Article citationsMore>>

R. Heintzmann, T. Jovin and C. Cremer, “Saturated Patterned Excitation Microscopy—A Concept for Optical Resolution Improvement,” Journal of the Optical Society of America A, Vol. 19, No. 8, 2002, pp. 1599-1609. doi:10.1364/JOSAA.19.001599

has been cited by the following article:

• TITLE: A Low Cost and Versatile STED Superresolution Fluorescent Microscope

  AUTHORS: Daniel McBride, Chin Su, Jun Kameoka, Stanislav Vitha

  KEYWORDS: Stimulated Emission-Depletion Microscopy; STED

  JOURNAL NAME: Modern Instrumentation, Vol.2 No.3, July 12, 2013

  ABSTRACT: A versatile and inexpensive super-resolution fluorescent microscope that functions as easily as a conventional confocal microscope is described. Components of the microscope were designed on a platform which was placed atop a surplus microscope frame. All optical components and equipments used are given. The excitation and depletion beams are extracted from a compact low-cost supercontinuum light source. The focal spot of the depletion beam at the focal plane is studied and imaged by a 100 nm aperture near-field fiber tip. The collinear excitation and depletion beam focused by a 0.9 numerical aperture microscope objective produce a 90 nm lateral super-resolution as verified by imaging 100 nm diameter fluorescent beads.