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N. M. Park, C. J. Choi, T. Y. Seong and S. J. Park, “Quantum Confinement in Amorphous Silicon Quantum Dots Embedded in Silicon Nitride,” Physical Review Letters, Vol. 86, No. 7, 2001, pp. 1355-1357. doi:10.1103/PhysRevLett.86.1355

has been cited by the following article:

• TITLE: The Effect of the MeV Si-Ion Irradiation on the Photoluminescence of Silicon Nanocrystals

  AUTHORS: Alejandra López-Suárez

  KEYWORDS: Silicon Nitride; Silicon Nanocrystals; Photoluminescence; RBS; ERDA

  JOURNAL NAME: World Journal of Condensed Matter Physics, Vol.3 No.2, May 23, 2013

  ABSTRACT: Silicon nanocrystals embedded in silicon nitride films were irradiated with Si-ions at 8 MeV in order to modify their optical response. The samples were characterized by means of Rutherford Backscattering Spectrometry, Elastic Recoil Detection Analysis, High-Resolution Transmission Electronic Microscopy and Photoluminescence analysis. It was found a blue-shift in the photoluminescence emission from the as-grown films after they were irradiated with high energetic silicon ions. According to the quantum confinement theory, this fact is related to a decrease in size of the silicon nanocrystals, which means that a higher silicon fluence irradiation is related with a diminishing in silicon nanocrystal size.