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P. M. Mehl, Y. R. Chen, M. S. Kim and D. E. Chan, “Development of Hyperspectral Imaging Technique for the Detection of Apple Surface Defects and Contaminations,” Journal Food Engineering, Vol. 61, No. 1, 2004, pp. 6781. doi:10.1016/S0260-8774(03)00188-2

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