TITLE:
Image Correction Method of Color Line-Scan System
AUTHORS:
Zhen-long Chen, Yu-tang Ye, Yun-cen Song, Ying Luo, Lin Liu, Juan-xiu Liu
KEYWORDS:
Machine Vision; Automatic Optical Inspection (AOI); Color Line-scan System; White Balance; Flat-field Correction
JOURNAL NAME:
Optics and Photonics Journal,
Vol.3 No.2B,
July
23,
2013
ABSTRACT: As the development of
machine vision technology, the color line-scan system is widely applied in the
on-line inspection. Due to the non-uniform gray scale and color distortion of
the image acquired by the system, the image correction is needed to reduce the
problem of image processing and the stability system. Based on reasons
mentioned above, a method that using polynomial fitting to correct the image is
presented to solve the problem in this paper. The method has been used in the
automatic optical inspection of PCB, and has been proved to be effective. So
this method will have a potential application to the development of the color
line-scan machine vision system.