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B. Kruseman, B. Tasic, C. Hora, J. Dohmen, H. Hashempour, M. van Beurden and Y. Xing, “Defect Oriented Testing for Analog/Mixed-Signal Designs,” IEEE Design & Test of Computers, Vol. 29, No. 5, 2012, pp. 72-80. doi:10.1109/MDT.2012.2210852

has been cited by the following article:

• TITLE: Analogue and Mixed-Signal Production Test Speed-Up by Means of Fault List Compression

  AUTHORS: Nuno Guerreiro, Marcelino Santos, Paulo Teixeira

  KEYWORDS: Test; Fault Model; Fault Clustering; Fault Simulation; Fault Representativeness; Analog; Mixed-Signal Test

  JOURNAL NAME: Circuits and Systems, Vol.4 No.5, September 12, 2013

  ABSTRACT: Accurate test effectiveness estimation for analogue and mixed-signal Systems on a Chip (SoCs) is currently prohibitive in the design environment. One of the factors that sky rockets fault simulation costs is the number of structural faults which need to be simulated at circuit-level. The purpose of this paper is to propose a novel fault list compression technique by defining a stratified fault list, build with a set of “representative” faults, one per stratum. Criteria to partition the fault list in strata, and to identify representative faults are presented and discussed. A fault representativeness metric is proposed, based on an error probability. The proposed methodology allows different tradeoffs between fault list compression and fault representation accuracy. These tradeoffs may be optimized for each test preparation phase. The fault representativeness vs. fault list compression tradeoff is evaluated with an industrial case study—a DC-DC (switched buck converter). Although the methodology is presented in this paper using a very simple fault model, it may be easily extended to be used with more elaborate fault models. The proposed technique is a significant contribution to make mixed-signal fault simulation cost-effective as part of the production test preparation.