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O. V. Rengevych, Y. M. Shirshov, Y. V. Ushenin and G. V. Bektov, “Separate Determination of Thickness and Optical Parameters by Surface Plasmon Resonance: Accuracy Consideration,” Semiconductor Physics, Quantum Electronics & Optoelectronics, Vol. 2, No. 2, 1999, pp. 28-35.
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