Article citationsMore>>

S. Bouchoule, L. Vallier, T. Chevolleau and C. Cardinaud, “Effect of Cl2- and HBr-based Inductively Coupled Plasma Etching on InP Surface Composition Analyzed Using in Situ X-Ray Photoelectron Spectroscopy,” Journal of Vacuum Science & Technology A, Vol. 30, No. 3, 2012, pp. 31301-31312.

has been cited by the following article:

SCIRP Newsletter
Copyright © 2006-2026 Scientific Research Publishing Inc. All Rights Reserved.
Top