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K. Lal and G. Bhagavannarayana, “A High-Resolution Diffuse X-Ray Scattering Study of Defects in Dislocation-Free Silicon Crystals Grown by the Float-Zone Me- thod and Comparison with Czochralski-Grown Crystals,” Journal of Applied Crystallography, Vol. 22, No. 3, 1989, pp. 209-215. http://dx.doi.org/10.1107/S0021889888014062

has been cited by the following article:

• TITLE: Bulk Growth and Characterization of D-(–)-Alanine Single Crystals

  AUTHORS: Kalimuthu Moovendaran, Subramanian Natarajan

  KEYWORDS: D-(–)-Alanine; NLO Material; MKN Setup; HRXRD; CD; SHG

  JOURNAL NAME: Journal of Crystallization Process and Technology, Vol.3 No.4, October 18, 2013

  ABSTRACT: Single crystal of D-(–)-alanine (DALA), a non-linear optical material from the amino acid family was grown using a home-made crystal growth setup. The crystals of DALA were also grown by slow evaporation solution technique (SEST). The grown crystals were characterized by using single crystal X-ray diffraction, high resolution X-ray diffraction (HRXRD) and UV-vis-NIR and CD spectroscopy. Measurements of Vicker’s microhardness, laser damage threshold (LDT) value and second harmonic generation (SHG) efficiency are also reported. Thermal and dielectric studies were also carried out.