Article citationsMore>>

K. Nakamura, T. Toriyama and S. Sugiyama, “First-Principles Simulation on Thickness Dependence of Piezoresistance Effect in Silicon Nanosheets,” Japanese Journal of Applied Physics, Vol. 49, No. 6, 2010, Article ID: 06GH01. http://dx.doi.org/10.1143/JJAP.49.06GH01

has been cited by the following article:

SCIRP Newsletter
Copyright © 2006-2026 Scientific Research Publishing Inc. All Rights Reserved.
Top