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T. P. Mollart, P. N. Gibson and M. A. Baker, “An EXAFS and XRD Study of the Structure of Nanocrystalline Ti-B-N Thin Films,” Journal of Physics D: Applied Physics, Vol. 30, No. 13, 1997, pp. 1827-1832. doi:10.1088/0022-3727/30/13/001

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