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A. M. Salem, “Structure, Refractive-Index Dispersion and the Optical Absorption Edge of Chemically Deposited ZnxCd1-xS Thin Films,” Applied Physics A, Vol. 74, No. 2, 2002, pp. 205-211. HUdoi:10.1007/s003390100877U

has been cited by the following article:

• TITLE: Optical and Morphological Studies of Chemical Bath Deposited Nanocrystalline Cd1-xZnxS Thin Films

  AUTHORS: Kasim Uthman Isah

  KEYWORDS: Chemical Bath Deposition; Cd1-xZnxS; Scanning Electron Microscope

  JOURNAL NAME: Materials Sciences and Applications, Vol.4 No.5, May 21, 2013

  ABSTRACT: Cadmium Zinc Sulfide, Cd1-xZnxS thin films were deposited by chemical bath deposition technique at bath temperature of 75°C. The morphology of the films was analyzed by scanning electron microscope, the optical constants of the films were estimated from the transmission and reflection spectra of the films in the wavelength range of 300 - 900 nm. The films had a transmittance between 75% and 85% and optical band gap in the range 2.8 - 3.4 eV. The dependence of the refractive index of the films on the wavelength was investigated using the single oscillator model, from which the dispersion parameters were determined. The high frequency dielectric constant εL and the ratio of the carrier concentration to the effective mass N/m* were estimated based on the Spitzer and Fan model. Both εL and N/m* show a decrease in value with increase in Zinc content.