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R. A. Vandermeer and D. T. Juul Jensen, “Microstruc- tural Path and Temperature Dependence of Recrystallization in Commercial Aluminum,” Acta Materialia, Vol. 49, No. 11, 2001, pp. 2083-2094. http://dx.doi.org/10.1016/S1359-6454(01)00074-X

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