Article citationsMore>>

K. Xiong, J. Robertson and S. J. Clark, “Defect States in the High-Dielectric-Constant Gate Oxide LaAlO3,” Applied Physics Letters, Vol. 89, No. 2, 2006, Article ID: 022907. doi:10.1063/1.2221521

has been cited by the following article:

SCIRP Newsletter
Copyright © 2006-2026 Scientific Research Publishing Inc. All Rights Reserved.
Top