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Y. I. Huang, R. S. Huang and L. L. His, “A New Structured ISFET with Integrated Ti/PdAg/AgCl Electrode and Micromachined Back-Side P+ Contacts,” Journal of the Chinese Institute of Engineers, Vol. 25, No. 3, 2002, pp. 327-334. doi:10.1080/0253389.2002.9670707

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