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P. Babelon, A. S. Dequiedt, H. Moste’fa-Sba, S. Bourgeois, P. Sibillot and M. Sacilotti, “SEM and XPS Studies of Titanium Dioxide Thin Films Grown by MOCVD,” Thin Solid Films, Vol. 322, No. 1-2, 1998, pp. 63-67. doi:10.1016/S0040-6090(97)00958-9

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