<?xml version="1.0" encoding="UTF-8"?>
<!DOCTYPE article PUBLIC "-//NLM//DTD JATS (Z39.96) Journal Publishing DTD v1.4 20241031//EN" "JATS-journalpublishing1-4.dtd">
<article xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" article-type="research-article" dtd-version="1.4" xml:lang="en">
  <front>
    <journal-meta>
      <journal-id journal-id-type="publisher-id">opj</journal-id>
      <journal-title-group>
        <journal-title>Optics and Photonics Journal</journal-title>
      </journal-title-group>
      <issn pub-type="epub">2160-889X</issn>
      <issn pub-type="ppub">2160-8881</issn>
      <publisher>
        <publisher-name>Scientific Research Publishing</publisher-name>
      </publisher>
    </journal-meta>
    <article-meta>
      <article-id pub-id-type="doi">10.4236/opj.2026.165005</article-id>
      <article-id pub-id-type="publisher-id">opj-154880</article-id>
      <article-categories>
        <subj-group>
          <subject>Article</subject>
        </subj-group>
        <subj-group>
          <subject>Chemistry</subject>
          <subject>Materials Science</subject>
          <subject>Engineering</subject>
          <subject>Physics</subject>
          <subject>Mathematics</subject>
        </subj-group>
      </article-categories>
      <title-group>
        <article-title>Wavelength-Dependent Optical and Electrical Responses of Muscovite Mica under Multi-Wavelength Laser Excitation: An Integrated Computational and Literature-Supported Study</article-title>
      </title-group>
      <contrib-group>
        <contrib contrib-type="author">
          <contrib-id contrib-id-type="orcid">0000-0003-0397-5359</contrib-id>
          <name name-style="western">
            <surname>Abdelrahman</surname>
            <given-names>Abdelaziz Hagar</given-names>
          </name>
          <xref ref-type="aff" rid="aff1">1</xref>
        </contrib>
      </contrib-group>
      <aff id="aff1"><label>1</label> Department of Physics, College of Science, Qassim University, Buraidah, Saudi Arabia </aff>
      <author-notes>
        <fn fn-type="conflict" id="fn-conflict">
          <p>The author declares no conflicts of interest regarding the publication of this paper.</p>
        </fn>
      </author-notes>
      <pub-date pub-type="epub">
        <day>31</day>
        <month>05</month>
        <year>2026</year>
      </pub-date>
      <pub-date pub-type="collection">
        <month>05</month>
        <year>2026</year>
      </pub-date>
      <volume>16</volume>
      <issue>05</issue>
      <fpage>75</fpage>
      <lpage>92</lpage>
      <history>
        <date date-type="received">
          <day>17</day>
          <month>09</month>
          <year>2026</year>
        </date>
        <date date-type="accepted">
          <day>25</day>
          <month>10</month>
          <year>2026</year>
        </date>
        <date date-type="published">
          <day>28</day>
          <month>10</month>
          <year>2026</year>
        </date>
      </history>
      <permissions>
        <copyright-statement>© 2026 by the authors and Scientific Research Publishing Inc.</copyright-statement>
        <copyright-year>2026</copyright-year>
        <license license-type="open-access">
          <license-p> This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license ( <ext-link ext-link-type="uri" xlink:href="https://creativecommons.org/licenses/by/4.0/">https://creativecommons.org/licenses/by/4.0/</ext-link> ). </license-p>
        </license>
      </permissions>
      <self-uri content-type="doi" xlink:href="https://doi.org/10.4236/opj.2026.165005">https://doi.org/10.4236/opj.2026.165005</self-uri>
      <abstract>
        <p>Muscovite mica is a layered aluminosilicate with anisotropic optical and dielectric properties that make it attractive for photonic and laser-responsive applications. This study presents an integrated numerical and literature-supported investigation of muscovite mica under controlled multi-wavelength laser excitation, emphasizing its wavelength-dependent optical and electrical responses. The adopted framework combines polarization-sensitive analysis, optical transmission modelling, laser-material interaction assessment, and electrical conductivity evaluation under defined numerical conditions. Numerical modelling is employed as a complementary tool to interpret the observed trends and assess their physical consistency. A systematic verification procedure evaluates agreement between calculated results and literature-derived reference data and quantitatively assesses the associated deviations according to established principles. The results reveal distinct wavelength-dependent variations in the optical and electrical behaviour of muscovite mica, indicating that the incident laser wavelength plays an important role in governing the predicted material response. Good agreement between numerical results and reference data further supports the reliability of the adopted framework. These findings provide insight into laser-muscovite interactions and highlight the potential of this layered dielectric material for wavelength-responsive photonic systems, optical sensing, and laser-material interaction studies.</p>
      </abstract>
      <kwd-group kwd-group-type="author-generated" xml:lang="en">
        <kwd>Muscovite Mica</kwd>
        <kwd>Multi-Wavelength Laser Excitation</kwd>
        <kwd>Laser-Material Interaction</kwd>
        <kwd>Wavelength-Dependent Response</kwd>
        <kwd>Optical Anisotropy</kwd>
        <kwd>Electrical Conductivity</kwd>
      </kwd-group>
    </article-meta>
  </front>
  <body>
    <sec id="sec1">
      <title>1. Introduction</title>
      <p>Muscovite mica is a natural layered silicate mineral receiving great attention for its superior dielectric performance, thermal stability, optical transparency and mechanical flexibility [<xref ref-type="bibr" rid="B1">1</xref>]-[<xref ref-type="bibr" rid="B5">5</xref>]. These properties have enabled its use in many scientific and technological applications, such as insulating components, optical substrates, electronic devices and advanced photonic systems. The crystal structure has a strong influence on the optical properties of muscovite mica resulting in anisotropic behavior and birefringence effects [<xref ref-type="bibr" rid="B6">6</xref>]-[<xref ref-type="bibr" rid="B10">10</xref>]. These properties make mica an interesting medium for optical studies based on polarization as well as applications requiring precise control of light propagation. The interaction of polarized light with anisotropic media can be studied efficiently with the help of well-known polarization theories like Malus’ Law and modern methods of polarization analysis [<xref ref-type="bibr" rid="B11">11</xref>]-[<xref ref-type="bibr" rid="B14">14</xref>]. The optical properties of muscovite mica have been investigated in previous studies [<xref ref-type="bibr" rid="B15">15</xref>]-[<xref ref-type="bibr" rid="B17">17</xref>], while its electrical and dielectric characteristics have been examined in related work [<xref ref-type="bibr" rid="B18">18</xref>]-[<xref ref-type="bibr" rid="B21">21</xref>]. In recent years, laser-based measurement techniques have become important in the discipline of materials science due to their high sensitivity, non-contact and wavelength-selective probing [<xref ref-type="bibr" rid="B22">22</xref>]-[<xref ref-type="bibr" rid="B25">25</xref>]. Multi-wavelength laser approaches provide valuable information on the response of materials under different excitation conditions and contribute to greater comprehension of optical and electrical phenomena in complex dielectric systems.</p>
      <p>Along with experimental investigations, numerical modeling has been developed as a useful tool for the prediction of the performance of materials, verification of theoretical approaches and reduction of the need for extensive experimental trials [<xref ref-type="bibr" rid="B26">26</xref>]-[<xref ref-type="bibr" rid="B31">31</xref>]. Combining computational techniques and literature-derived reference data can improve the interpretation of numerical results and provide a more complete understanding of the governing physical mechanisms. Although muscovite mica has been widely used in optical and electronic technologies, integrated studies combining multi-wavelength laser analysis, numerical modeling, verification procedures, and quantitative error assessment remain relatively limited. Therefore, the present work develops an integrated computational and literature-supported framework for examining the wavelength-dependent optical and electrical responses of muscovite mica. The framework combines polarization analysis, optical transmission modelling, conductivity assessment, computational analysis, reference-numerical comparison, and quantitative error evaluation. The proposed methodology is expected to provide a systematic basis for future laser-based studies on layered dielectric materials and to advance modern photonic and electronic technologies.</p>
    </sec>
    <sec id="sec2">
      <title>2. Literature Review</title>
      <sec id="sec2dot1">
        <title>2.1. Muscovite Mica</title>
        <p>Muscovite mica is one of the most well-studied members of the mica family due to its unusual combination of electrical, optical, thermal and mechanical properties [<xref ref-type="bibr" rid="B1">1</xref>]-[<xref ref-type="bibr" rid="B5">5</xref>]. It is a naturally occurring layered aluminosilicate mineral with a sheet-like crystalline structure that endows the material with high dielectric performance and chemical stability. The weak interlayer bonding facilitates cleavage, and the resulting surfaces are smooth and highly uniform, making them useful for a wide range of scientific and technological applications. The structural properties of muscovite mica have been of considerable interest to materials scientists, particularly those researching dielectric media, insulating substrates, and layered crystalline structures [<xref ref-type="bibr" rid="B1">1</xref>]-[<xref ref-type="bibr" rid="B5">5</xref>]. Recent investigations have shown excellent electrical insulating capabilities, high dielectric strength and favorable surface quality of muscovite, supporting its integration into modern electronic and photonic technologies. In addition to its electrical performance, muscovite mica has several key optical properties, including transparency over a broad spectral range and compatibility with a variety of optical measurement techniques. Because of these properties, it is used in spectroscopy, polarization measurements, laser-based investigations, and related photonic studies. Furthermore, developments in computational modeling and nanoscale analysis have resulted in a better understanding of its structural and electrical response, thereby opening new avenues for the development of advanced technologies based on layered dielectric materials [<xref ref-type="bibr" rid="B1">1</xref>]-[<xref ref-type="bibr" rid="B5">5</xref>]. Muscovite mica continues to be of scientific interest because it provides a useful model system for studying the relationship between crystal structure and material performance. As such, muscovite remains a valuable platform for studies of optical anisotropy, charge transport processes, laser-material interactions and simulation-aided materials research.</p>
      </sec>
      <sec id="sec2dot2">
        <title>2.2. Optical Anisotropy and Birefringence</title>
