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A. Avila and B. Bhushan, “Electrical Measurement Techniques in Atomic Force Microscopy,” Critical Reviews in Solid State and Materials Sciences, Vol. 35, No. 1, 2010, pp. 38-51. doi:10.1080/10408430903362230

has been cited by the following article:

• TITLE: Surface Characterisation of a Ferroelectric Single Crystal by Kelvin Probe Force Microscopy

  AUTHORS: Kenny Lau, Yun Liu, Qian Li, Zhenrong Li, Ray L. Withers, Zhuo Xu

  KEYWORDS: Surface Potential; KPFM; Ferroelectric

  JOURNAL NAME: Journal of Surface Engineered Materials and Advanced Technology, Vol.3 No.3, July 10, 2013

  ABSTRACT: We investigated the surface potential dynamics of a ferroelectric Pb(In1/2Nb1/2)O3-Pb(Mg1/3Nb2/3)O3-PbTiO3 (PIMNT) single crystal using Kelvin probe force microscopy (KPFM). The initial surface potential is a function of the applied bias since it reflects the interplay between the polarisation and screen charges. It is suggested that the different rates of tip injected charges are responsible for the asymmetric behaviour of the initial surface potential dependent on the sign of the applied bias. The polarisation, screen and tip injected charges are considered to explain the difference in surface potential dynamics.