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A. A. Demkov, R. Lui, X. Zhang and H. Loechelt, “Study of Aniline on a Si(111)7×7 Surface by Scanning Tunneling Microscopy,” Journal of Vacuum Science & Technology B, Vol. 18, No. 5, 2000, pp. 2335-2338. doi:10.1116/1.1310659

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