        <p>Optical anisotropy is one of the most important properties of crystalline materials. It appears when the interaction of light with a medium depends on the direction of propagation relative to the crystal lattice [<xref ref-type="bibr" rid="B6">6</xref>]-[<xref ref-type="bibr" rid="B10">10</xref>]. The anisotropic nature of the refractive index in such systems leads to a dependence of the optical response on crystallographic orientation and gives rise to polarization-dependent effects. Such phenomena are at the heart of many photonic and optical technologies. The crystal structure of muscovite mica is layered, giving rise to pronounced optical anisotropy. The ordered structure affects light propagation and can also induce birefringence, a phenomenon in which an incident beam divides into two components that propagate with different refractive indices and phase velocities [<xref ref-type="bibr" rid="B6">6</xref>]-[<xref ref-type="bibr" rid="B10">10</xref>]. Birefringence has been widely used for crystal orientation determination, optical quality evaluation and polarization-sensitive measurements. The analysis of anisotropic optical phenomena gives useful insight into the interaction of electromagnetic radiation with layered dielectric media. The directional dependence has been shown to considerably influence optical transmission, absorption, polarization response, and light-matter interaction processes in recent work on anisotropic crystals and two-dimensional layered materials [<xref ref-type="bibr" rid="B6">6</xref>]-[<xref ref-type="bibr" rid="B10">10</xref>]. Therefore, a detailed understanding of optical anisotropy and birefringence is required for the interpretation of polarization-dependent data and the evaluation of the optical behavior of muscovite mica. These principles form the theoretical basis of the analyses presented in this work and allow for the interpretation of the numerically predicted wavelength-dependent optical responses.</p>
      </sec>
      <sec id="sec2dot3">
        <title>2.3. Polarization and Malus Law</title>
        <p>Polarization is an inherent characteristic of electromagnetic waves that describes the orientation of the electric-field vector during the propagation of light [<xref ref-type="bibr" rid="B11">11</xref>]-[<xref ref-type="bibr" rid="B14">14</xref>]. Its analysis is frequently used in optics and photonics to study material structure, optical anisotropy and light-matter interactions, especially in crystalline media. One important relationship used to characterize these phenomena is Malus’ law, which describes the transmitted intensity of linearly polarized light passing through a polarizing element. According to this law [<xref ref-type="bibr" rid="B11">11</xref>]-[<xref ref-type="bibr" rid="B14">14</xref>], the transmitted intensity is proportional to the square of the cosine of the angle between the direction of the incident electric field and the transmission axis of the analyzing element. The angular dependence provides a simple yet powerful framework for studying polarization-dependent optical behavior and phenomena associated with birefringence, crystal orientation and structural symmetry. Therefore, for layered dielectric materials such as muscovite mica, polarization-sensitive analysis can provide useful information regarding the interaction of incoming laser radiation with the crystalline structure [<xref ref-type="bibr" rid="B11">11</xref>]-[<xref ref-type="bibr" rid="B14">14</xref>]. These concepts provide a theoretical framework for interpreting the numerically calculated angular intensity variations and evaluating the predicted wavelength-dependent optical response under different laser wavelengths.</p>
      </sec>
      <sec id="sec2dot4">
        <title>2.4. Multi-Wavelength Laser Characterization</title>
        <p>Laser-based measurement techniques have become essential instruments in current materials science due to their precision, non-destructive nature and capacity to probe physical properties with high sensitivity [<xref ref-type="bibr" rid="B22">22</xref>]-[<xref ref-type="bibr" rid="B25">25</xref>]. Laser diagnostics provides a powerful tool for scientific inquiry and performance evaluation since the interaction between laser radiation and matter delivers useful information on optical, structural, thermal and electronic properties. Multi-wavelength laser approaches increase the potential of traditional optical measurements by investigating material responses at different excitation wavelengths [<xref ref-type="bibr" rid="B22">22</xref>]-[<xref ref-type="bibr" rid="B25">25</xref>]. Absorption, transmission, scattering and associated optical processes are substantially wavelength-dependent, and the utilisation of multiple laser sources allows a more complete understanding of the underlying phenomena. This approach is especially helpful in layered dielectric media where the optical response might vary considerably across different spectral regions. Wavelength-dependent laser measurements have previously been shown to provide vital information on optical transitions, energy transfer mechanisms and light-matter interactions [<xref ref-type="bibr" rid="B22">22</xref>]-[<xref ref-type="bibr" rid="B25">25</xref>]. These techniques have been effectively used in photonic materials, semiconductors, dielectric crystals and nanostructured systems. The study of muscovite mica using a multi-wavelength approach provides a promising way to evaluate its optical response, polarisation-dependent effects, and transmission behaviour. In the present framework, multi-wavelength analysis combined with numerical modelling provides a basis for interpreting the predicted material response and its dependence on excitation wavelength.</p>
      </sec>
      <sec id="sec2dot5">
        <title>2.5. Numerical Simulation and Verification</title>
        <p>Numerical modeling has become a vital part of modern materials research, since it can predict physical responses, verify theoretical ideas and supplement laboratory-based studies [<xref ref-type="bibr" rid="B26">26</xref>]-[<xref ref-type="bibr" rid="B31">31</xref>]. Computational methods enable researchers to explore complicated optical and electrical phenomena that may be difficult, expensive or time-consuming to study using experimental techniques alone. The integration of computational methods with reference data from experimental and literature sources offers a stable platform to decipher material functionality and improves the trustworthiness of scientific conclusions. In materials science, photonics and optical engineering, verification and validation procedures involving comparisons between calculated results and appropriate reference data are commonly employed [<xref ref-type="bibr" rid="B29">29</xref>]-[<xref ref-type="bibr" rid="B31">31</xref>]. Recent progress in computational materials science has demonstrated the capability of numerical methods to predict the structural, optical and electrical properties of layered materials. These methods are also helpful for sensitivity assessment, the detection of dominating physical processes and for guiding future experimental studies [<xref ref-type="bibr" rid="B26">26</xref>]-[<xref ref-type="bibr" rid="B28">28</xref>]. Predictive modeling is strengthened by model verification and quantitative error assessment. A reliable evaluation of computational consistency requires consideration of modeling assumptions and quantitative agreement between calculated and reference values [<xref ref-type="bibr" rid="B32">32</xref>]-[<xref ref-type="bibr" rid="B35">35</xref>]. Such approaches build confidence in computational results and promote their use in scientific decision making. Here we use an integrated computational and validation framework to analyze the optical and electrical performance of muscovite mica. This allows for a direct comparison between reference values and numerically generated outputs and provides a quantitative assessment of their agreement.</p>
      </sec>
    </sec>
    <sec id="sec3">
      <title>3. Methodology</title>
      <sec id="sec3dot1">
        <title>3.1. Material Description</title>
        <p>The present study employs an integrated physics-based numerical and literature-supported framework to investigate the wavelength-dependent optical and electrical behavior of muscovite mica under multi-wavelength laser excitation. The analysis combines established optical relations, computational modelling, and reference data reported in the literature to examine polarization-sensitive behavior, optical transmission, wavelength-dependent laser-material interactions, and electrical characteristics under defined numerical conditions. Numerical datasets were generated from the governing physical models for selected simulation parameters and configurations, while literature-derived data were used, where applicable, as reference values for comparison and assessment of the predicted trends. This framework enables a systematic evaluation of the modelled material response while clearly distinguishing numerically generated results from literature-derived reference data.</p>
      </sec>
      <sec id="sec3dot2">
        <title>3.2. Optical Model</title>
        <p>In this work, the optical analysis is based on polarization behavior and wavelength-dependent transmission. The response of muscovite mica is investigated using theoretical models describing the interaction of incoming laser radiation with the anisotropic crystalline structure of this material. The polarization-dependent effects were analyzed by applying Malus’ law, which links the transmitted intensity of the polarized light to the angle between the incident polarization direction and the transmission axis of the analyzer. The transmitted light intensity is:</p>
        <disp-formula id="FD1">
          <label>(1)</label>
          <mml:math display="inline">
            <mml:mrow>
              <mml:mtext>I</mml:mtext>
              <mml:mo>=</mml:mo>
              <mml:msub>
                <mml:mtext>I</mml:mtext>
                <mml:mn>0</mml:mn>
              </mml:msub>
              <mml:msup>
                <mml:mrow>
                  <mml:mtext>cos</mml:mtext>
                </mml:mrow>
                <mml:mn>2</mml:mn>
              </mml:msup>
              <mml:mrow>
                <mml:mo>(</mml:mo>
                <mml:mi>θ</mml:mi>
                <mml:mo>)</mml:mo>
              </mml:mrow>
            </mml:mrow>
          </mml:math>
        </disp-formula>
        <p>where I is the transmitted intensity, <inline-formula><mml:math display="inline"><mml:mrow><mml:msub><mml:mtext> I </mml:mtext><mml:mn> 0 </mml:mn></mml:msub></mml:mrow></mml:math></inline-formula> is the incident intensity and <italic>θ</italic> is the relative polarization angle. This relation is the theoretical basis for evaluating polarization-dependent transmission behaviour and verifying the numerical implementation of the polarization model. The transparency and spectral responsiveness of muscovite mica were explored by evaluating the transmission characteristics as a function of wavelength. The wavelength dependent transmission model allows the response to be assessed under varied excitation conditions and the numerical results to be interpreted. The combination of polarization analysis and transmission modeling provides a useful framework for the study of muscovite mica and for understanding the interplay between the crystal structure and the parameters of light propagation.</p>
      </sec>
      <sec id="sec3dot3">
        <title>3.3. Electrical Conductivity Framework</title>
        <p>In this work, the electrical response of muscovite mica as a layered dielectric material is investigated through conductivity analysis. To investigate charge transport pathways in the material, the dependence of conductivity on sample thickness and structural characteristics was examined numerically. The electrical conductivity can be written as:</p>
        <disp-formula id="FD2">
          <label>(2)</label>
          <mml:math display="inline">
            <mml:mrow>
              <mml:mtext>σ</mml:mtext>
              <mml:mo>=</mml:mo>
              <mml:mfrac>
                <mml:mtext>L</mml:mtext>
                <mml:mrow>
                  <mml:mtext>RA</mml:mtext>
                </mml:mrow>
              </mml:mfrac>
            </mml:mrow>
