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S. Loughin, R H French, L K De Noyer, W-Y Ching and Y-N Xu, “Critical Point Analysis of the Interband Transi-tion Strength of Electron,” Journal of Physics D: Applied Physics, Vol. 29, No. 7, 1996, pp. 1740-1750. doi:10.1088/0022-3727/29/7/009

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