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N. Hellgren, J. Guo, Y. Luo, C. S?the, A. Agui, S. Kashtanov, J. Nordgren and H. ?grenJ.-E. Sundgren, “Electronic Structure of Carbon Nitride Thin Films Studied by X-Ray Spectroscopy Techniques,” Thin Solid Films, Vol. 471, No. 1-2, 2005, pp. 19-34.
doi:10.1016/j.tsf.2004.03.027
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