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A. L. Salas-Villasenor, I. Mejia, J. Hovarth, H. N. Alshareef, D. K. Cha, R. Ramirez-Bon, B. E. Gnade and M. A. Quevedo-Lopez, “Impact of Gate Dielectric in Carrier Mobility in Low Temperature Chalcogenide Thin Film Transistors for Flexible Electronics,” Electrochemical and Solid-State Letters, Vol. 13, No. 9, 2010, pp. H313-H316. doi:10.1149/1.3456551

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