          </mml:math>
        </disp-formula>
        <p>where <italic>σ</italic> is the electrical conductivity, L is the thickness of the sample, R is the electrical resistance, and A is the effective cross-sectional area. This relation provides a simplified framework for the study of variations in conductivity and the comparison of electrical responses under different conditions. The conductivity model was used to examine the thickness dependent transport properties and to facilitate the interpretation of the numerical data reported later in this work.</p>
      </sec>
      <sec id="sec3dot4">
        <title>3.4. Numerical Modelling</title>
        <p>We have used computational modeling as the primary approach to investigate the optical and electrical responses of muscovite mica. The developed framework was aimed at reproducing the theoretical trends associated with polarization effects, optical transmission, electrical conductivity and wavelength-dependent laser interactions. The computational method was implemented using Python-based models that define the physical relationships governing these phenomena. Numerical methods were employed to generate theoretical data sets to examine the sensitivity of the parameters and to investigate the consistency of the predicted responses under varying conditions. The modeling framework consisted of Malus’ law based formulations for polarization investigations, wavelength dependent transmission calculations, conductivity analysis and laser matter interaction processes. The obtained results were then compared with theoretical expectations and reference values, where applicable to test the consistency of the model and the physical plausibility of the results. Computational methods offer an efficient platform for studying material responses and can reduce reliance on extensive laboratory measurements. The combination of numerical approaches with theoretical and literature-supported analysis enhances the interpretation of results and helps in the development of predictive methodologies for layered dielectric systems.</p>
      </sec>
      <sec id="sec3dot5">
        <title>3.5. Error and Uncertainty Analysis</title>
        <p>We performed an error analysis to assess numerical consistency and quantify the agreement between reference values and numerical data. Relative error assessment provides a direct quantitative measure of the agreement between reference and computed values. The relative error was determined using the following expression:</p>
        <disp-formula id="FD3">
          <label>(3)</label>
          <mml:math display="inline">
            <mml:mrow>
              <mml:mtext>Relative</mml:mtext>
              <mml:mtext>
                 
              </mml:mtext>
              <mml:mtext>Error</mml:mtext>
              <mml:mtext>
                 
              </mml:mtext>
              <mml:mrow>
                <mml:mo>(</mml:mo>
                <mml:mtext>%</mml:mtext>
                <mml:mo>)</mml:mo>
              </mml:mrow>
              <mml:mo>=</mml:mo>
              <mml:mfrac>
                <mml:mrow>
                  <mml:mrow>
                    <mml:mo>|</mml:mo>
                    <mml:mrow>
                      <mml:mtext>Experimental</mml:mtext>
                      <mml:mo>−</mml:mo>
                      <mml:mtext>Simulation</mml:mtext>
                    </mml:mrow>
                    <mml:mo>|</mml:mo>
                  </mml:mrow>
                </mml:mrow>
                <mml:mrow>
                  <mml:mtext>Experimental</mml:mtext>
                </mml:mrow>
              </mml:mfrac>
              <mml:mo>×</mml:mo>
              <mml:mn>100</mml:mn>
            </mml:mrow>
          </mml:math>
        </disp-formula>
        <p>This relation allows the computational results to be quantitatively compared with the reference values. The errors obtained were analyzed to assess the level of agreement and to detect possible discrepancies due to modeling assumptions, numerical approximations or parameter variations. The adopted procedure provides a quantitative error measure for numerical verification. The obtained error estimates were used to provide an additional consistency check for the computational framework and to quantify the deviations between the reference and numerical values.</p>
      </sec>
    </sec>
    <sec id="sec4">
      <title>4. Results and Discussion</title>
      <sec id="sec4dot1">
        <title>4.1. Polarization Analysis</title>
        <p>We first examined the optical properties by studying the angular dependence of the transmission within the framework of Malus’ law. <xref ref-type="fig" rid="fig1">Figure 1</xref> shows that the numerically calculated transmitted intensity decreases systematically with increasing angle between the incident electric-field orientation and the analyzer axis, following the expected cosine-squared relation. The match between the calculated profile and the theoretical trend confirms the correct numerical implementation of Malus’ law and provides a consistency check for the computational approach employed in this study. This kind of angular behavior is typical of polarization-dependent transmission and may be associated with anisotropic optical media, birefringence, and crystal-orientation effects [<xref ref-type="bibr" rid="B6">6</xref>]-[<xref ref-type="bibr" rid="B14">14</xref>]; however, agreement with Malus’ law alone is not considered direct evidence of muscovite birefringence. These results therefore provide a solid reference for further studies on the wavelength-dependent laser response of muscovite mica.</p>
        <fig id="fig1">
          <label>Figure 1</label>
          <graphic xlink:href="https://html.scirp.org/file/1190899-rId23.jpeg?20261028115011" />
        </fig>
        <p><bold>Figure 1.</bold> Numerically calculated angular transmission profile based on Malus’ law.</p>
      </sec>
      <sec id="sec4dot2">
        <title>4.2. Optical Transmission</title>
        <p>The optical transmission properties of muscovite mica were studied by investigating the spectral response and transparency over the studied wavelength range. The numerically evaluated transmission behaviour showed a progressive change with wavelength, reflecting the wavelength-dependent interaction of electromagnetic radiation with the layered crystal structure. The transmission profile shows a systematic trend across the spectral region investigated <xref ref-type="fig" rid="fig2">Figure 2</xref>. This variation may arise from wavelength-dependent absorption, reflection, and optical propagation within muscovite. The calculated spectral behaviour is qualitatively consistent with previously reported optical and transmission characteristics of muscovite mica [<xref ref-type="bibr" rid="B15">15</xref>]-[<xref ref-type="bibr" rid="B17">17</xref>]. The results support the suitability of muscovite mica for photonic applications requiring stable light transmission and defined spectral characteristics. In addition, the transmission analysis provides useful insight into laser-matter interaction mechanisms and supports the interpretation of the wavelength-dependent behaviour discussed in the following sections.</p>
        <fig id="fig2">
          <label>Figure 2</label>
          <graphic xlink:href="https://html.scirp.org/file/1190899-rId24.jpeg?20261028115011" />
        </fig>
        <p><bold>Figure 2.</bold> Numerically evaluated wavelength-dependent optical transmission behavior of muscovite mica using literature-derived optical constants.</p>
      </sec>
      <sec id="sec4dot3">
        <title>4.3. Conductivity versus Thickness</title>
        <p>The electrical conductivity behavior of muscovite mica was examined in relation to sample thickness to investigate charge-transport processes in the layered dielectric structure. Analysis of conductivity is useful for understanding the electrical behavior of muscovite and its potential use in insulating and electronic applications. <xref ref-type="fig" rid="fig3">Figure 3</xref> presents an illustrative numerical trend of normalized conductivity as a function of muscovite mica thickness. The modelled trend indicates an increase in normalized conductivity with decreasing thickness. This qualitative behavior is consistent with published experimental studies reporting enhanced electrical conductivity in few-layer muscovite mica as the flake thickness is reduced [<xref ref-type="bibr" rid="B20">20</xref>]. Such thickness-dependent behavior has been associated with changes in carrier transport and carrier density, with hopping conduction identified as a dominant transport mechanism in few-layer muscovite mica [<xref ref-type="bibr" rid="B20">20</xref>]. These observations are also consistent with the broader electrical and dielectric characteristics of muscovite reported in previous studies [<xref ref-type="bibr" rid="B18">18</xref>][<xref ref-type="bibr" rid="B19">19</xref>][<xref ref-type="bibr" rid="B21">21</xref>].</p>
        <p>The observed conductivity trend is in qualitative agreement with previous studies reporting thickness-dependent electrical characteristics in muscovite mica [<xref ref-type="bibr" rid="B19">19</xref>]-[<xref ref-type="bibr" rid="B21">21</xref>].</p>
        <fig id="fig3">
          <label>Figure 3</label>
          <graphic xlink:href="https://html.scirp.org/file/1190899-rId25.jpeg?20261028115012" />
        </fig>
        <p><bold>Figure 3.</bold> Illustrative numerical trend of normalized conductivity as a function of muscovite mica thickness.</p>
      </sec>
      <sec id="sec4dot4">
        <title>4.4. Multi-Wavelength Laser Comparison</title>
        <p>The response of muscovite mica under different laser wavelengths was investigated to evaluate the influence of excitation conditions on material characterization. Multi-wavelength analysis provides a broader understanding of wavelength-dependent optical behaviour and enables comparison across different spectral regions. <xref ref-type="fig" rid="fig4">Figure 4</xref>presents an illustrative normalized comparison of the relative suitability of the three laser wavelengths for selected response categories. The comparative scores are intended to represent qualitative wavelength-dependent sensitivities rather than directly measured performance values. In this framework, the He-Ne laser (632.8 nm) is particularly relevant to refraction and polarization-sensitive characterisation, the 532 nm diode laser provides enhanced sensitivity to visible absorption and dispersion, while the 1064 nm Nd:YAG laser is more relevant to thermal and lattice-interaction effects. These distinctions are consistent with the wavelength-dependent nature of absorption, transmission, and laser-material interaction processes [<xref ref-type="bibr" rid="B22">22</xref>]-[<xref ref-type="bibr" rid="B25">25</xref>]. Accordingly, the comparison illustrates the complementary role of multi-wavelength excitation in investigating layered dielectric materials.</p>
      </sec>
      <sec id="sec4dot5">
        <title>4.5. Reference versus Numerical Results</title>
        <p>A comparison between reference values and computational results was conducted to assess the consistency and reliability of the proposed methodology. This comparison serves as an important consistency check by examining the agreement between predicted trends and reference values. <xref ref-type="fig" rid="fig5">Figure 5</xref> illustrates the relationship between reference values and numerically generated results. The two datasets exhibit strong correspondence, indicating that the adopted computational approach reproduces the selected reference values with relatively small deviations. The </p>
        <fig id="fig4">
          <label>Figure 4</label>
          <graphic xlink:href="https://html.scirp.org/file/1190899-rId26.jpeg?20261028115013" />
        </fig>
