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D. V. Shtansky, E. A. Levashov, K. Kaneko and Y. Ikuhara, “Characterization of Nanostructured Multiphase Ti-Al-B-N Thin Films with Extremely Small Grain Size,” Surface and Coatings Technology, Vol. 148, No. 2-3, 2001, pp. 206-215. doi:10.1016/S0257-8972(01)01341-X

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