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R. I. Tobey, M. E. Siemens, O. Cohen, M. M. Murnane, H. C. Kapteyn and K. A. Nelson, “Ultrafast Extreme Ultraviolet Holography: Dynamic Monitoring of Surface Deformation,” Optics Letters, Vol. 32, No. 3, 2007, pp. 286-288. doi:10.1364/OL.32.000286

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