Article citationsMore>>

K. L. Ding, Y. Z. Shen and J. K. Ou, “Methods of Line-Fitting Based on Total Least-Squares,” Journal of Liaoning Technical University, Vol. 29, 2010, pp.44-47.

has been cited by the following article:

• TITLE: Research on the Dark Stripes Extraction Algorithm for Measuring Diameter with Diffraction

  AUTHORS: Quan Liu, Fenglin Wei

  KEYWORDS: Diffraction; Diameter Measurement; Dark Stripes Extract; Least Squares Fitting

  JOURNAL NAME: Optics and Photonics Journal, Vol.3 No.2B, July 18, 2013

  ABSTRACT: The optical diffraction is a major means of minute diameter measurements. Since the light intensity of the diffraction fringe, mainly distributed in the central bright stripes, and that will lead to a relatively low SNR for the signal of the senior stripes. The traditional dark stripes extraction algorithm affected greatly by the noise. So this paper presents an algorithm that could effectively eliminate the gross errorcaused by the noise. Than by curve fitting the local signal of the diffraction pattern with the least square principle, the system could achieve a high measurement precision.