Article citationsMore>>

L.-J. Meng, V. Teixeira and M. P. dos Santos, “Raman Spectroscopy Analysis of Magnetron Sputtered RuO2 Thin Films,” Thin Solid Films, Vol. 442, No. 1-2, 2003, pp. 93-97. doi:org/10.1016/S0040-6090(03)00953-2

has been cited by the following article:

SCIRP Newsletter
Copyright © 2006-2026 Scientific Research Publishing Inc. All Rights Reserved.
Top