresp></author-notes><pub-date pub-type="epub"><day>29</day><month>01</month><year>2013</year></pub-date><volume>03</volume><issue>01</issue><fpage>43</fpage><lpage>47</lpage><history><date date-type="received"><day>September</day>	<month>20th,</month>	<year>2012</year></date><date date-type="rev-recd"><day>October</day>	<month>20th,</month>	<year>2012</year>	</date><date date-type="accepted"><day>October</day>	<month>25th,</month>	<year>2012</year></date></history><permissions><copyright-statement>&#169; Copyright  2014 by authors and Scientific Research Publishing Inc. </copyright-statement><copyright-year>2014</copyright-year><license><license-p>This work is licensed under the Creative Commons Attribution International License (CC BY). http://creativecommons.org/licenses/by/4.0/</license-p></license></permissions><abstract><p>
 
 
  Cadmium sulphide thin films were deposited on the glass substrate via simple spray pyrolysis technique. The substrate temperatures (T<sub>s</sub>) have been varied from 250℃ 
  to 350℃ and concentration of precursor’s solution of cadmium chloride and thiourea was optimized. The X-ray patterns and morphological studies of CdS thin films indicated that films are crystalline in nature with hexagonal crystal structure. The grain size calculated and found to be 250.12 to 349.61 nm. The optical spectra exhibited high transmittance and band gap varied from 2.41 eV to 2.39 eV. The angle of contact measured and found to be hydrophilicity behaviour. The electrical conductivity and thermoelectric power have been measured with two probe method. It was found that CdS thin films were semiconducting in nature with n
  -
  type
  .
   
 
</p></abstract><kwd-group><kwd>CdS Thin Film; Spray Pyrolysis; Band Gap; Contact Angle</kwd></kwd-group></article-meta></front><body><sec id="s1"><title>1. Introduction</title><p>The use of semiconducting materials in the form of thin films now a day’s occupy prominent place in the basic as well as applied research. It is a technologically useful material due to wide band gap of 2.42 eV, as many devices such as electronic devices including light emitting diodes, single electron transistors and field effect transistor [<xref ref-type="bibr" rid="scirp.27329-ref1">1</xref>] sensors [<xref ref-type="bibr" rid="scirp.27329-ref2">2</xref>] window materials [<xref ref-type="bibr" rid="scirp.27329-ref3">3</xref>]. CdS solar cell has several years been considered to be a promising alternative to the more widely used silicon devices [<xref ref-type="bibr" rid="scirp.27329-ref4">4</xref>]. The efficiency and performance of the devices depends on the optical and electrical properties of the thin films. So that attempt tried to understand the role of substrate temperatures on structural, optical, wetting and electrical transport properties of CdS thin films.</p><p>Thin film of CdS has been prepared by several methods including Vacuum [<xref ref-type="bibr" rid="scirp.27329-ref5">5</xref>] sputtering [<xref ref-type="bibr" rid="scirp.27329-ref6">6</xref>] spray pyrolysis [7,8] chemical bath deposition [<xref ref-type="bibr" rid="scirp.27329-ref9">9</xref>]. The interest to nonvacuum methods for thin films deposition has increased. The solution based processes have several advantages viz: simplicity of process, precise composition, applicability to substrates of any size. These are important for practical applications. The SPD meets practically all the requirements to the methods for the films deposition on large substrate [<xref ref-type="bibr" rid="scirp.27329-ref10">10</xref>].</p></sec><sec id="s2"><title>2. Methodology</title><p>Cadmium sulphide thin films were deposited via spray pyrolysis technique using aqueous solution of cadmium chloride (CdCl<sub>2</sub> of 0.1 M) and thiourea (NH<sub>2</sub>CSNH<sub>2</sub> of 0.2 M) at 250˚C, 300˚C and 350˚C substrate temperatures. The substrate was cleaned by ultrasonic cleaner. The samples were deposited by spraying 30 ml prepared solution at the rate of 5 ml/min using air as a carrier gas. The nozzle to substrate distance was kept around 22 cm.