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A. P. Kravets, T. A. Mousseau, A. V. Litvinchuk, Sh. Ostermiller and G. Vengzhen, “Changes in DNA Methylation Pattern in Weat Plants under Chronical γ—Exposure of Seeds,” Cytology and Genetics, Vol. 44, No. 5, 2010, pp. 18-22. doi:10.3103/S0095452710050038

has been cited by the following article:

• TITLE: An Analysis of the Correlation between the Changes in Sa-tellite DNA Methylation Patterns and Plant Cell Responses to the Stress

  AUTHORS: Darina A. Sokolova, Galina S. Vengzhen, Alexandra P. Kravets

  KEYWORDS: Stress Response; Plant Resistance; Satellite DNA Methylation Pattern; Brave-Pirson Linear Correlation

  JOURNAL NAME: CellBio, Vol.2 No.3, September 18, 2013

  ABSTRACT: The differences in satellite DNA methylation pattern of corn seedlings with various spontaneous chromosome aberration yields and changes in methylation pattern of these DNA sequences under different exposure modes of acute UV-C and chronic gamma-irradiations have been investigated. The obtained experimental data and the conducted correlation analysis demonstrated the significant correlation between the satellite DNA methylation pattern varieties and chromosome aberration yields under various stress exposure modes. The role of satellite DNA methylation pattern variability and its changing in key responses to stress such as mobile elements’ activation, cell’s passage of checkpoints, and homological repair was discussed.