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M. M. Fouad, A. H. Madian, H. H. Amer and M. B. Ab delHalim, “Low Cost Test for Catastrophic Faults in CMOS Operational Transconductor,” Proceedings of the International Conference on Microelectronics ICM, Hammamet, 19-22 December 2011, pp. 1-5. doi:10.1109/ICM.2011.6177397

has been cited by the following article:

• TITLE: Current Mode Logic Testing of XOR/XNOR Circuit: A Case Study

  AUTHORS: Mona M. Fouad, Hassanein H. Amer, Ahmed H. Madian, Mohamed B. Abdelhalim

  KEYWORDS: Current Mode Logic (CML); CMOS; Testing; Stuck-At Faults

  JOURNAL NAME: Circuits and Systems, Vol.4 No.4, August 12, 2013

  ABSTRACT: This paper investigates the issue of testing Current Mode Logic (CML) gates. A three-bit parity checker is used as a case study. It is first shown that, as expected, the stuck-at fault model is not appropriate for testing CML gates. It is then proved that switching the order in which inputs are applied to a gate will affect the minimum test set; this is not the case in conventional voltage mode gates. Both the circuit output and its inverse have to be monitored to reduce the size of the test set.