</p><p>The structural properties of CdS studied by X-ray diffraction (XRD) using filtered CuKα radiation (λ = 1.5406 &#197;). The surface morphologies of the CdS thin films carried out by scanning electron microscope operating at 25 KV. The optical studies carried in the range of 300 - 950 nm wavelengths. Contact angle of CdS were measured using standard goniometer (Ramehart Instrument Co., USA) equipped with CCD camera.</p></sec><sec id="s3"><title>3. Results and Discussion</title><sec id="s3_1"><title>3.1. X-Ray Diffraction Studies</title><p>X-ray diffraction patterns of CdS films deposited at 250˚C, 300˚C and 350˚C substrate temperatures as shown in <xref ref-type="fig" rid="fig1">Figure 1</xref>. It is observed that XRD pattern showed preferential orientations along (100), (002) and (101) additionally (110), (103) and (201) directions. All the diffraction peaks can be indexed to a hexagonal structured. No obvious characteristic diffraction peaks from other impurities can be detected. From XRD studies it is clear that the intensity of peaks is function of substrate temperature and suggests that as deposited CdS films are crystalline</p><p>in nature which is similar to reported in the literature [7,8].</p><p><xref ref-type="fig" rid="fig2">Figure 2</xref> shows the variation in intensity. The lattice parameters were calculated from the XRD data and are found to be close agreement with the JCPD data [<xref ref-type="bibr" rid="scirp.27329-ref11">11</xref>]. The grain size were calculated at q = 27.55˚ by using Scherer’s relation and listed in <xref ref-type="table" rid="table1">Table 1</xref>.</p></sec></sec></body><back><ref-list><title>References</title><ref id="scirp.27329-ref1"><label>1</label><mixed-citation publication-type="other" xlink:type="simple">Y. Ni, H. Liu, F. Wang, Y. Liang, J. Hong, X. Ma and Z. Xu, “PbS Crystal with Clover like Structure: Preparation, Characterization, Optical Properties and Influencing Factors,” Crystal Research and Technology, Vol. 39, No. 3, 2004, pp. 200-206.</mixed-citation></ref><ref id="scirp.27329-ref2"><label>2</label><mixed-citation publication-type="other" xlink:type="simple">K. M. Garadkar, A. A. Patil, P. V. Korake and P. P. Hankare, “Characterization of CdS Thin Films Synthesized by SILAR Method at Room Temperature,” Archives of Applied Science Research, Vol. 2, No. 5, 2010, pp. 429-437.</mixed-citation></ref><ref id="scirp.27329-ref3"><label>3</label><mixed-citation publication-type="other" xlink:type="simple">N. I. Achuko and C. C. Ugwuegbu, “Optical Properties of CdS Thin Films Obtained by Chemical Bath Deposition,” International Journal of Academic Research, Vol. 6, 2011, pp. 368-374.</mixed-citation></ref><ref id="scirp.27329-ref4"><label>4</label><mixed-citation publication-type="other" xlink:type="simple">J. Barman, J. P. Borach and K. C. Sarma, “Effect of pH Variation on Size and Structure of CdS Nanocrystalline Thin Films,” Chalcoginide Letters, Vol. 11, No. 5, 2008, pp. 265-266.</mixed-citation></ref><ref id="scirp.27329-ref5"><label>5</label><mixed-citation publication-type="other" xlink:type="simple">K. K. Singh, M. Kar and H. L. Das, “Effect of Substrate Temperature on Photoconductivity in CdS Thin Films,” Indian .Journal of Pure &amp; Applied Physics, Vol. 48, No. 2, 2010 pp.110-114.</mixed-citation></ref><ref id="scirp.27329-ref6"><label>6</label><mixed-citation publication-type="other" xlink:type="simple">S.-G. Hur and E.-T. Kim, J.-H. Lee, G.-H. Kim and S.-G. Yoon, “Characterization of Photoconductive CdS Thin Films Prepared on Glass Substrates for Photoconductive Sensor Applications,” Journal of Vacuum Science &amp; Technology B, Vol. 26, No. 4, 2008, pp.1334-1337.  
