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M. J. W. Rodwell, S. T. Allen, R. Y. Yu, M. G. Case, U. Bhattacharya, M. Reddy, E. Carman, M. Kamegawa, Y. Konishi, J. Pusl and R. Pullela, Proceedings of IEEE, Vol. 82, 1994, pp. 1037-1059. doi:10.1109/5.293161

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