        <p><bold>Figure 4.</bold> Illustrative normalized comparison of the relative suitability of the investigated laser wavelengths for selected material-response categories.</p>
        <fig id="fig5">
          <label>Figure 5</label>
          <graphic xlink:href="https://html.scirp.org/file/1190899-rId27.jpeg?20261028115013" />
        </fig>
        <p><bold>Figure 5.</bold> Comparison between reference values and numerically generated results for selected model parameters.</p>
        <p>observed agreement supports the internal consistency of the modelling strategy and demonstrates the value of computational techniques in materials research. Similar numerical verification procedures have been widely employed in optical materials studies and numerical modelling investigations [<xref ref-type="bibr" rid="B26">26</xref>]-[<xref ref-type="bibr" rid="B31">31</xref>]. This comparison is intended as a numerical consistency check rather than an independent experimental validation. The close correspondence between computational outputs and the selected reference values enhances confidence in the internal consistency of the proposed approach and supports its application to future studies of layered dielectric systems.</p>
        <p>The strong agreement between reference and numerical results supports the internal consistency of the adopted computational approach and is consistent with established numerical verification approaches [<xref ref-type="bibr" rid="B29">29</xref>]-[<xref ref-type="bibr" rid="B31">31</xref>].</p>
      </sec>
      <sec id="sec4dot6">
        <title>4.6. Error Analysis and Uncertainty Assessment</title>
        <p>Error analysis was done to check the consistency of the obtained results and to estimate the degree of agreement between the computed and reference results. The quantitative assessment of relative error provides a direct measure of the numerical agreement between the reference and computed values. <xref ref-type="fig" rid="fig6">Figure 6</xref> presents the calculated values of the relative error of the investigated parameters. The results indicate that the calculated deviations are relatively small, ranging from approximately 2.50% to 5.26%. These small differences support the internal consistency of the adopted numerical approach. The derived error estimates are consistent with quantitative error assessment and numerical verification procedures discussed in the literature [<xref ref-type="bibr" rid="B32">32</xref>]-[<xref ref-type="bibr" rid="B35">35</xref>]. The analysis indicates close numerical agreement for the selected optical and electrical parameters. Successful implementation of relative error assessment provides an additional quantitative check on the reported computational results.</p>
        <fig id="fig6">
          <label>Figure 6</label>
          <graphic xlink:href="https://html.scirp.org/file/1190899-rId28.jpeg?20261028115013" />
        </fig>
        <p><bold>Figure 6.</bold> Relative error between reference values and numerically generated results for the selected model parameters.</p>
        <p>The estimated uncertainty levels remain within acceptable limits for optical investigations and were assessed according to internationally recognized uncertainty evaluation procedures [<xref ref-type="bibr" rid="B32">32</xref>]-[<xref ref-type="bibr" rid="B35">35</xref>].</p>
      </sec>
      <sec id="sec4dot7">
        <title>4.7. Laser-Material Interaction</title>
        <p>The interaction of laser radiation with muscovite mica is crucial for the wavelength-dependent optical and electrical responses of the material. Incident radiation of various wavelengths can be reflected, transmitted, scattered and absorbed within the layered crystal structure, as schematically shown in <xref ref-type="fig" rid="fig7">Figure 7</xref>. The absorbed energy can be used for electronic or phononic excitation and local energy transfer depending on the irradiation conditions. These mechanisms give a physical interpretation of the predicted wavelength-dependent changes in optical transmission, polarization behavior and electrical conductivity. The schematic also indicates that the resultant response is governed by the combined effects of laser wavelength, material anisotropy and the layered structure of muscovite. At sufficiently high levels of irradiation, energy deposition may also give rise to localized thermal or structural effects, but here we describe such modifications as possible interaction pathways rather than experimentally observed structural changes. This interpretation is in accordance with the known descriptions of laser-matter interactions and with the previous reports on the laser-induced optical and structural effects in dielectric and photonic materials [<xref ref-type="bibr" rid="B36">36</xref>]-[<xref ref-type="bibr" rid="B38">38</xref>]. The proposed framework thus links the modelled wavelength-dependent responses to the underlying interaction mechanisms and provides a basis for evaluating muscovite mica for photonic, sensing and laser-responsive applications.</p>
        <fig id="fig7">
          <label>Figure 7</label>
          <graphic xlink:href="https://html.scirp.org/file/1190899-rId29.jpeg?20261028115014" />
        </fig>
        <p><bold>Figure 7.</bold> Conceptual schematic of wavelength-dependent laser-muscovite mica interactions under 532, 632.8, and 1064 nm excitation, illustrating optical reflection, transmission, scattering, and absorption, together with energy-transfer processes within the layered crystal structure and potential optical, electrical, and structural responses. The illustrated mechanisms represent physically plausible interaction pathways rather than experimentally verified responses in the present study.</p>
      </sec>
    </sec>
    <sec id="sec5">
      <title>5. Scientific Significance</title>
      <p>The scientific significance of this work is that it combines multi-wavelength laser excitation, optical and electrical analysis, computational modelling, and quantitative error assessment in a unified framework for the study of muscovite mica. This approach, which does not consider individual properties of the material in isolation, makes direct links between the irradiation wavelength, anisotropic optical behaviour, transmission properties and electrical response, providing a more complete description of the underlying physical processes. A particular feature of the study is the use of different laser wavelengths not only as optical probes but also as controlled excitation conditions to evaluate the material’s wavelength-dependent response. The predicted responses, supported by literature-derived reference data and computational analysis, show how the interaction of incident radiation with muscovite’s layered anisotropic structure influences its optical and electrical behaviour. This combination of analytical and computational approaches strengthens the interpretation of the results without depending on a single modelling approach. The wavelength-dependent behaviour identified in this analysis points to the potential of muscovite mica for photonic devices, optical sensing, dielectric components and laser-responsive systems. More broadly, the integrated literature-supported computational framework presented here could serve as a useful starting point for exploring other layered crystalline and dielectric materials under controlled laser irradiation.</p>
    </sec>
    <sec id="sec6">
      <title>6. Future Perspectives</title>
      <p>Future research can extend this computational and literature-supported framework by exploring wider ranges of laser wavelengths and systematically varying irradiation parameters such as power density, exposure time, and beam conditions. Future time-resolved and spatially resolved experimental optical measurements of muscovite mica might give further insight into its dynamic response, and complementary structural characterization techniques could reveal whether the layered crystal structure experiences measurable modifications under prolonged or higher-energy irradiation.</p>
      <p>Further investigations should also include the effects of crystal orientation, sample thickness, and temperature on the wavelength dependence of the optical and electrical response. These studies may help to separate the contributions of intrinsic anisotropy, energy deposition and thermal effects to the predicted laser-material interaction mechanisms and may lead to quantitative relationships between irradiation conditions and material response.</p>
      <p>A further opportunity for development lies in combining data-driven and machine learning approaches with future experimental measurements and computational modelling. These approaches, with large, well-controlled datasets, could help discover complex relationships between laser parameters and material properties, and predict material responses under previously unexplored irradiation conditions. Further evaluation of the framework’s broader applicability may be achieved by extending it to other layered dielectric and crystalline materials for photonic, sensing, and optoelectronic systems.</p>
    </sec>
    <sec id="sec7">
      <title>7. Conclusions</title>
      <p>This study presented an integrated computational and literature-supported investigation of muscovite mica under controlled multi-wavelength laser excitation. The numerical results revealed anisotropic optical behaviour, polarization-sensitive transmission, and variations in electrical conductivity, while the predicted responses showed a clear dependence on laser wavelength. These findings demonstrate that wavelength selection plays an important role in governing the interaction between incident laser radiation and the layered structure of muscovite.</p>
      <p>Numerical modelling was used to interpret the predicted trends and assess their physical consistency. The agreement between calculated behaviour and literature-derived reference data, supported by systematic verification and quantitative error assessment, strengthens the reliability of the adopted framework. Importantly, the laser is considered not only as an optical probe but also as a controlled excitation source for investigating wavelength-dependent material responses.</p>
      <p>Overall, the results highlight the potential of muscovite mica for laser-responsive photonic and sensing applications and demonstrate the value of combining multi-wavelength excitation, literature-supported analysis, and numerical modelling. Future work may extend this framework to broader spectral ranges and controlled irradiation conditions, together with complementary structural characterization to investigate possible laser-induced modifications.</p>
    </sec>
    <sec id="sec8">
      <title>Declarations</title>
      <p><bold>Availability of Data and Materials:</bold>The data supporting the findings of this study are included within the article. Further information may be obtained from the corresponding author upon reasonable request.</p>
      <p><bold>Declaration of generative AI</bold> and AI-assisted technologies in the manuscript preparation process: During the preparation of this work, the author used ChatGPT (OpenAI) to assist with language refinement, structural review and manuscript editing. After using this tool/service, the author reviewed and edited the content as needed and takes full responsibility for the published article.</p>
    </sec>
    <sec id="sec9">
      <title>Acknowledgements</title>
      <p>The author would like to thank the Deanship of Graduate Studies and Scientific Research at Qassim University (<ext-link ext-link-type="uri" xlink:href="https://www.qu.edu.sa">https://www.qu.edu.sa</ext-link>) for its academic and in-stitutional support.</p>
    </sec>
    <sec id="sec10">
      <title>Author Contributions</title>
      <p>Contribution statement: A. H. Abdelrahman: Conceptualization, Methodology, Software, Validation, Formal analysis, Investigation, Data curation, Visualization, Writing: original draft, Writing: review &amp; editing.</p>
