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K. Potzger, S. Q. Zhou, H. Reuther, A. Mücklich, F. Eichhorn, N. Schell, W. Skorupa, M. Helm, J. Fassbender, T. Herrmannsd0rfer and T. P. Papageorgiou, “Fe Implanted Ferromagnetic ZnO,” Applied Physics Letters, Vol. 88, No. 5, 2006, Article ID: 052508. doi:10.1063/1.2169912

has been cited by the following article:

• TITLE: XANES and XPS Study on Microstructure of Mn-Doped ZnO Films

  AUTHORS: B. Zhang, M. Li, J. Z. Wang, L. Q. Shi, H. S. Cheng

  KEYWORDS: ZnO-Based DMS; Mn Substitution; XANES; XPS

  JOURNAL NAME: Materials Sciences and Applications, Vol.4 No.5, May 21, 2013

  ABSTRACT: Microstructure of ZnO:Mn films with various Mn concentration was investigated with XANES and XPS. The experimental results revealed a substitution of Mn in ZnO and also excluded the existence of Mn oxides or metallic manganese clusters. The substitutional Mn presented a divalent state and all the ZnO:Mn films were n-type. Room temperature ferromagnetism monotonously decreases with the decrease of the electron carrier concentration. The observed ferrmagnetism should come from the carrier-mediated exchange.