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F. S. Hung, F. Y. Hung and C. M. Chiang, “Crystallization and Annealing Effects of Sputtered tin Alloy Films on Electromagnetic Interference Shielding,” Applied Surface Science, Vol. 257, No. 8, 2011, pp. 3733-3738. doi:10.1016/j.apsusc.2010.11.126

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