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L. F. Edge, D. G. S4chlom, S. A. Chambers, E. Cicerrella, J. L. Freeouf, B. Holländer and J. Schubert, “Measurement of the Band Offsets between Amorphous LaAlO3 and Silicon,” Applied Physics Letters, Vol. 84, No. 2, 2004, pp. 726-728 .doi:10.1063/1.1644055

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