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K. Nakamura, T. Toriyama and S. Sugiyama, “First-Principles Simulation on Piezoresistive Properties in Doped Silicon Nanosheets,” IEEJ Transactions on Electrical and Electronic Engineering, Vol. 5, No. 2, 2010, pp. 157-163. http://dx.doi.org/10.1002/tee.20511

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