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F. Sugimoto, S. Okamura, T. Inokuma, Y. Kurata and S. Hasegawa, “Influence of Organic Contamination on Silicon Dioxide Integrity,” Japanese Journal of Applied Physics, Vol. 39, No. 5A, 2000, pp. 2497-2502. doi:10.1143/JJAP.39.2497

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