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F. J. Giessibl, “Atomic Resolution of the Silicon (111)- (7x7) Surface by Atomic Force Microscopy,” Science, Vol. 267, 1995, pp. 68-72. doi:10.1126/science.267.5194.68

has been cited by the following article:

• TITLE: Self-Sensing and –Actuating Probes for Tapping Mode AFM Measurements of Soft Polymers at a Wide Range of Temperatures

  AUTHORS: Nadejda B. Matsko, Julian Wagner, Anton Efimov, Ines Haynl, Stefan Mitsche, Wolfgang Czapek, Boris Matsko, Werner Grogger, Ferdinand Hofer

  KEYWORDS: Tuning Fork, Sharp Tungsten Tip, AFM, Tapping Mode, Soft Materials

  JOURNAL NAME: Journal of Modern Physics, Vol.2 No.2, March 22, 2011

  ABSTRACT: Self-sensing and –actuating probes optimized for conventional tapping mode atomic force microscopy (AFM) are described. 32-kHz quartz tuning forks with a chemically etched and focus ion beam (FIB) sharpened (curvature radii are 5-10 nm) tungsten tip are stable at air and liquid nitrogen atmosphere and at a wide range of temperatures. If driven at constant frequency, the scan speed of such sensors can be up to 3 Hz. AFM was performed on polymer samples in order to study the stability and applicability of these sensor for investigation of soft materials with high dynamical tendencies.