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N. M. Makarov and Y. V. Tarasov, “Electron Localization in Narrow Surface-Corrugated Conducting Channels: Manifestation of Competing Scattering Mechanisms,” Physical Review B, Vol. 64, No.23, 2001, p. 235306. doi:10.1103/PhysRevB.64.235306

has been cited by the following article:

• TITLE: Analysis of Microdisk/Microring’s Surface Roughness Effect by Orthogonal Decomposition

  AUTHORS: Chengle Sui, Qiangmin Wang, Shilin Xiao, Pingqing Li

  KEYWORDS: Orthogonal Decomposition; Micro-resonator; Surface Roughness Effect

  JOURNAL NAME: Optics and Photonics Journal, Vol.3 No.2B, July 23, 2013

  ABSTRACT: Application of micro-resonator is limited by different types of surface inhomogeneity. The 1-th derivative of inhomogeneity (i.e. Δrˊ(φ)) affects the wave transport as well as the height of inhomogeneity (i.e. Δrˊ(φ)). A method based on orthogonal decomposition is proposed to analysis both scattering mechanism respectively. Then surface roughness effect on Q-factor of micro-disk waveguide gallery mode (WGM) resonator is investigated with our method and the analysis fits well with FDTD simulation results.