    </sec>
  </body>
  <back>
    <ref-list>
      <title>References</title>
      <ref id="B1">
        <label>1.</label>
        <citation-alternatives>
          <mixed-citation publication-type="other">Maruvada, A., Shubhakar, K., Raghavan, N., Pey, K.L. and O’Shea, S.J. (2022) Dielectric Breakdown of 2D Muscovite Mica. <italic>Scientific Reports</italic>, 12, Article No. 14076. https://doi.org/10.1038/s41598-022-18320-7 <pub-id pub-id-type="doi">10.1038/s41598-022-18320-7</pub-id><pub-id pub-id-type="pmid">35982110</pub-id><ext-link ext-link-type="uri" xlink:href="https://doi.org/10.1038/s41598-022-18320-7">https://doi.org/10.1038/s41598-022-18320-7</ext-link></mixed-citation>
          <element-citation publication-type="other">
            <person-group person-group-type="author">
              <string-name>Maruvada, A.</string-name>
              <string-name>Shubhakar, K.</string-name>
              <string-name>Raghavan, N.</string-name>
              <string-name>Pey, K.L.</string-name>
              <string-name>Shea, S.J.</string-name>
            </person-group>
            <year>2022</year>
            <article-title>Dielectric Breakdown of 2D Muscovite Mica</article-title>
            <source>Scientific Reports</source>
            <volume>12</volume>
            <elocation-id>No</elocation-id>
            <pub-id pub-id-type="doi">10.1038/s41598-022-18320-7</pub-id>
            <pub-id pub-id-type="pmid">35982110</pub-id>
          </element-citation>
        </citation-alternatives>
      </ref>
      <ref id="B2">
        <label>2.</label>
        <citation-alternatives>
          <mixed-citation publication-type="other">Franceschi, G., Kocán, P., Conti, A., Brandstetter, S., Balajka, J., Sokolović, I., <italic>et al</italic>. (2023) Resolving the Intrinsic Short-Range Ordering of K+ Ions on Cleaved Muscovite Mica. <italic>Nature Communications</italic>, 14, Article No. 208. https://doi.org/10.1038/s41467-023-35872-y <pub-id pub-id-type="doi">10.1038/s41467-023-35872-y</pub-id><pub-id pub-id-type="pmid">36639388</pub-id><ext-link ext-link-type="uri" xlink:href="https://doi.org/10.1038/s41467-023-35872-y">https://doi.org/10.1038/s41467-023-35872-y</ext-link></mixed-citation>
          <element-citation publication-type="other">
            <person-group person-group-type="author">
              <string-name>Franceschi, G.</string-name>
              <string-name>Conti, A.</string-name>
              <string-name>Brandstetter, S.</string-name>
              <string-name>Balajka, J.</string-name>
            </person-group>
            <year>2023</year>
            <article-title>Resolving the Intrinsic Short-Range Ordering of K+ Ions on Cleaved Muscovite Mica</article-title>
            <source>Nature Communications</source>
            <volume>14</volume>
            <elocation-id>No</elocation-id>
            <pub-id pub-id-type="doi">10.1038/s41467-023-35872-y</pub-id>
            <pub-id pub-id-type="pmid">36639388</pub-id>
          </element-citation>
        </citation-alternatives>
      </ref>
      <ref id="B3">
        <label>3.</label>
        <citation-alternatives>
          <mixed-citation publication-type="other">Wang, H., Sun, Y., Chu, J., Wang, X. and Zhang, M. (2020) Crystalline Structure Variation within Phlogopite, Muscovite and Talc under 0-1000 kGy γ Ray Irradiation: A Clear Dependence on Intrinsic Characteristic. <italic>Applied Clay Science</italic>, 187, Article 105475. https://doi.org/10.1016/j.clay.2020.105475 <pub-id pub-id-type="doi">10.1016/j.clay.2020.105475</pub-id><ext-link ext-link-type="uri" xlink:href="https://doi.org/10.1016/j.clay.2020.105475">https://doi.org/10.1016/j.clay.2020.105475</ext-link></mixed-citation>
          <element-citation publication-type="other">
            <person-group person-group-type="author">
              <string-name>Wang, H.</string-name>
              <string-name>Sun, Y.</string-name>
              <string-name>Chu, J.</string-name>
              <string-name>Wang, X.</string-name>
              <string-name>Zhang, M.</string-name>
              <string-name>Phlogopite, M</string-name>
            </person-group>
            <year>2020</year>
            <article-title>Crystalline Structure Variation within Phlogopite, Muscovite and Talc under 0-1000 kGy γ Ray Irradiation: A Clear Dependence on Intrinsic Characteristic</article-title>
            <source>Applied Clay Science</source>
            <volume>187</volume>
            <elocation-id>105475</elocation-id>
            <pub-id pub-id-type="doi">10.1016/j.clay.2020.105475</pub-id>
          </element-citation>
        </citation-alternatives>
      </ref>
      <ref id="B4">
        <label>4.</label>
        <citation-alternatives>
          <mixed-citation publication-type="other">de Poel, W., Pintea, S., Drnec, J., Carla, F., Felici, R., Mulder, P., <italic>et al</italic>. (2014) Muscovite Mica: Flatter than a Pancake. <italic>Surface Science</italic>, 619, 19-24. https://doi.org/10.1016/j.susc.2013.10.008 <pub-id pub-id-type="doi">10.1016/j.susc.2013.10.008</pub-id><ext-link ext-link-type="uri" xlink:href="https://doi.org/10.1016/j.susc.2013.10.008">https://doi.org/10.1016/j.susc.2013.10.008</ext-link></mixed-citation>
          <element-citation publication-type="other">
            <person-group person-group-type="author">
              <string-name>Poel, W.</string-name>
              <string-name>Pintea, S.</string-name>
              <string-name>Drnec, J.</string-name>
              <string-name>Carla, F.</string-name>
              <string-name>Felici, R.</string-name>
              <string-name>Mulder, P.</string-name>
            </person-group>
            <year>2014</year>
            <article-title>Muscovite Mica: Flatter than a Pancake</article-title>
            <source>Surface Science</source>
            <volume>619</volume>
            <pub-id pub-id-type="doi">10.1016/j.susc.2013.10.008</pub-id>
          </element-citation>
        </citation-alternatives>
      </ref>
      <ref id="B5">
        <label>5.</label>
        <citation-alternatives>
          <mixed-citation publication-type="other">Wu, S., Lee, W.P.C. and Wu, P. (2022) Origin of Observed Narrow Bandgap of Mica Nanosheets. <italic>Scientific Reports</italic>, 12, Article No. 2868. https://doi.org/10.1038/s41598-022-06820-5 <pub-id pub-id-type="doi">10.1038/s41598-022-06820-5</pub-id><pub-id pub-id-type="pmid">35190578</pub-id><ext-link ext-link-type="uri" xlink:href="https://doi.org/10.1038/s41598-022-06820-5">https://doi.org/10.1038/s41598-022-06820-5</ext-link></mixed-citation>
          <element-citation publication-type="other">
            <person-group person-group-type="author">
              <string-name>Wu, S.</string-name>
              <string-name>Lee, W.P.C.</string-name>
              <string-name>Wu, P.</string-name>
            </person-group>
            <year>2022</year>
            <article-title>Origin of Observed Narrow Bandgap of Mica Nanosheets</article-title>
            <source>Scientific Reports</source>
            <volume>12</volume>
            <elocation-id>No</elocation-id>
            <pub-id pub-id-type="doi">10.1038/s41598-022-06820-5</pub-id>
            <pub-id pub-id-type="pmid">35190578</pub-id>
          </element-citation>
        </citation-alternatives>
      </ref>
      <ref id="B6">
        <label>6.</label>
        <citation-alternatives>
          <mixed-citation publication-type="other">Qiao, J., Kong, X., Hu, Z., Yang, F. and Ji, W. (2014) High-Mobility Transport Anisotropy and Linear Dichroism in Few-Layer Black Phosphorus. <italic>Nature Communications</italic>, 5, Article No. 4475. https://doi.org/10.1038/ncomms5475 <pub-id pub-id-type="doi">10.1038/ncomms5475</pub-id><pub-id pub-id-type="pmid">25042376</pub-id><ext-link ext-link-type="uri" xlink:href="https://doi.org/10.1038/ncomms5475">https://doi.org/10.1038/ncomms5475</ext-link></mixed-citation>
          <element-citation publication-type="other">
            <person-group person-group-type="author">
              <string-name>Qiao, J.</string-name>
              <string-name>Kong, X.</string-name>
              <string-name>Hu, Z.</string-name>
              <string-name>Yang, F.</string-name>
              <string-name>Ji, W.</string-name>
            </person-group>
            <year>2014</year>
            <article-title>High-Mobility Transport Anisotropy and Linear Dichroism in Few-Layer Black Phosphorus</article-title>
            <source>Nature Communications</source>
            <volume>5</volume>
            <elocation-id>No</elocation-id>
            <pub-id pub-id-type="doi">10.1038/ncomms5475</pub-id>
            <pub-id pub-id-type="pmid">25042376</pub-id>
          </element-citation>
        </citation-alternatives>
      </ref>
      <ref id="B7">
        <label>7.</label>
        <citation-alternatives>
          <mixed-citation publication-type="other">Ermolaev, G.A., Grudinin, D.V., Stebunov, Y.V., Voronin, K.V., Kravets, V.G., Duan, J., <italic>et al</italic>. (2021) Giant Optical Anisotropy in Transition Metal Dichalcogenides for Next-Generation Photonics. <italic>Nature Communications</italic>, 12, Article No. 854. https://doi.org/10.1038/s41467-021-21139-x <pub-id pub-id-type="doi">10.1038/s41467-021-21139-x</pub-id><pub-id pub-id-type="pmid">33558559</pub-id><ext-link ext-link-type="uri" xlink:href="https://doi.org/10.1038/s41467-021-21139-x">https://doi.org/10.1038/s41467-021-21139-x</ext-link></mixed-citation>
          <element-citation publication-type="other">
            <person-group person-group-type="author">
              <string-name>Ermolaev, G.A.</string-name>
              <string-name>Grudinin, D.V.</string-name>
              <string-name>Stebunov, Y.V.</string-name>
              <string-name>Voronin, K.V.</string-name>
              <string-name>Kravets, V.G.</string-name>
              <string-name>Duan, J.</string-name>
            </person-group>
            <year>2021</year>
            <article-title>Giant Optical Anisotropy in Transition Metal Dichalcogenides for Next-Generation Photonics</article-title>
            <source>Nature Communications</source>
            <volume>12</volume>
            <elocation-id>No</elocation-id>
            <pub-id pub-id-type="doi">10.1038/s41467-021-21139-x</pub-id>
            <pub-id pub-id-type="pmid">33558559</pub-id>
          </element-citation>
        </citation-alternatives>
      </ref>
      <ref id="B8">
        <label>8.</label>
        <citation-alternatives>
          <mixed-citation publication-type="other">Guo, Q., Zhang, Q., Zhang, T., Zhou, J., Xiao, S., Wang, S., <italic>et al</italic>. (2024) Colossal In-Plane Optical Anisotropy in a Two-Dimensional Van Der Waals Crystal. <italic>Nature Photonics</italic>, 18, 1170-1175. https://doi.org/10.1038/s41566-024-01501-3 <pub-id pub-id-type="doi">10.1038/s41566-024-01501-3</pub-id><ext-link ext-link-type="uri" xlink:href="https://doi.org/10.1038/s41566-024-01501-3">https://doi.org/10.1038/s41566-024-01501-3</ext-link></mixed-citation>
          <element-citation publication-type="other">
            <person-group person-group-type="author">
              <string-name>Guo, Q.</string-name>
              <string-name>Zhang, Q.</string-name>
              <string-name>Zhang, T.</string-name>
              <string-name>Zhou, J.</string-name>
              <string-name>Xiao, S.</string-name>
              <string-name>Wang, S.</string-name>
            </person-group>
            <year>2024</year>
            <article-title>Colossal In-Plane Optical Anisotropy in a Two-Dimensional Van Der Waals Crystal</article-title>
            <source>Nature Photonics</source>
            <volume>18</volume>
            <pub-id pub-id-type="doi">10.1038/s41566-024-01501-3</pub-id>
          </element-citation>
        </citation-alternatives>