doi:10.1116/1.2945301</mixed-citation></ref><ref id="scirp.27329-ref7"><label>7</label><mixed-citation publication-type="other" xlink:type="simple">A. Ashour, “Physical Properties of Spray Pyrolysed CdS Thin Films,” Turkish Journal of Physics, Vol. 27, No. 6, 2003, pp. 551-558.</mixed-citation></ref><ref id="scirp.27329-ref8"><label>8</label><mixed-citation publication-type="other" xlink:type="simple">C. S. Tepantlan, “Structural, Optical and Electrical Properties of CdS Thin Films by Spray Pyrolysis,” Revista Mexcana de Fisica, Vol. 54, No. 2, 2008, pp. 112-117.</mixed-citation></ref><ref id="scirp.27329-ref9"><label>9</label><mixed-citation publication-type="other" xlink:type="simple">J. Barman, K. C. Sarma, M. Sarma and K. Sarma, “Structural and Optical Studies of Chemically Prepared CdS Nanocrystalline Thin Films,” Indian Journal of Pure and Applied Physics, Vol. 46, 2008, pp.339-343.</mixed-citation></ref><ref id="scirp.27329-ref10"><label>10</label><mixed-citation publication-type="other" xlink:type="simple">D. Todorvsky, R. Todorvsky, N. Petrova, M. U._Bojnova and M. Milanova, “Spray-Pyrolysis, Deep- and Spin-Coating Deposition of Thin Films and Their Characteristics,” Journal of the University of Chemical Technology and Metallurgy, Vol. 41, No. 1, 2006, pp. 93-96.</mixed-citation></ref><ref id="scirp.27329-ref11"><label>11</label><mixed-citation publication-type="other" xlink:type="simple">JCPD Card No. 75-1545.</mixed-citation></ref><ref id="scirp.27329-ref12"><label>12</label><mixed-citation publication-type="other" xlink:type="simple">Y. Akaltun, M. A. Yildir?m, A. Ates and M. Yildirim, “The Relationship between Refractive Index-Energy Gap and the Film Thickness Effect on the Characteristic Parameters of CdSe Thin Films,” Optics Communications, Vol. 284, 2011, pp. 2307-2311. </mixed-citation></ref><ref id="scirp.27329-ref13"><label>13</label><mixed-citation publication-type="other" xlink:type="simple">P. D. More, G. S. Shahane, L. P. Deshmukh and P. N. Bhosale, “Spectro-Structural Characterisation of Cd (Se, Te) Alloyed Thin Film,” Materials Chemistry and Physics, Vol. 80, 2003, pp. 48-51.</mixed-citation></ref><ref id="scirp.27329-ref14"><label>14</label><mixed-citation publication-type="other" xlink:type="simple">D. P. Dubal, D. S. Dhawale, R. R. Salunkhe, S. M. Pawar, V. J. Fulari and C. D. Lokhande, “A Novel Chemical Synthesis of Interlocked Cubes of Hausmannite Mn3O4 Thin Films for Supercapacitor Application,” Journals of Alloys and Compounds, Vol. 848, 2009, pp. 218-221.</mixed-citation></ref><ref id="scirp.27329-ref15"><label>15</label><mixed-citation publication-type="other" xlink:type="simple">P. D. More and L. P. Deshmukh, “Electrical Conduction in Chemically Deposited CdSe1-xTex Mixed/Alloyed Thin Films,” Indian Journal of Engineering and Materials Sciences, Vol. 10, 2003, pp. 427-432.</mixed-citation></ref><ref id="scirp.27329-ref16"><label>16</label><mixed-citation publication-type="other" xlink:type="simple">S. L. Patil, M. A. Chougule, S. G. Pawar, B. T. Raut, S. Sen and V. B. Patil, “New Process for Synthesis of ZnO Thin Films: Microstructural, Optical and Electrical Characterization,” Journal of Alloys and Compounds, Vol. 509, No. 41, 2011, pp. 10055-10061.</mixed-citation></ref></ref-list></back></article>