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P. Vasa, B. P. Singh, P. Taneja and P. Ayyub, “Antiresonant Ring Interferometry as a Sensitive Technique for Measuring Nonlinear Optical Properties of Thin Films,” Optics Communications, Vol. 233, No. 4-6, 2004, pp. 297-304. doi:10.1016/j.optcom.2004.01.051

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