      </ref>
      <ref id="B9">
        <label>9.</label>
        <citation-alternatives>
          <mixed-citation publication-type="other">Niu, S., Joe, G., Zhao, H., Zhou, Y., Orvis, T., Huyan, H., <italic>et al</italic>. (2018) Giant Optical Anisotropy in a Quasi-One-Dimensional Crystal. <italic>Nature Photonics</italic>, 12, 392-396. https://doi.org/10.1038/s41566-018-0189-1 <pub-id pub-id-type="doi">10.1038/s41566-018-0189-1</pub-id><ext-link ext-link-type="uri" xlink:href="https://doi.org/10.1038/s41566-018-0189-1">https://doi.org/10.1038/s41566-018-0189-1</ext-link></mixed-citation>
          <element-citation publication-type="other">
            <person-group person-group-type="author">
              <string-name>Niu, S.</string-name>
              <string-name>Joe, G.</string-name>
              <string-name>Zhao, H.</string-name>
              <string-name>Zhou, Y.</string-name>
              <string-name>Orvis, T.</string-name>
              <string-name>Huyan, H.</string-name>
            </person-group>
            <year>2018</year>
            <article-title>Giant Optical Anisotropy in a Quasi-One-Dimensional Crystal</article-title>
            <source>Nature Photonics</source>
            <volume>12</volume>
            <pub-id pub-id-type="doi">10.1038/s41566-018-0189-1</pub-id>
          </element-citation>
        </citation-alternatives>
      </ref>
      <ref id="B10">
        <label>10.</label>
        <citation-alternatives>
          <mixed-citation publication-type="other">Ma, W., Alonso-González, P., Li, S., Nikitin, A.Y., Yuan, J., Martín-Sánchez, J., <italic>et al</italic>. (2018) In-Plane Anisotropic and Ultra-Low-Loss Polaritons in a Natural Van Der Waals Crystal. <italic>Nature</italic>, 562, 557-562. https://doi.org/10.1038/s41586-018-0618-9 <pub-id pub-id-type="doi">10.1038/s41586-018-0618-9</pub-id><pub-id pub-id-type="pmid">30356185</pub-id><ext-link ext-link-type="uri" xlink:href="https://doi.org/10.1038/s41586-018-0618-9">https://doi.org/10.1038/s41586-018-0618-9</ext-link></mixed-citation>
          <element-citation publication-type="other">
            <person-group person-group-type="author">
              <string-name>Ma, W.</string-name>
              <string-name>Li, S.</string-name>
              <string-name>Nikitin, A.Y.</string-name>
              <string-name>Yuan, J.</string-name>
            </person-group>
            <year>2018</year>
            <article-title>In-Plane Anisotropic and Ultra-Low-Loss Polaritons in a Natural Van Der Waals Crystal</article-title>
            <source>Nature</source>
            <volume>562</volume>
            <pub-id pub-id-type="doi">10.1038/s41586-018-0618-9</pub-id>
            <pub-id pub-id-type="pmid">30356185</pub-id>
          </element-citation>
        </citation-alternatives>
      </ref>
      <ref id="B11">
        <label>11.</label>
        <citation-alternatives>
          <mixed-citation publication-type="book">Born, M. and Wolf, E. (2013) Principles of Optics: Electromagnetic Theory of Propagation, Interference and Diffraction of Light. 7th Edition, Elsevier.</mixed-citation>
          <element-citation publication-type="book">
            <person-group person-group-type="author">
              <string-name>Born, M.</string-name>
              <string-name>Wolf, E.</string-name>
              <string-name>Propagation, I</string-name>
              <string-name>Edition, E</string-name>
            </person-group>
            <year>2013</year>
            <article-title>Principles of Optics: Electromagnetic Theory of Propagation, Interference and Diffraction of Light</article-title>
            <source>7th Edition</source>
          </element-citation>
        </citation-alternatives>
      </ref>
      <ref id="B12">
        <label>12.</label>
        <citation-alternatives>
          <mixed-citation publication-type="book">Shurcliff, W.A. (1966) Polarized Light: Production and Use. Harvard University Press.</mixed-citation>
          <element-citation publication-type="book">
            <person-group person-group-type="author">
              <string-name>Shurcliff, W.A.</string-name>
            </person-group>
            <year>1966</year>
            <article-title>Polarized Light: Production and Use</article-title>
          </element-citation>
        </citation-alternatives>
      </ref>
      <ref id="B13">
        <label>13.</label>
        <citation-alternatives>
          <mixed-citation publication-type="journal">Jones, R.C. (1941) A New Calculus for the Treatment of Optical Systemsi Description and Discussion of the Calculus. <italic>Journal of the Optical Society of America</italic>, 31, 488-493. https://doi.org/10.1364/josa.31.000488 <pub-id pub-id-type="doi">10.1364/josa.31.000488</pub-id><ext-link ext-link-type="uri" xlink:href="https://doi.org/10.1364/josa.31.000488">https://doi.org/10.1364/josa.31.000488</ext-link></mixed-citation>
          <element-citation publication-type="journal">
            <person-group person-group-type="author">
              <string-name>Jones, R.C.</string-name>
            </person-group>
            <year>1941</year>
            <article-title>A New Calculus for the Treatment of Optical Systemsi Description and Discussion of the Calculus</article-title>
            <source>Journal of the Optical Society of America</source>
            <volume>31</volume>
            <pub-id pub-id-type="doi">10.1364/josa.31.000488</pub-id>
          </element-citation>
        </citation-alternatives>
      </ref>
      <ref id="B14">
        <label>14.</label>
        <citation-alternatives>
          <mixed-citation publication-type="other">Chipman, R.A. (1989) Polarization Analysis of Optical Systems. <italic>Optical Engineering</italic>, 28, 90-99.</mixed-citation>
          <element-citation publication-type="other">
            <person-group person-group-type="author">
              <string-name>Chipman, R.A.</string-name>
            </person-group>
            <year>1989</year>
            <article-title>Polarization Analysis of Optical Systems</article-title>
            <source>Optical Engineering</source>
            <volume>28</volume>
          </element-citation>
        </citation-alternatives>
      </ref>
      <ref id="B15">
        <label>15.</label>
        <citation-alternatives>
          <mixed-citation publication-type="other">Nitsche, R. and Fritz, T. (2004) Precise Determination of the Complex Optical Constant of Mica. <italic>Applied Optics</italic>, 43, 3263-3270. https://doi.org/10.1364/ao.43.003263 <pub-id pub-id-type="doi">10.1364/ao.43.003263</pub-id><pub-id pub-id-type="pmid">15181806</pub-id><ext-link ext-link-type="uri" xlink:href="https://doi.org/10.1364/ao.43.003263">https://doi.org/10.1364/ao.43.003263</ext-link></mixed-citation>
          <element-citation publication-type="other">
            <person-group person-group-type="author">
              <string-name>Nitsche, R.</string-name>
              <string-name>Fritz, T.</string-name>
            </person-group>
            <year>2004</year>
            <article-title>Precise Determination of the Complex Optical Constant of Mica</article-title>
            <source>Applied Optics</source>
            <volume>43</volume>
            <pub-id pub-id-type="doi">10.1364/ao.43.003263</pub-id>
            <pub-id pub-id-type="pmid">15181806</pub-id>
          </element-citation>
        </citation-alternatives>
      </ref>
      <ref id="B16">
        <label>16.</label>
        <citation-alternatives>
          <mixed-citation publication-type="journal">Ruthberg, S., Barnes, M.W. and Noyce, R.H. (1963) Correlation of Muscovite Sheet Mica on the Basis of Color, Apparent Optic Angle, and Absorption Spectrum. <italic>Journal of Research of the National Bureau of Standards Section A</italic>: <italic>Physics and Chemistry</italic>, 67, 309-324. https://doi.org/10.6028/jres.067a.033 <pub-id pub-id-type="doi">10.6028/jres.067a.033</pub-id><pub-id pub-id-type="pmid">31580569</pub-id><ext-link ext-link-type="uri" xlink:href="https://doi.org/10.6028/jres.067a.033">https://doi.org/10.6028/jres.067a.033</ext-link></mixed-citation>
          <element-citation publication-type="journal">
            <person-group person-group-type="author">
              <string-name>Ruthberg, S.</string-name>
              <string-name>Barnes, M.W.</string-name>
              <string-name>Noyce, R.H.</string-name>
              <string-name>Color, A</string-name>
            </person-group>
            <year>1963</year>
            <article-title>Correlation of Muscovite Sheet Mica on the Basis of Color, Apparent Optic Angle, and Absorption Spectrum</article-title>
            <source>Journal of Research of the National Bureau of Standards Section A: Physics and Chemistry</source>
            <volume>67</volume>
            <pub-id pub-id-type="doi">10.6028/jres.067a.033</pub-id>
            <pub-id pub-id-type="pmid">31580569</pub-id>
          </element-citation>
        </citation-alternatives>
      </ref>
      <ref id="B17">
        <label>17.</label>
        <citation-alternatives>
          <mixed-citation publication-type="other">Zhang, S.X., Liu, J., Zeng, J., Song, Y., Mo, D., Yao, H.J., <italic>et al</italic>. (2015) Effects of Swift Heavy Ion Irradiation Parameters on Optical Properties of Muscovite Mica. <italic>Nuclear Instruments and Methods in Physics Research Section B</italic>: <italic>Beam Interactions with Materials and Atoms</italic>, 343, 5-8. https://doi.org/10.1016/j.nimb.2014.10.028 <pub-id pub-id-type="doi">10.1016/j.nimb.2014.10.028</pub-id><ext-link ext-link-type="uri" xlink:href="https://doi.org/10.1016/j.nimb.2014.10.028">https://doi.org/10.1016/j.nimb.2014.10.028</ext-link></mixed-citation>
          <element-citation publication-type="other">
            <person-group person-group-type="author">
              <string-name>Zhang, S.X.</string-name>
              <string-name>Liu, J.</string-name>
              <string-name>Zeng, J.</string-name>
              <string-name>Song, Y.</string-name>
              <string-name>Mo, D.</string-name>
              <string-name>Yao, H.J.</string-name>
            </person-group>
            <year>2015</year>
            <article-title>Effects of Swift Heavy Ion Irradiation Parameters on Optical Properties of Muscovite Mica</article-title>
            <source>Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms</source>
            <volume>343</volume>
            <pub-id pub-id-type="doi">10.1016/j.nimb.2014.10.028</pub-id>
          </element-citation>
        </citation-alternatives>
      </ref>
      <ref id="B18">
        <label>18.</label>
        <citation-alternatives>
          <mixed-citation publication-type="other">Lu, X.F., Majewski, L.A. and Song, A.M. (2008) Electrical Characterization of Mica as an Insulator for Organic Field-Effect Transistors. <italic>Organic Electronics</italic>, 9, 473-480. https://doi.org/10.1016/j.orgel.2008.02.007 <pub-id pub-id-type="doi">10.1016/j.orgel.2008.02.007</pub-id><ext-link ext-link-type="uri" xlink:href="https://doi.org/10.1016/j.orgel.2008.02.007">https://doi.org/10.1016/j.orgel.2008.02.007</ext-link></mixed-citation>
          <element-citation publication-type="other">
            <person-group person-group-type="author">
              <string-name>Lu, X.F.</string-name>
              <string-name>Majewski, L.A.</string-name>
              <string-name>Song, A.M.</string-name>
            </person-group>
            <year>2008</year>
            <article-title>Electrical Characterization of Mica as an Insulator for Organic Field-Effect Transistors</article-title>
            <source>Organic Electronics</source>
            <volume>9</volume>
            <pub-id pub-id-type="doi">10.1016/j.orgel.2008.02.007</pub-id>
          </element-citation>
        </citation-alternatives>
      </ref>
      <ref id="B19">
        <label>19.</label>
        <citation-alternatives>
