Article citationsMore>>

H. Alves, D. Pfisterer, A. Zeuner, T. Riemann, J. Christen, D. M. Hofmann and B. K. Meyer, “Optical Investigations on Excitons Bound to Impurities and Dislocations in ZnO,” Optical Materials, Vol. 23, No. 1-2, 2003, pp. 33-37. doi:10.1016/S0925-3467(03)00055-7

has been cited by the following article:

• TITLE: ZnO Heteroepitaxy on Sapphire Using a Novel Buffer Layer of Titanium Oxide: Optoelectronic Behavior

  AUTHORS: Satoshi Yamauchi, Yoh Imai

  KEYWORDS: ZnO; Ti2O3; Plasma-Assisted Epitaxy; Photoluminescence; Free-Exciton; Bound-Exciton

  JOURNAL NAME: Crystal Structure Theory and Applications, Vol.2 No.3, September 25, 2013

  ABSTRACT: Optoelectronic property of ZnO epitaxial layer grown by plasma-assisted epitaxy at temperature as low as 340°C using Ti2O3 buffer layer on a-sapphire were studied by low temperature photoluminescence at 10 K comparing to the layers on c-sapphire and a-sapphire without the buffer layer. The near band-edge emission consisting of free-exciton emissions and neutral-donor bound exciton emissions was significantly dependent on the buffer thickness and dominated by the free-exciton emissions in the layer grown on the very thin buffer layer about 0.8 nm, whereas the intense emissions by neutral-donor bound excitons were observed in the ZnO layer on c-sapphire. The structural behavior indicated the donor was originated from the three-dimensional growth of ZnO layer and details of the optoelectronic feature suggested the residual donors were Al and interstitial-Zn.