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S. John T. Van Noort, Kees. Van der Werf, Bart G. De Grooth, Niek F. Van Hulst and Jan Greve, “Height Anomalies in Tapping Mode Atomic Force Microscopy in Air Caused by Adhesion,” Ultramicroscopy, Vol. 69, No. 2, 1997, pp. I 17-I 27.

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