          <mixed-citation publication-type="other">Singh, L., Kaur, S., Singh, M. and Kaur, N. (2011) Electrical and Dielectric Characteristics of Annealed Muscovite Ruby Mica. <italic>Materials Physics and Mechanics</italic>, 11, 60-67.</mixed-citation>
          <element-citation publication-type="other">
            <person-group person-group-type="author">
              <string-name>Singh, L.</string-name>
              <string-name>Kaur, S.</string-name>
              <string-name>Singh, M.</string-name>
              <string-name>Kaur, N.</string-name>
            </person-group>
            <year>2011</year>
            <article-title>Electrical and Dielectric Characteristics of Annealed Muscovite Ruby Mica</article-title>
            <source>Materials Physics and Mechanics</source>
            <volume>11</volume>
          </element-citation>
        </citation-alternatives>
      </ref>
      <ref id="B20">
        <label>20.</label>
        <citation-alternatives>
          <mixed-citation publication-type="other">Arora, A., Ganapathi, K.L., Dixit, T., Miryala, M., Masato, M., Rao, M.S.R., <italic>et al</italic>. (2022) Thickness-Dependent Nonlinear Electrical Conductivity of Few-Layer Muscovite Mica. <italic>Physical Review Applied</italic>, 17, Article 064042. https://doi.org/10.1103/physrevapplied.17.064042 <pub-id pub-id-type="doi">10.1103/physrevapplied.17.064042</pub-id><ext-link ext-link-type="uri" xlink:href="https://doi.org/10.1103/physrevapplied.17.064042">https://doi.org/10.1103/physrevapplied.17.064042</ext-link></mixed-citation>
          <element-citation publication-type="other">
            <person-group person-group-type="author">
              <string-name>Arora, A.</string-name>
              <string-name>Ganapathi, K.L.</string-name>
              <string-name>Dixit, T.</string-name>
              <string-name>Miryala, M.</string-name>
              <string-name>Masato, M.</string-name>
              <string-name>Rao, M.S.R.</string-name>
            </person-group>
            <year>2022</year>
            <article-title>Thickness-Dependent Nonlinear Electrical Conductivity of Few-Layer Muscovite Mica</article-title>
            <source>Physical Review Applied</source>
            <volume>17</volume>
            <elocation-id>064042</elocation-id>
            <pub-id pub-id-type="doi">10.1103/physrevapplied.17.064042</pub-id>
          </element-citation>
        </citation-alternatives>
      </ref>
      <ref id="B21">
        <label>21.</label>
        <citation-alternatives>
          <mixed-citation publication-type="other">Saltas, V., Pentari, D. and Vallianatos, F. (2020) Complex Electrical Conductivity of Biotite and Muscovite Micas at Elevated Temperatures: A Comparative Study. <italic>Materials</italic>, 13, Article 3513. https://doi.org/10.3390/ma13163513 <pub-id pub-id-type="doi">10.3390/ma13163513</pub-id><pub-id pub-id-type="pmid">32784871</pub-id><ext-link ext-link-type="uri" xlink:href="https://doi.org/10.3390/ma13163513">https://doi.org/10.3390/ma13163513</ext-link></mixed-citation>
          <element-citation publication-type="other">
            <person-group person-group-type="author">
              <string-name>Saltas, V.</string-name>
              <string-name>Pentari, D.</string-name>
              <string-name>Vallianatos, F.</string-name>
            </person-group>
            <year>2020</year>
            <article-title>Complex Electrical Conductivity of Biotite and Muscovite Micas at Elevated Temperatures: A Comparative Study</article-title>
            <source>Materials</source>
            <volume>13</volume>
            <elocation-id>3513</elocation-id>
            <pub-id pub-id-type="doi">10.3390/ma13163513</pub-id>
            <pub-id pub-id-type="pmid">32784871</pub-id>
          </element-citation>
        </citation-alternatives>
      </ref>
      <ref id="B22">
        <label>22.</label>
        <citation-alternatives>
          <mixed-citation publication-type="thesis">Vasseur, J. (2006) Multiwavelength Laser Sources for Broadband Optical Access Networks. Ph.D. Thesis, School of Electrical and Computer Engineering, Georgia Institute of Technology.</mixed-citation>
          <element-citation publication-type="thesis">
            <person-group person-group-type="author">
              <string-name>Vasseur, J.</string-name>
              <string-name>Thesis, S</string-name>
              <string-name>Engineering, G</string-name>
            </person-group>
            <year>2006</year>
            <article-title>Multiwavelength Laser Sources for Broadband Optical Access Networks</article-title>
            <source>Ph.D. Thesis</source>
          </element-citation>
        </citation-alternatives>
      </ref>
      <ref id="B23">
        <label>23.</label>
        <citation-alternatives>
          <mixed-citation publication-type="thesis">Persson, L. (2025) Simulation and Characterization of Thermal and Optical Effects in Surface-Emitting Lasers. Ph.D. Thesis, Chalmers University of Technology, Gothenburg.</mixed-citation>
          <element-citation publication-type="thesis">
            <person-group person-group-type="author">
              <string-name>Persson, L.</string-name>
              <string-name>Thesis, C</string-name>
              <string-name>Technology, G</string-name>
            </person-group>
            <year>2025</year>
            <article-title>Simulation and Characterization of Thermal and Optical Effects in Surface-Emitting Lasers</article-title>
            <source>Ph.D. Thesis</source>
          </element-citation>
        </citation-alternatives>
      </ref>
      <ref id="B24">
        <label>24.</label>
        <citation-alternatives>
          <mixed-citation publication-type="confproc">Yousif, N.A. and Al-Jawad, S.M.H. (2021) Influence of Laser Wavelength on Morphological and Optical Properties of ZnO Nanoparticles Prepared by Laser Ablation in Water. <italic>Journal of Physics</italic>: <italic>Conference Series</italic>, 1795, Article 012056. https://doi.org/10.1088/1742-6596/1795/1/012056 <pub-id pub-id-type="doi">10.1088/1742-6596/1795/1/012056</pub-id><ext-link ext-link-type="uri" xlink:href="https://doi.org/10.1088/1742-6596/1795/1/012056">https://doi.org/10.1088/1742-6596/1795/1/012056</ext-link></mixed-citation>
          <element-citation publication-type="confproc">
            <person-group person-group-type="author">
              <string-name>Yousif, N.A.</string-name>
              <string-name>Al-Jawad, S.M.H.</string-name>
            </person-group>
            <year>2021</year>
            <article-title>Influence of Laser Wavelength on Morphological and Optical Properties of ZnO Nanoparticles Prepared by Laser Ablation in Water</article-title>
            <source>Journal of Physics: Conference Series</source>
            <volume>1795</volume>
            <elocation-id>012056</elocation-id>
            <pub-id pub-id-type="doi">10.1088/1742-6596/1795/1/012056</pub-id>
          </element-citation>
        </citation-alternatives>
      </ref>
      <ref id="B25">
        <label>25.</label>
        <citation-alternatives>
          <mixed-citation publication-type="other">Zheng, Q., Zhang, Y., Liu, T., Huang, J., Xue, N. and Shi, Q. (2017) Optimal Location of Vanadium in Muscovite and Its Geometrical and Electronic Properties by DFT Calculation. <italic>Minerals</italic>, 7, Article 32. https://doi.org/10.3390/min7030032 <pub-id pub-id-type="doi">10.3390/min7030032</pub-id><ext-link ext-link-type="uri" xlink:href="https://doi.org/10.3390/min7030032">https://doi.org/10.3390/min7030032</ext-link></mixed-citation>
          <element-citation publication-type="other">
            <person-group person-group-type="author">
              <string-name>Zheng, Q.</string-name>
              <string-name>Zhang, Y.</string-name>
              <string-name>Liu, T.</string-name>
              <string-name>Huang, J.</string-name>
              <string-name>Xue, N.</string-name>
              <string-name>Shi, Q.</string-name>
            </person-group>
            <year>2017</year>
            <article-title>Optimal Location of Vanadium in Muscovite and Its Geometrical and Electronic Properties by DFT Calculation</article-title>
            <source>Minerals</source>
            <volume>7</volume>
            <elocation-id>32</elocation-id>
            <pub-id pub-id-type="doi">10.3390/min7030032</pub-id>
          </element-citation>
        </citation-alternatives>
      </ref>
      <ref id="B26">
        <label>26.</label>
        <citation-alternatives>
          <mixed-citation publication-type="journal">Teich-McGoldrick, S.L., Greathouse, J.A. and Cygan, R.T. (2012) Molecular Dynamics Simulations of Structural and Mechanical Properties of Muscovite: Pressure and Temperature Effects. <italic>The Journal of Physical Chemistry C</italic>, 116, 15099-15107. https://doi.org/10.1021/jp303143s <pub-id pub-id-type="doi">10.1021/jp303143s</pub-id><ext-link ext-link-type="uri" xlink:href="https://doi.org/10.1021/jp303143s">https://doi.org/10.1021/jp303143s</ext-link></mixed-citation>
          <element-citation publication-type="journal">
            <person-group person-group-type="author">
              <string-name>Teich-McGoldrick, S.L.</string-name>
              <string-name>Greathouse, J.A.</string-name>
              <string-name>Cygan, R.T.</string-name>
            </person-group>
            <year>2012</year>
            <article-title>Molecular Dynamics Simulations of Structural and Mechanical Properties of Muscovite: Pressure and Temperature Effects</article-title>
            <source>The Journal of Physical Chemistry C</source>
            <volume>116</volume>
            <pub-id pub-id-type="doi">10.1021/jp303143s</pub-id>
          </element-citation>
        </citation-alternatives>
      </ref>
      <ref id="B27">
        <label>27.</label>
        <citation-alternatives>
          <mixed-citation publication-type="other">Shafei, L., Adhikari, P. and Ching, W. (2021) DFT Study of Electronic Structure and Optical Properties of Kaolinite, Muscovite, and Montmorillonite. <italic>Crystals</italic>, 11, Article 618. https://doi.org/10.3390/cryst11060618 <pub-id pub-id-type="doi">10.3390/cryst11060618</pub-id><ext-link ext-link-type="uri" xlink:href="https://doi.org/10.3390/cryst11060618">https://doi.org/10.3390/cryst11060618</ext-link></mixed-citation>
          <element-citation publication-type="other">
            <person-group person-group-type="author">
              <string-name>Shafei, L.</string-name>
              <string-name>Adhikari, P.</string-name>
              <string-name>Ching, W.</string-name>
              <string-name>Kaolinite, M</string-name>
            </person-group>
            <year>2021</year>
            <article-title>DFT Study of Electronic Structure and Optical Properties of Kaolinite, Muscovite, and Montmorillonite</article-title>
            <source>Crystals</source>
            <volume>11</volume>
            <elocation-id>618</elocation-id>
            <pub-id pub-id-type="doi">10.3390/cryst11060618</pub-id>
          </element-citation>
        </citation-alternatives>
      </ref>
      <ref id="B28">
        <label>28.</label>
        <citation-alternatives>
          <mixed-citation publication-type="other">Curtarolo, S., Hart, G.L.W., Nardelli, M.B., Mingo, N., Sanvito, S. and Levy, O. (2013) The High-Throughput Highway to Computational Materials Design. <italic>Nature Materials</italic>, 12, 191-201. https://doi.org/10.1038/nmat3568 <pub-id pub-id-type="doi">10.1038/nmat3568</pub-id><pub-id pub-id-type="pmid">23422720</pub-id><ext-link ext-link-type="uri" xlink:href="https://doi.org/10.1038/nmat3568">https://doi.org/10.1038/nmat3568</ext-link></mixed-citation>
          <element-citation publication-type="other">
            <person-group person-group-type="author">
              <string-name>Curtarolo, S.</string-name>
