Article citationsMore>>

J. F. Scott, M. Azuma, E. Fujii, T. Otsuki, G. Kano, M. C. Scott, C. A. Paz de Araujo, L. D. McMillan and T. Roberts, “Microstructure-Induced Schottky Barrier Effects in Barium Strontium Titanate (BST) Thin Films for 16 and 64 Mbit (DRAM cells),” Proceedings of International Symposium on Integrated Ferroelectrics, New York, 1992, p. 356.

has been cited by the following article:

SCIRP Newsletter
Copyright © 2006-2026 Scientific Research Publishing Inc. All Rights Reserved.
Top