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Srivastava, A., Sylvester, D. and Blaauw, D. (2004) Concurrent sizing, Vdd and V_th assignment for low-power design. Proceedings of Design, Automation and Test in Europe Conference and Exhibition, 1, 718- 719.

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• TITLE: A spatiotemporal signal processing technique for wafer-scale IC thermomechanical stress monitoring by an infrared camera

  AUTHORS: Michel Saydé, Ahmed Lakhssassi, Emmanuel Kengne, Roman Palenichka

  KEYWORDS: Thermal Monitoring; Ring Oscillator (RO); Spatial; Spatiotemporal; Thermo-Mechanical Stress; Temperature Sensor; Thermal Analysis; WaferIC; Wafer-Scale System

  JOURNAL NAME: Journal of Biosciences and Medicines, Vol.1 No.2, November 8, 2013

  ABSTRACT: In this paper, we describe a new silicon-die thermal monitoring approach using spatiotemporal signal processing technique for Wafer-Scale IC thermome- chanical stress monitoring. It is proposed in the context of a wafer-scale-based (WaferICTM) rapid prototyping platform for electronic systems. This technique will be embedded into the structure of the WaferIC, and will be used as a preventive measure to protect the wafer from possible damages that can be caused by excessive thermomechanical stress. The paper also presents spatial and spatiotemporal algorithms and the experimental results from an IR images collection campaign conducted using an IR camera.