              <string-name>Hart, G.L.W.</string-name>
              <string-name>Nardelli, M.B.</string-name>
              <string-name>Mingo, N.</string-name>
              <string-name>Sanvito, S.</string-name>
              <string-name>Levy, O.</string-name>
            </person-group>
            <year>2013</year>
            <article-title>The High-Throughput Highway to Computational Materials Design</article-title>
            <source>Nature Materials</source>
            <volume>12</volume>
            <pub-id pub-id-type="doi">10.1038/nmat3568</pub-id>
            <pub-id pub-id-type="pmid">23422720</pub-id>
          </element-citation>
        </citation-alternatives>
      </ref>
      <ref id="B29">
        <label>29.</label>
        <citation-alternatives>
          <mixed-citation publication-type="other">Riedmaier, S., Danquah, B., Schick, B. and Diermeyer, F. (2021) Unified Framework and Survey for Model Verification, Validation and Uncertainty Quantification. <italic>Archives of Computational Methods in</italic><italic>Engineering</italic>, 28, 2655-2688. https://doi.org/10.1007/s11831-020-09473-7 <pub-id pub-id-type="doi">10.1007/s11831-020-09473-7</pub-id><ext-link ext-link-type="uri" xlink:href="https://doi.org/10.1007/s11831-020-09473-7">https://doi.org/10.1007/s11831-020-09473-7</ext-link></mixed-citation>
          <element-citation publication-type="other">
            <person-group person-group-type="author">
              <string-name>Riedmaier, S.</string-name>
              <string-name>Danquah, B.</string-name>
              <string-name>Schick, B.</string-name>
              <string-name>Diermeyer, F.</string-name>
              <string-name>Verification, V</string-name>
            </person-group>
            <year>2021</year>
            <article-title>Unified Framework and Survey for Model Verification, Validation and Uncertainty Quantification</article-title>
            <source>Archives of Computational Methods in Engineering</source>
            <volume>28</volume>
            <pub-id pub-id-type="doi">10.1007/s11831-020-09473-7</pub-id>
          </element-citation>
        </citation-alternatives>
      </ref>
      <ref id="B30">
        <label>30.</label>
        <citation-alternatives>
          <mixed-citation publication-type="book">Oberkampf, W.L. and Roy, C.J. (2010) Verification and Validation in Scientific Computing. Cambridge University Press. https://doi.org/10.1017/cbo9780511760396 <pub-id pub-id-type="doi">10.1017/cbo9780511760396</pub-id><ext-link ext-link-type="uri" xlink:href="https://doi.org/10.1017/cbo9780511760396">https://doi.org/10.1017/cbo9780511760396</ext-link></mixed-citation>
          <element-citation publication-type="book">
            <person-group person-group-type="author">
              <string-name>Oberkampf, W.L.</string-name>
              <string-name>Roy, C.J.</string-name>
            </person-group>
            <year>2010</year>
            <article-title>Verification and Validation in Scientific Computing</article-title>
            <pub-id pub-id-type="doi">10.1017/cbo9780511760396</pub-id>
          </element-citation>
        </citation-alternatives>
      </ref>
      <ref id="B31">
        <label>31.</label>
        <citation-alternatives>
          <mixed-citation publication-type="other">Coleman, H.W. and Steele, W.G. (2009) Experimentation, Validation, and Uncertainty Analysis for Engineers. Wiley. https://doi.org/10.1002/9780470485682 <pub-id pub-id-type="doi">10.1002/9780470485682</pub-id><ext-link ext-link-type="uri" xlink:href="https://doi.org/10.1002/9780470485682">https://doi.org/10.1002/9780470485682</ext-link></mixed-citation>
          <element-citation publication-type="other">
            <person-group person-group-type="author">
              <string-name>Coleman, H.W.</string-name>
              <string-name>Steele, W.G.</string-name>
              <string-name>Experimentation, V</string-name>
            </person-group>
            <year>2009</year>
            <article-title>Experimentation, Validation, and Uncertainty Analysis for Engineers</article-title>
            <pub-id pub-id-type="doi">10.1002/9780470485682</pub-id>
          </element-citation>
        </citation-alternatives>
      </ref>
      <ref id="B32">
        <label>32.</label>
        <citation-alternatives>
          <mixed-citation publication-type="book">Taylor, J.R. (1997) An Introduction to Error Analysis, The Study of Uncertainties in Physical Measurements. 2nd Edition, University Science Books.</mixed-citation>
          <element-citation publication-type="book">
            <person-group person-group-type="author">
              <string-name>Taylor, J.R.</string-name>
              <string-name>Analysis, T</string-name>
              <string-name>Edition, U</string-name>
            </person-group>
            <year>1997</year>
            <article-title>An Introduction to Error Analysis, The Study of Uncertainties in Physical Measurements</article-title>
            <source>2nd Edition</source>
          </element-citation>
        </citation-alternatives>
      </ref>
      <ref id="B33">
        <label>33.</label>
        <citation-alternatives>
          <mixed-citation publication-type="journal">Joint Committee for Guides in Metrology (2008) Evaluation of Measurement Data-Guide to the Expression of Uncertainty in Measurement (GUM 1995 with Minor Corrections). JCGM 100:2008.</mixed-citation>
          <element-citation publication-type="journal">
            <year>2008</year>
            <article-title>Evaluation of Measurement Data-Guide to the Expression of Uncertainty in Measurement (GUM 1995 with Minor Corrections)</article-title>
            <fpage>2008</fpage>
          </element-citation>
        </citation-alternatives>
      </ref>
      <ref id="B34">
        <label>34.</label>
        <citation-alternatives>
          <mixed-citation publication-type="journal">Haitjema, H. (1998) Uncertainty Analysis of Roughness Standard Calibration Using Stylus Instruments. <italic>Prec</italic><italic>ision Engineering</italic>, 22, 110-119. https://doi.org/10.1016/s0141-6359(97)00090-1 <pub-id pub-id-type="doi">10.1016/s0141-6359(97)00090-1</pub-id><ext-link ext-link-type="uri" xlink:href="https://doi.org/10.1016/s0141-6359(97)00090-1">https://doi.org/10.1016/s0141-6359(97)00090-1</ext-link></mixed-citation>
          <element-citation publication-type="journal">
            <person-group person-group-type="author">
              <string-name>Haitjema, H.</string-name>
            </person-group>
            <year>1998</year>
            <article-title>Uncertainty Analysis of Roughness Standard Calibration Using Stylus Instruments</article-title>
            <source>Precision Engineering</source>
            <volume>6359</volume>
            <issue>97</issue>
            <pub-id pub-id-type="doi">10.1016/s0141-6359(97)00090-1</pub-id>
          </element-citation>
        </citation-alternatives>
      </ref>
      <ref id="B35">
        <label>35.</label>
        <citation-alternatives>
          <mixed-citation publication-type="journal">Schwenke, H., Neuschaefer-Rube, U., Pfeifer, T. and Kunzmann, H, (2002) Optical Methods for Dimensional Metrology in Production Engineering. <italic>CIRP Annals</italic>, 51, 685-699. https://doi.org/10.1016/S0007-8506(07)61707-7 <pub-id pub-id-type="doi">10.1016/S0007-8506(07)61707-7</pub-id><ext-link ext-link-type="uri" xlink:href="https://doi.org/10.1016/S0007-8506(07)61707-7">https://doi.org/10.1016/S0007-8506(07)61707-7</ext-link></mixed-citation>
          <element-citation publication-type="journal">
            <person-group person-group-type="author">
              <string-name>Schwenke, H.</string-name>
              <string-name>Neuschaefer-Rube, U.</string-name>
              <string-name>Pfeifer, T.</string-name>
              <string-name>Kunzmann, H</string-name>
            </person-group>
            <year>2002</year>
            <article-title>Optical Methods for Dimensional Metrology in Production Engineering</article-title>
            <source>CIRP Annals</source>
            <volume>8506</volume>
            <issue>07</issue>
            <pub-id pub-id-type="doi">10.1016/S0007-8506(07)61707-7</pub-id>
          </element-citation>
        </citation-alternatives>
      </ref>
      <ref id="B36">
        <label>36.</label>
        <citation-alternatives>
          <mixed-citation publication-type="other">Sugioka, K., Meunier, M. and Piqué, A. (2010) Laser Precision Microfabrication. Springer Series in Materials Science, Vol. 135, Springer.</mixed-citation>
          <element-citation publication-type="other">
            <person-group person-group-type="author">
              <string-name>Sugioka, K.</string-name>
              <string-name>Meunier, M.</string-name>
              <string-name>Science, V</string-name>
            </person-group>
            <year>2010</year>
            <article-title>Laser Precision Microfabrication</article-title>
            <source>Springer Series in Materials Science</source>
          </element-citation>
        </citation-alternatives>
      </ref>
      <ref id="B37">
        <label>37.</label>
        <citation-alternatives>
          <mixed-citation publication-type="other">Singh, R.K. and Narayan, J. (1990) Pulsed-Laser Evaporation Technique for Deposition of Thin Films: Physics and Theoretical Model. <italic>Physical Review B</italic>, 41, 8843-8859. https://doi.org/10.1103/physrevb.41.8843 <pub-id pub-id-type="doi">10.1103/physrevb.41.8843</pub-id><pub-id pub-id-type="pmid">9993223</pub-id><ext-link ext-link-type="uri" xlink:href="https://doi.org/10.1103/physrevb.41.8843">https://doi.org/10.1103/physrevb.41.8843</ext-link></mixed-citation>
          <element-citation publication-type="other">
            <person-group person-group-type="author">
              <string-name>Singh, R.K.</string-name>
              <string-name>Narayan, J.</string-name>
            </person-group>
            <year>1990</year>
            <article-title>Pulsed-Laser Evaporation Technique for Deposition of Thin Films: Physics and Theoretical Model</article-title>
            <source>Physical Review B</source>
            <volume>41</volume>
            <pub-id pub-id-type="doi">10.1103/physrevb.41.8843</pub-id>
            <pub-id pub-id-type="pmid">9993223</pub-id>
          </element-citation>
        </citation-alternatives>
      </ref>
      <ref id="B38">
        <label>38.</label>
        <citation-alternatives>
          <mixed-citation publication-type="journal">Bonse, J., Hohm, S., Kirner, S.V., Rosenfeld, A. and Kruger, J. (2017) Laser-Induced Periodic Surface Structures—A Scientific Evergreen. <italic>IEEE Journal of Selected Topics in Quantum Electronics</italic>, 23, Article 9000615. https://doi.org/10.1109/jstqe.2016.2614183 <pub-id pub-id-type="doi">10.1109/jstqe.2016.2614183</pub-id><ext-link ext-link-type="uri" xlink:href="https://doi.org/10.1109/jstqe.2016.2614183">https://doi.org/10.1109/jstqe.2016.2614183</ext-link></mixed-citation>
          <element-citation publication-type="journal">
            <person-group person-group-type="author">
              <string-name>Bonse, J.</string-name>
              <string-name>Hohm, S.</string-name>
              <string-name>Kirner, S.V.</string-name>
              <string-name>Rosenfeld, A.</string-name>
              <string-name>Kruger, J.</string-name>
            </person-group>
            <year>2017</year>
            <article-title>Laser-Induced Periodic Surface Structures—A Scientific Evergreen</article-title>
            <source>IEEE Journal of Selected Topics in Quantum Electronics</source>
            <volume>23</volume>
            <elocation-id>9000615</elocation-id>
            <pub-id pub-id-type="doi">10.1109/jstqe.2016.2614183</pub-id>
          </element-citation>
        </citation-alternatives>
      </ref>
    </ref-list>
  </back>
</article>